Next-generation long-wavelength infrared detector arrays: competing technologies and modeling challenges

New infrared (IR) detector materials with high sensitivity, multi-spectral capability, improved uniformity and lower manufacturing costs are required for numerous space-based infrared imaging applications. To meet these stringent requirements, new materials must be designed and grown using semiconductor heterostructures, such as quantum wells and superlattices, to tailor new optical and electrical properties unavailable in the current generation of materials. One of the most promising materials is a strained layer supperlattice (SLS) composed of thin InAs and GaInSb layers. While this material shows theoretical and early experimental promise, there are still several materials growth and processing issues to be addressed before this material can be transitioned to the next generation of infrared detector arrays. Our research is focused on addressing the basic materials design, growth, optical properties, and electronic transport issue of these superlattices.

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A Long-Wavelength Infrared Photoluminescence Spectrometer for the Characterization of Semiconductor Materials

MRS Proceedings ◽

10.1557/proc-299-35 ◽

1994 ◽

Vol 299 ◽

Author(s):

R. P. Wright ◽

S. E. Kohn ◽

N. M. Haegel

Keyword(s):

Infrared Detector ◽

Optical Emission ◽

High Sensitivity ◽

Radiation Emission ◽

Long Wavelength ◽

Ion Laser ◽

Detector Materials ◽

Long Wavelength Infrared ◽

Argon Ion

AbstractA new photoluminescence spectrometer has been developed for the characterization of optical emission in the 2.5 to 14.1 micron wavelength range. This instrument provides high sensitivity for the detection of interband and defect luminescence in a variety of infrared detector materials. The spectrometer utilizes a solid state photomultiplier detector and a circular variable filter, which serves as the resolving element. The entire spectrometer is cooled to 5K in order to decrease thermal radiation emission. Band-edge luminescence at 10.1 microns from HgCdTe samples has been readily detected with argon-ion laser excitation powers less than 70 mW/cm2. Representative spectra from HgCdTe and other infrared detector materials are presented.

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Development of long-wavelength infrared detector and its space-based application requirements

Chinese Physics B ◽

10.1088/1674-1056/28/2/028504 ◽

2019 ◽

Vol 28 (2) ◽

pp. 028504 ◽

Cited By ~ 2

Author(s):

Junku Liu ◽

Lin Xiao ◽

Yang Liu ◽

Longfei Cao ◽

Zhengkun Shen

Keyword(s):

Infrared Detector ◽

Long Wavelength ◽

Application Requirements ◽

Long Wavelength Infrared

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Investigation of Low Frequency Noise-current Correlation for the InAs/GaSb T2SL Long-wavelength Infrared Detector

10.21203/rs.3.rs-487224/v1 ◽

2021 ◽

Author(s):

Liang Wang ◽

Liqi Zhu ◽

Zhicheng Xu ◽

Fangfang Wang ◽

Jianxin Chen ◽

...

Keyword(s):

Dark Current ◽

Reverse Bias ◽

Infrared Detector ◽

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise ◽

Long Wavelength ◽

Noise Current ◽

Current Correlation ◽

Long Wavelength Infrared

Abstract In this paper, a mesa-type 256×8 long-wavelength infrared detector is prepared by using InAs/GaSb type-II superlattice material with double barrieres structure. the area of each pixel is 25×25 μm2. The cut-off wavelength and dark current density of the detector at -0.05 V bias with liquid nitrogen temperature is 11.5 μm and 4.1×10-4 A/cm2, respectively. The power spectrum of low-frequency noise (1/f noise) at different temperatures have also been fitted by the Hooge model, and the correlations with dark current are extracted subsequently. The results shown that the 1/f noise of the detector is mainly caused by the generation-recombination current at a low reverse bias, however, when the reverse bias is high, the 1/f noise should be expressed by the sum of Igr noise and Ibtb noise which is ignored in the previous research. The 1/f noise-current correlation assessed in this work can provide insights into the low frequency noise characteristics of long-wavelength T2SL InAs/GaSb detectors, and allow for a better understanding of the main source of low-frequency noise.

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