scholarly journals Influence of pruning intensity on light penetration and leaf physiology in high-density orchards of mango trees

Fruits ◽  
2006 ◽  
Vol 61 (2) ◽  
pp. 117-123 ◽  
Author(s):  
Ram Roshan Sharma ◽  
Room Singh ◽  
Desh Beer Singh
Keyword(s):  
High Density ◽  
Light Penetration ◽  
Leaf Physiology ◽  
Pruning Intensity

Corrigendum - Growth and productivity of irrigated Sorghum bicolor (L. Moench) in Northern Australia. II. Low solar altitude as a possible constraint to productivity in the tropical dry season

1984 ◽  
Vol 35 (2) ◽  
pp. 229
Author(s):  
MA Foale ◽  
GL Wilson ◽  
DB Coates ◽  
KP Haydock
Keyword(s):  
Solar Radiation ◽  
Canopy Structure ◽  
Dry Season ◽  
High Density ◽  
Light Penetration ◽  
Northern Australia ◽  
Growth Study ◽  
Altitude Effect ◽  
Solar Altitude ◽  
Sorghum Bicolor L

A growth study was carried out during the dry season on irrigated grain sorghum cultivar NK 300F at latitude 16�S. in northern Australia. The apparent efficiency of the canopy in the photosynthetic conversion of solar radiation increased progressively in high density stands between June and September, while low density stands showed no change. An hypothesis is advanced that the rise in canopy efficiency was due to increasing solar altitude combining with a suitable canopy structure at high density to give increased light penetration into the canopy. A parameter named weighted mean solar altitude (WMSA) is used in conjunction with noon solar altitude (NSA) to assist in the interpretation of published models of light penetration. This solar altitude effect, if verified by further work, would lower the expectations, based on mean daily solar radiation, for dry season yield of irrigated sorghum and possibly other cereals in the semi-arid tropics.

scholarly journals Light Distribution in Three Apple Training Systems as Affected by Cultivar and Rootstock

HortScience ◽  
1998 ◽  
Vol 33 (4) ◽  
pp. 601a-601
Author(s):  
Ray A. Allen ◽  
Curt R. Rom
Keyword(s):  
Apple Tree ◽  
Vertical Axis ◽  
Threshold Value ◽  
Training System ◽  
High Density ◽  
Light Distribution ◽  
Light Penetration ◽  
Full Bloom ◽  
Training Systems ◽  
Slender Spindle

Light distribution in two cultivars on three dwarfing rootstocks in three high-density apple tree training systems was measured in the sixth leaf beginning at full bloom and continuing through the season. Training system had a significant effect on light penetration into the lowest point of the canopy (measured at 0.5 m), with the slender spindle being significantly darker than either the central leader or the vertical axis, although all three systems were below the threshold value of 30% full sun (FS) needed to maintain productivity for most of the season. Cultivar had no significant effect; however, trees of both `Jonagold' and `Empire' fell below 20% FS early in the season and remained there until late in the season. Rootstock had the greatest effect, with trees on M9 and M26 being significantly darker in the lower canopy than trees on Mark. Trees on M26 and M9 fell below 10% FS early in the season and remained there, while trees on Mark never fell below 20% FS.

Growth and productivity of irrigated Sorghum bicolor (L. Moench) in Northern Australia. II. Low solar altitude as a possible constraint to productivity in the tropical dry season

1984 ◽  
Vol 35 (2) ◽  
pp. 229
Author(s):  
MA Foale ◽  
GL Wilson ◽  
DB Coates ◽  
KP Haydock
Keyword(s):  
Solar Radiation ◽  
Canopy Structure ◽  
Dry Season ◽  
High Density ◽  
Light Penetration ◽  
Northern Australia ◽  
Growth Study ◽  
Altitude Effect ◽  
Solar Altitude ◽  
Sorghum Bicolor L

A growth study was carried out during the dry season on irrigated grain sorghum cultivar NK 300F at latitude 16�S. in northern Australia. The apparent efficiency of the canopy in the photosynthetic conversion of solar radiation increased progressively in high density stands between June and September, while low density stands showed no change. An hypothesis is advanced that the rise in canopy efficiency was due to increasing solar altitude combining with a suitable canopy structure at high density to give increased light penetration into the canopy. A parameter named weighted mean solar altitude (WMSA) is used in conjunction with noon solar altitude (NSA) to assist in the interpretation of published models of light penetration. This solar altitude effect, if verified by further work, would lower the expectations, based on mean daily solar radiation, for dry season yield of irrigated sorghum and possibly other cereals in the semi-arid tropics.

