Electrical characterization of CeO2∕Si interface properties of metal-oxide-semiconductor field-effect transistors with CeO2 gate dielectric
2015 ◽
Vol 32
(12)
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pp. 127101
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2004 ◽
Vol 22
(1)
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pp. 327
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Keyword(s):
Keyword(s):
2018 ◽
Vol 461
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pp. 255-259
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