Shape of the cantilever deflection for the atomic force microscope in force curve measurements

1994 ◽  
Vol 65 (6) ◽  
pp. 1930-1934 ◽  
Author(s):  
Minoru Sasaki ◽  
Kazuhiro Hane ◽  
Shigeru Okuma ◽  
Yoshinori Bessho
Keyword(s):  
Atomic Force Microscope ◽  
Force Curve ◽  
Cantilever Deflection ◽  
Atomic Force

Transfer Function Analysis of Atomic Force Microscope Cantilevers

2005 ◽  
Author(s):  
F. J. Rubio-Sierra ◽  
R. Vazquez ◽  
R. W. Stark
Keyword(s):  
Transfer Function ◽  
Atomic Force Microscope ◽  
Frequency Response ◽  
Function Analysis ◽  
Infinite Product ◽  
Output Measurement ◽  
Cantilever Deflection ◽  
Method Transfer ◽  
Atomic Force ◽  
Transfer Function Analysis

Current methods to study atomic force microscope (AFM) cantilever dynamics use model simplification or are based on the non-trivial solution of the equation of motion. As an alternative method, transfer function analysis gives a more complete description of system dynamics. In this work a transfer function study of two different AFM configurations, the point force and base driven cantilever, is presented. Exact analytical expressions of the infinite dimensional transfer function are derived for cantilever deflection and slope along the cantilever. Frequency response and transfer function infinite product expansion are obtained for the case where system outputs are set at the free end of the cantilever. The frequency response reflects the full complexity of cantilever dynamics affected by the presence of an infinite number of poles and zeros. An analytical expression for all the zeros and poles of the system is obtained. From the frequency response and pole-zero investigations it is shown how cantilever actuation and output measurement affect AFM operation and cantilever dynamics modelling. Transfer function analysis of AFM cantilevers opens the possibility of model based AFM operation to increase imaging and manipulation performance.

scholarly journals Investigation of a metrological atomic force microscope system with a combined cantilever position, bending and torsion detection system

2021 ◽  
Vol 10 (2) ◽  
pp. 171-177
Author(s):  
Yiting Wu ◽  
Elisa Wirthmann ◽  
Ute Klöpzig ◽  
Tino Hausotte
Keyword(s):  
Atomic Force Microscope ◽  
Measurement System ◽  
Large Scale ◽  
Detection System ◽  
Optical Design ◽  
Signal Quality ◽  
Cantilever Deflection ◽  
Atomic Force ◽  
Areal Measurement

Abstract. This article presents a new metrological atomic force microscope (MAFM) head with a new beam alignment and a combined one-beam detection of the cantilever deflection. An interferometric measurement system is used for the determination of the position of the cantilever, while a quadrant photodiode measures the bending and torsion of the cantilever. To improve the signal quality and reduce disturbing interferences, the optical design was revised in comparison to the systems of others (Dorozhovets et al., 2006; Balzer et al., 2011; Hausotte et al., 2012). The integration of the MAFM head in a nanomeasuring machine (NMM-1) offers the possibility of large-scale measurements over a range of 25mm×25mm×5 mm with sub-nanometre resolution. A large number of measurements have been performed by this MAFM head in combination with the NMM-1. This paper presents examples of the measurements for the determination of step height and pitch and areal measurement.

Signals Generated by a Sensor That Captures the Cantilever Deflection of the Atomic Force Microscope With Nonlinear Behavior

2014 ◽  
Author(s):  
Ricardo Nozaki ◽  
Hélio A. Navarro ◽  
Reyolando Brasil ◽  
Marcelo A. Pereira da Silva ◽  
Angelo M. Tusset ◽  
...  
Keyword(s):  
System Identification ◽  
Analytical Solution ◽  
Atomic Force Microscope ◽  
Experimental Approach ◽  
Nonlinear Behavior ◽  
Phase Portraits ◽  
Cantilever Deflection ◽  
Atomic Force ◽  
Data Files ◽  
Sample Distance

This paper presents results obtained numerically by an experimental approach. The sensor of the atomic force microscope generated cantilever deflections series that were recorded in data files as a function of time and as a function of tip-sample distance. With these series of deflections, we attempted to adjust parameters and refine models of classical oscillators atomic force microscope, making them more sensitive to tip-sample distance, through the method of system identification proposed by [12]. This method allows us to choose any model and, through its analytical solution, compare the results obtained with the experiment. The reconstruction of the state space is done with the intention of observing different phase portraits for different distances between sample-tip.

A Novel Method to Reconstruct the Force Curve by Higher Harmonics of the First Two Flexural Modes in Frequency Modulation Atomic Force Microscope (FM-AFM)

2018 ◽  
Vol 24 (3) ◽  
pp. 256-263 ◽  
Author(s):  
Suoxin Zhang ◽  
Jianqiang Qian ◽  
Yingzi Li ◽  
Yingxu Zhang ◽  
Zhenyu Wang
Keyword(s):  
Atomic Force Microscope ◽  
Frequency Modulation ◽  
Materials Science ◽  
Chemical Properties ◽  
Force Curve ◽  
Higher Harmonics ◽  
Atomic Force ◽  
Novel Method ◽  
Full Force ◽  
Physical And Chemical

AbstractAtomic force microscope (AFM) is an idealized tool to measure the physical and chemical properties of the sample surfaces by reconstructing the force curve, which is of great significance to materials science, biology, and medicine science. Frequency modulation atomic force microscope (FM-AFM) collects the frequency shift as feedback thus having high force sensitivity and it accomplishes a true noncontact mode, which means great potential in biological sample detection field. However, it is a challenge to establish the relationship between the cantilever properties observed in practice and the tip–sample interaction theoretically. Moreover, there is no existing method to reconstruct the force curve in FM-AFM combining the higher harmonics and the higher flexural modes. This paper proposes a novel method that a full force curve can be reconstructed by any order higher harmonics of the first two flexural modes under any vibration amplitude in FM-AFM. Moreover, in the small amplitude regime, short range forces are reconstructed more accurately by higher harmonics analysis compared with fundamental harmonics using the Sader–Jarvis formula.

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