High performance CMOS current comparator using resistive feedback network

1998 ◽  
Vol 34 (22) ◽  
pp. 2074 ◽  
Author(s):  
Byung-moo Min ◽  
Soo-won Kim
1994 ◽  
Vol 30 (1) ◽  
pp. 5-6 ◽  
Author(s):  
A.T.K. Tang ◽  
C. Toumazou

Author(s):  
Reza Chavoshisani ◽  
Mohammad Hossein Moaiyeri ◽  
Omid Hashemipour

Purpose – Current-mode approach promises faster and more precise comparators that lead to high-performance and accurate winner-take-all circuits. The purpose of this paper is to present a new high-performance, high-accuracy current-mode min/max circuit for low-voltage applications. In addition, the proposed circuit is designed based on a new efficient high-resolution current conveyor-based fully differential current comparator. Design/methodology/approach – The proposed design detects the min and max values of two analog current signals by means of a current comparator and a logic module. The comparator compares the values of the input current signals accurately and generates two digital control signals and the logic module determines the min and max values based on the controls signals. In addition, an accurate current copy module is utilized to copy the input current signals and convey them to the comparator and the logic module. Findings – The results of the comprehensive simulations, conducted using HSPICE with the TSMC 90 nm CMOS technology, demonstrate the high-performance and robust operation of the proposed design even in the presence of process, temperature, input current and supply voltage variations. For a case in point, for 5 μA differential input current the average propagation delay and power consumption of the proposed circuit are attained as 150 ps and 150 µW, respectively, which leads to more than 64 percent improvement in terms of power-delay product as compared with the most efficient design, previously presented in the literature. Originality/value – A new efficient structure for current-mode min-max circuit is proposed based on a novel current comparator design which is accurate, high-performance and robust to process, voltage and temperature variations.


2009 ◽  
Vol 45 (20) ◽  
pp. 1007 ◽  
Author(s):  
X. Tang ◽  
K.-P. Pun

2019 ◽  
Vol 15 (2) ◽  
pp. 113-118
Author(s):  
Agata Romanova ◽  
Vaidotas Barzdenas

AbstractThe work reports on the design and performance of a low-noise low-cost CMOS transimpedance amplifier (TIA). The proposed circuit shall be employed in optical time-domain reflectometers and is implemented using an affordable 0.18 µm 1.8 V CMOS process. The approach preserves the benefits of a classical feedback structure while addressing the noise problem of conventional feed-forward and resistive feedback architectures via the usage of noise-efficient capacitive feedback. Circuit-level modifications are proposed to mitigate the voltage headroom and DC current issues. The suggested design achieves a total gain of 82 dBΩ (79 dBΩ after the output buffer) within the bandwidth of 1.2 GHz while operating with a total input capacitance of 0.7 pF. The simulated average input-referred noise current density is below 1.8 pA/sqrt(Hz) with the power consumption of the complete amplifier including the output buffer being 21 mW.


Author(s):  
A. V. Crewe ◽  
M. Isaacson ◽  
D. Johnson

A double focusing magnetic spectrometer has been constructed for use with a field emission electron gun scanning microscope in order to study the electron energy loss mechanism in thin specimens. It is of the uniform field sector type with curved pole pieces. The shape of the pole pieces is determined by requiring that all particles be focused to a point at the image slit (point 1). The resultant shape gives perfect focusing in the median plane (Fig. 1) and first order focusing in the vertical plane (Fig. 2).


Author(s):  
N. Yoshimura ◽  
K. Shirota ◽  
T. Etoh

One of the most important requirements for a high-performance EM, especially an analytical EM using a fine beam probe, is to prevent specimen contamination by providing a clean high vacuum in the vicinity of the specimen. However, in almost all commercial EMs, the pressure in the vicinity of the specimen under observation is usually more than ten times higher than the pressure measured at the punping line. The EM column inevitably requires the use of greased Viton O-rings for fine movement, and specimens and films need to be exchanged frequently and several attachments may also be exchanged. For these reasons, a high speed pumping system, as well as a clean vacuum system, is now required. A newly developed electron microscope, the JEM-100CX features clean high vacuum in the vicinity of the specimen, realized by the use of a CASCADE type diffusion pump system which has been essentially improved over its predeces- sorD employed on the JEM-100C.


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