Low-temperature formation of silicon nitride gate dielectrics by atomic-layer deposition
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2017 ◽
Vol 9
(49)
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pp. 42928-42934
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2021 ◽
Vol 39
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pp. 032407
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2015 ◽
Vol 7
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pp. 22525-22532
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2019 ◽
Vol 45
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pp. 7407-7412
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