A Long-Wavelength Infrared Photoluminescence Spectrometer for the Characterization of Semiconductor Materials

1994 ◽  
Vol 299 ◽  
Author(s):  
R. P. Wright ◽  
S. E. Kohn ◽  
N. M. Haegel

AbstractA new photoluminescence spectrometer has been developed for the characterization of optical emission in the 2.5 to 14.1 micron wavelength range. This instrument provides high sensitivity for the detection of interband and defect luminescence in a variety of infrared detector materials. The spectrometer utilizes a solid state photomultiplier detector and a circular variable filter, which serves as the resolving element. The entire spectrometer is cooled to 5K in order to decrease thermal radiation emission. Band-edge luminescence at 10.1 microns from HgCdTe samples has been readily detected with argon-ion laser excitation powers less than 70 mW/cm2. Representative spectra from HgCdTe and other infrared detector materials are presented.

2000 ◽  
Vol 10 (01) ◽  
pp. 47-53
Author(s):  
G. J. BROWN ◽  
F. SZMULOWICZ ◽  
K. MAHALINGAM ◽  
A. SAXLER ◽  
R. LINVILLE ◽  
...  

New infrared (IR) detector materials with high sensitivity, multi-spectral capability, improved uniformity and lower manufacturing costs are required for numerous space-based infrared imaging applications. To meet these stringent requirements, new materials must be designed and grown using semiconductor heterostructures, such as quantum wells and superlattices, to tailor new optical and electrical properties unavailable in the current generation of materials. One of the most promising materials is a strained layer supperlattice (SLS) composed of thin InAs and GaInSb layers. While this material shows theoretical and early experimental promise, there are still several materials growth and processing issues to be addressed before this material can be transitioned to the next generation of infrared detector arrays. Our research is focused on addressing the basic materials design, growth, optical properties, and electronic transport issue of these superlattices.


2020 ◽  
Vol 128 (7) ◽  
pp. 075704
Author(s):  
Anthony J. Ciani ◽  
Christoph H. Grein ◽  
Wendy L. Sarney ◽  
Stefan P. Svensson ◽  
Dmitri V. Donetski ◽  
...  

1995 ◽  
Vol 49 (12) ◽  
pp. 1826-1833 ◽  
Author(s):  
Jan Preisler ◽  
Edward S. Yeung

Conventional methods for studying matrix-assisted desorption-ionization rely on mass spectroscopy. In this study, a 488-nm argon-ion laser beam is deflected by two acoustooptic deflectors to image plumes desorbed at atmospheric pressure via absorption. All species, including neutral molecules, are monitored. Interesting features, e.g., differences between the initial plume and subsequent plumes desorbed from the same spot, or the formation of two plumes from one laser shot, are observed. Total plume absorbance can be correlated with the acoustic signal generated by the desorption event. A model equation for the plume velocity as a function of time is proposed. Optical probing also enables accurate determination of plume velocities at reduced pressures. These results define the optimal conditions for desorbing analytes from matrices, as opposed to achieving a compromise between efficient desorption and efficient ionization as is practiced in mass spectrometry.


2019 ◽  
Vol 28 (2) ◽  
pp. 028504 ◽  
Author(s):  
Junku Liu ◽  
Lin Xiao ◽  
Yang Liu ◽  
Longfei Cao ◽  
Zhengkun Shen

1990 ◽  
Vol 198 ◽  
Author(s):  
R.J. Koestner ◽  
M.W. Goodwin ◽  
H.F. Schaake

ABSTRACTHgCdTe heterostructures consisting of a thin n-type widegap (250 meV or 5 μm cutoff) layer deposited on an n-type narrowgap (100-125 meV or 10-13 μm cutoff) layer offer the promise of very high performance metal-insulator-semiconductor (MIS) photocapacitors for long wavelength infrared (LWIR) detection. Molecular Beam Epitaxy (MBE) is a candidate growth technology for these two layer films due to its fine control in composition, thickness and doping concentration. The critical materials issues are reducing the defect content associated with twins in the grown layers, achieving low net donor concentrations in the widegap layer, and avoiding the formation of misfit dislocations at the HgCdTe heterointerface. This paper will report on our recent progress in these directions.


1993 ◽  
Vol 8 (6S) ◽  
pp. 941-945 ◽  
Author(s):  
S R Kurtz ◽  
J Bajaj ◽  
D D Edwall ◽  
S J C Irvine

1979 ◽  
Vol 35 (2) ◽  
pp. 121-124 ◽  
Author(s):  
J. F. McClelland ◽  
R. N. Kniseley

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