Structural, vibrational, and dielectric properties of a Ba0.5Sr0.5TiO3 thin film: Temperature and electric field dependence from Raman spectroscopy, x-ray diffraction, and microwave measurements

Lead free Na0.5Bi0.5TiO3 (NBT) and (Na0.5Bi0.5TiO3)1-x(CaTiO3)x (NBT-CT) piezoelectric ceramics with the perovskite structure were studied. The NBT and NBT-CT samples were synthesized using a solid-state reaction method and characterized with X-ray diffraction (XRD), Raman spectroscopy and dielectric measurements for several compositions (x = 0, 0.07, 0.15) at room temperature. The XRD analysis showed a stabilization of a rhombohedral phase at a low concentration of Ca (0 < x <0.15), whereas Raman spectra reveal a strong modification for the sample with x = 0.15. The dielectric properties of these ceramics were studied by measuring impedance in the 79-451K temperature range for unpoled and field cooling with an electric field (FC) conditions.

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Coexistence of 1 : 2 and 1 : 1 long-range ordering types in La-modified Ba(Mg0.33Ta0.67)O3 ceramics

Journal of Materials Research ◽

10.1557/jmr.1997.0085 ◽

1997 ◽

Vol 12 (3) ◽

pp. 589-592 ◽

Cited By ~ 18

Author(s):

Hyuk-Joon Youn ◽

Kug Sun Hong ◽

Hwan Kim

Keyword(s):

Solid Solution ◽

Dielectric Properties ◽

Long Range ◽

Phase Coexistence ◽

Microwave Measurements ◽

X Ray Diffraction ◽

Physical Origin ◽

X Ray ◽

Wide Range ◽

Long Range Ordering

The ordering structure of lanthanum-substituted Ba(Mg0.33Ta0.67)O3 was investigated using x-ray diffraction. It was observed that the ordering type of this solid solution transformed from 1: 2 to 1: 1 with 10 mol% substitution of La(Mg0.67Ta0.33)O3. These two types of ordering coexist over a wide range of composition. This coexistence of ordering types was considered as phase coexistence and its physical origin was investigated using microwave measurements. Based on the intensity of superlattice reflections and the discontinuity in dielectric properties, it was suggested that the coexistence of two ordering types originates from the overlap of the two stability regions.

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Study of Carbon Thin Film Deposition on Various Buffer Layer as Characterized by X-Ray Diffraction and Raman Spectroscopy

Advanced Materials Research ◽

10.4028/www.scientific.net/amr.1112.106 ◽

2015 ◽

Vol 1112 ◽

pp. 106-109

Author(s):

Angga Virdian ◽

Heldi Alfiadi ◽

Yudi Darma

Keyword(s):

Thin Film ◽

Raman Spectroscopy ◽

Buffer Layer ◽

Raman Spectra ◽

Thin Film Deposition ◽

Film Deposition ◽

X Ray Diffraction ◽

X Ray ◽

Carbon Thin Film ◽

Carbon Based

Westudy the structural characteristic of carbon based thin filmprepared by DC unbalanced magnetron sputtering technique on different buffer layer such as γ-Al2O3, SnO2, and Cu. Sputtering parameters of carbon thin film were maintained identical for each buffer layer. Fe-doped carbon pellet and Argon gas have been used as sputtering target and to generate the sputtering plasma, respectively. The roles of buffer layer for the quality of carbon-based thin film have been investigated by X-ray diffraction and Raman spectroscopy analysis. Raman spectra indicatethe formation of agoodquality carbon thin film with crystal-like structure on γ-Al2O3and Cu buffer layer, in contrast to the SnO2buffer layer case. Furthermore Raman spectra confirm thehoneycomb structure with fewer defects in γ-Al2O3indicating that it is more suitable buffer layer than the other. We argue that γ-Al2O3buffer layerprovide a good nucleation site and promote a better atomic arrangement for carbon atoms to form a few layergraphene-like structure. The atomic geometry of γ-Al2O3supports the hexagonal atomic configurationfor carbon atom inthe formation of a few layers graphene. This study mightgive a new approach for the carbon based deposition towards the devices application.

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Electric Field Dependence on Charge Collection of CdZnTe X-Ray Detectors

Journal of X-Ray Science and Technology ◽

10.3233/xst-1997-7210 ◽

1997 ◽

Vol 7 (2) ◽

pp. 198-210

Author(s):

G. C. Giakos ◽

B. Pillai ◽

S. Vedantham ◽

S. Chowdhuri ◽

J. Odogba ◽

...