Planar defects in ordered (Ga,In)P

1988 ◽  
Vol 46 ◽  
pp. 902-903
Author(s):  
S. McKernan ◽  
C. B. Carter ◽  
D. Bour ◽  
J. R. Shealy
Keyword(s):  
Electron Diffraction ◽  
Vapor Phase ◽  
Growth Direction ◽  
High Density ◽  
Ordered Structure ◽  
Planar Defects ◽  
Diffraction Patterns ◽  
Ternary Semiconductors ◽  
Anion Species ◽  
Metallic Vapor

The growth of ternary III-V semiconductors by organo-metallic vapor phase epitaxy (OMVPE) is widely practiced. It has been generally assumed that the resulting structure is the same as that of the corresponding binary semiconductors, but with the two different cation or anion species randomly distributed on their appropriate sublattice sites. Recently several different ternary semiconductors including AlxGa1-xAs, Gaxln-1-xAs and Gaxln1-xP1-6 have been observed in ordered states. A common feature of these ordered compounds is that they contain a relatively high density of defects. This is evident in electron diffraction patterns from these materials where streaks, which are typically parallel to the growth direction, are associated with the extra reflections arising from the ordering. However, where the (Ga,ln)P epilayer is reasonably well ordered the streaking is extremely faint, and the intensity of the ordered spot at 1/2(111) is much greater than that at 1/2(111). In these cases it is possible to image relatively clearly many of the defects found in the ordered structure.

Quantitative defect studies in semiconductor TEM samples prepared by low angle ion milling

1995 ◽  
Vol 53 ◽  
pp. 512-513
Author(s):  
L. Mulestagno ◽  
J.C. Holzer ◽  
P. Fraundorf
Keyword(s):  
Sample Preparation ◽  
Milling Time ◽  
High Density ◽  
Low Density ◽  
Ion Milling ◽  
High Quality ◽  
Variable Angle ◽  
Major Disadvantage ◽  
Induced Defects

Due to the wealth of information, both analytical and structural that can be obtained from it TEM always has been a favorite tool for the analysis of process-induced defects in semiconductor wafers. The only major disadvantage has always been, that the volume under study in the TEM is relatively small, making it difficult to locate low density defects, and sample preparation is a somewhat lengthy procedure. This problem has been somewhat alleviated by the availability of efficient low angle milling.Using a PIPS® variable angle ion -mill, manufactured by Gatan, we have been consistently obtaining planar specimens with a high quality thin area in excess of 5 × 104 μm2 in about half an hour (milling time), which has made it possible to locate defects at lower densities, or, for defects of relatively high density, obtain information which is statistically more significant (table 1).

Using the scanning electron microscope for failure analysis of high density magnetic media

1987 ◽  
Vol 45 ◽  
pp. 392-393
Author(s):  
Evelyn R. Ackerman ◽  
Gary D. Burnett
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Failure Analysis ◽  
High Density ◽  
Magnetic Media ◽  
Specific Data ◽  
Retrieval Systems ◽  
Operating Environments ◽  
The Media ◽  
Scanning Electron

Advancements in state of the art high density Head/Disk retrieval systems has increased the demand for sophisticated failure analysis methods. From 1968 to 1974 the emphasis was on the number of tracks per inch. (TPI) ranging from 100 to 400 as summarized in Table 1. This emphasis shifted with the increase in densities to include the number of bits per inch (BPI). A bit is formed by magnetizing the Fe203 particles of the media in one direction and allowing magnetic heads to recognize specific data patterns. From 1977 to 1986 the tracks per inch increased from 470 to 1400 corresponding to an increase from 6300 to 10,800 bits per inch respectively. Due to the reduction in the bit and track sizes, build and operating environments of systems have become critical factors in media reliability.Using the Ferrofluid pattern developing technique, the scanning electron microscope can be a valuable diagnostic tool in the examination of failure sites on disks.

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