Evaluation of the electrical contact area in contact-mode scanning probe microscopy

The automatic scratch geometrical parameters analysis algorithms based on the images obtained by scanning probe microscopy have been developed. We provide a description of the technique to determine the contact area and the scratch volume with and without account of the pile-ups. The developed algorithms are applied to measure the dynamic hardness by sclerometry on the submicron and nanometer scale.

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Decomposing and Analyzing Contact Resonance Frequency in Contact Mode Voltage Modulated Scanning Probe Microscopies

Physical Chemistry Chemical Physics ◽

10.1039/d1cp04173h ◽

2022 ◽

Author(s):

Yue Liu ◽

Bingxue Yu ◽

Hongli Wang ◽

Kaiyang Zeng

Keyword(s):

Resonance Frequency ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Contact Mode ◽

Probe Microscopy ◽

Contact Resonance

The contact mode voltage modulated scanning probe microscopy (SPM) techniques, such as switching spectroscopy piezoresponse force microscope (SS-PFM), are powerful tools for detecting local electromechanical behaviors. However, interpreting their signals,...

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Preparation and Characterization of Compositionally Graded Epitaxial Barium Strontium Titanate Thin Films via Scanning Probe Microscopy

Key Engineering Materials ◽

10.4028/www.scientific.net/kem.280-283.1903 ◽

2007 ◽

Vol 280-283 ◽

pp. 1903-1908

Author(s):

Sheng Guo Lu ◽

Haydn Chen ◽

C.L. Mak ◽

K.H. Wong ◽

H.W.L. Chan ◽

...

Keyword(s):

Thin Films ◽

Strontium Titanate ◽

Barium Strontium Titanate ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Single Crystal Substrate ◽

Contact Mode ◽

Probe Microscopy ◽

Barium Strontium ◽

Graded Structures

Epitaxially graded barium strontium titanate (BaxSr1-x)TiO3 (x = 0.75, 0.8, 0.9, 1.0, abbreviated as BST75, BST80, BST90 and BTO respectively) thin films were fabricated by pulsed laser deposition method on the (La0.7Sr0.3)MnO3 (LSMO)/LaAlO3 (LAO) single crystal substrate. Scanning probe microscopy with a contact mode was used to characterize the temperature dependence of polarization from room temperature to 140°C. Results indicated that the piezo-response signal of the BST graded films had an obvious change with temperature, and that the graded structures had a flatter temperaturedependence of permittivity. Furthermore, the contrasts of the SPM images were lower for the ferroelectric – paraelectric (F-P) phase transition temperatures of BST 75, BST 80, and BST90, but higher for the F-P transition temperature of BTO.

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High-speed intermittent-contact mode scanning probe microscopy using cantilevers with integrated electrostatic actuator and thermoelectric sensor

2009 American Control Conference ◽

10.1109/acc.2009.5160608 ◽

2009 ◽

Author(s):

D. R. Sahoo ◽

W. Haberle ◽

P. Bachtold ◽

A. Sebastian ◽

H. Pozidis ◽

...

Keyword(s):

Scanning Probe Microscopy ◽

High Speed ◽

Scanning Probe ◽

Electrostatic Actuator ◽

Contact Mode ◽

Probe Microscopy ◽

Thermoelectric Sensor ◽

Intermittent Contact

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A method for measuring the contact area in instrumented indentation testing by tip scanning probe microscopy imaging

Acta Materialia ◽

10.1016/j.actamat.2014.02.036 ◽

2014 ◽

Vol 70 ◽

pp. 249-258 ◽

Cited By ~ 22

Author(s):

L. Charleux ◽

V. Keryvin ◽

M. Nivard ◽

J.-P. Guin ◽

J.-C. Sanglebœuf ◽

...

Keyword(s):

Contact Area ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Indentation Testing ◽

Instrumented Indentation ◽

Microscopy Imaging ◽

Probe Microscopy

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Quantitative measurement of contact area and electron transport across platinum nanocontacts for scanning probe microscopy and electrical nanodevices

Nanotechnology ◽

10.1088/1361-6528/aaebd6 ◽

2018 ◽

Vol 30 (4) ◽

pp. 045705 ◽

Cited By ~ 4

Author(s):

Sai Bharadwaj Vishnubhotla ◽

Rimei Chen ◽

Subarna R Khanal ◽

Jing Li ◽

Eric A Stach ◽

...

Keyword(s):

Electron Transport ◽

Contact Area ◽

Scanning Probe Microscopy ◽

Quantitative Measurement ◽

Scanning Probe ◽

Probe Microscopy

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Intermittent Contact Dynamics of a Micro-Cantilever in High Speed Contact Mode Scanning Probe Microscopy

Volume 4A: Dynamics, Vibration, and Control ◽

10.1115/imece2015-52367 ◽

2015 ◽

Author(s):

Somnath Dey ◽

V. Kartik

Keyword(s):

Scanning Probe Microscopy ◽

High Speed ◽

Image Resolution ◽

Contact Dynamics ◽

Scanning Probe ◽

Contact Mode ◽

Frequency Spectra ◽

Probe Microscopy ◽

Intermittent Contact ◽

Micro Cantilever

The intermittent contact dynamics of a scanning probe microscopy (SPM) micro-cantilever are investigated in the context of high speed imaging in contact mode. At high scan speeds the cantilever can completely detach from the sample surface, and this lowers the achievable image resolution and limits the imaging speed. An analysis is performed, modeling the micro-cantilever as an Euler-Bernoulli beam and approximating the effect of the tip’s contact with the surface by an attached spring with an end mass that is subjected to attractive/repulsive interaction force. At low scan speeds, the cantilever follows the surface profile, while the frequency spectra exhibit a number of side-bands, while at higher speeds, the contact is intermittent. The sensitivity of the cantilever’s deflection varies along the length and hence the image resolution strongly depends on the point selected for optical laser deflection.

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