High speed electron-beam testing of VLSI circuits by backscattered electron detection
Keyword(s):
1983 ◽
Vol 41
◽
pp. 102-103
1986 ◽
Vol 44
◽
pp. 42-43
Keyword(s):
1967 ◽
Vol 99
(4)
◽
pp. 932-938
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1994 ◽
Vol 12
(6)
◽
pp. 3874
◽
Keyword(s):
1990 ◽
Vol 9
(8)
◽
pp. 821-826
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1998 ◽
Vol 46
(10)
◽
pp. 1436-1443
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