Keyword(s):

Electric Field ◽

Field Dependence ◽

Charge Collection ◽

X Ray ◽

Electric Field Dependence

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Needleless Electrospinning System, an Efficient Platform to Fabricate Carbon Nanofibers

Journal of Nano Research ◽

10.4028/www.scientific.net/jnanor.50.78 ◽

2017 ◽

Vol 50 ◽

pp. 78-89 ◽

Cited By ~ 14

Author(s):

Hadi Samadian ◽

Hamid Mobasheri ◽

Saeed Hasanpour ◽

Reza Faridi Majid

Keyword(s):

Raman Spectroscopy ◽

Electric Field ◽

Carbon Nanofibers ◽

Electrospun Nanofibers ◽

Solution Concentration ◽

Field Analysis ◽

X Ray Diffraction ◽

X Ray ◽

Needleless Electrospinning ◽

Electric Field Profile

In the present study, the effects of different parameters of needleless electrospinning systems on polyacrylonitrile (PAN) nanofibers morphology and diameter were studied. The electric field profile at the surface of the spinneret and electrospinning zone was evaluated by Finite Element Method. The PAN nanofibers were used as the precursor to fabricate carbon nanofibers. Scanning electron microscope (SEM), X-ray diffraction and Raman spectroscopy were used for electrospun nanofibers analysis. The results of electric field analysis indicated, in the spinning direction, the electric field was concentrated at the surface of the spinneret and decayed rapidly toward the surface of the collector. Increasing polymer solution concentration from 7.00 to 11.00 wt.% resulted increasing nanofibers diameter form 77.76 ± 19.44 to 202.42 ± 36.85. The results of X-ray diffraction and Raman spectroscopy show that heat treatments could convert needleless electrospun PAN nanofibers to carbon nanofibers.

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The Structural Characteristics of CIS Thin Films Prepared by Electro-Deposited Method

Advanced Materials Research ◽

10.4028/www.scientific.net/amr.818.88 ◽

2013 ◽

Vol 818 ◽

pp. 88-91

Author(s):

Kun Liu ◽

Ji Sheng Yang ◽

Rui Li ◽

Wei Peng ◽

Shi Pan

Keyword(s):

Thin Film ◽

Thin Films ◽

Raman Spectroscopy ◽

Raman Spectrum ◽

Structural Characteristics ◽

X Ray Diffraction ◽

Electro Deposition ◽

X Ray ◽

Micro Raman Spectroscopy ◽

Deposition Technology

The properties of the absorber layer of solar cell CuInSe2(CIS) thin film made by electro-depostied method were researched in this article. Different concentration of reactant and voltage was applied to prepare the CIS film. The micro-Raman spectroscopy and X-ray diffraction (XRD) of CIS film was carried out. A correlation between the linewidth A1 mode of Raman spectrum and the XRD line and the voltage of electro-deposition technology was found.

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Electric field dependence of thin film resistance

physica status solidi (b) ◽

10.1002/pssb.2220590158 ◽

1973 ◽

Vol 59 (1) ◽

pp. K75-K77

Author(s):

L. A. Zilberman ◽

Yu. M. Ivanchenko

Keyword(s):

Thin Film ◽

Electric Field ◽

Field Dependence ◽

Film Resistance ◽

Electric Field Dependence

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The Dependence of Dielectric Properties on Composition Variation in Ba0.6Sr0.4(YTa)yTi1-2yO3

MRS Proceedings ◽

10.1557/proc-720-h5.5 ◽

2002 ◽

Vol 720 ◽

Cited By ~ 2

Author(s):

Daniel Potrepka ◽

Steven Tidrow ◽

Arthur Tauber ◽

Kevin Kirchner ◽

Matthew Ervin ◽

...

Keyword(s):

Raman Spectroscopy ◽

Dielectric Constant ◽

Dielectric Properties ◽

Low Dielectric Constant ◽

X Ray Diffraction ◽

X Ray ◽

Low Dielectric ◽

Composition Variation ◽

Device Applications ◽

Improved Performance

AbstractBa0.6Sr0.4(YTa)yTi1-2yO3 has been shown to have properties which are promising for tunable applications requiring low dielectric constant [1]. Ba0.6Sr0.4(YTa)yTi1-2yO3 with y ≤ 0.10 has been synthesized and well-characterized using x-ray diffraction, EDAX, and Raman Spectroscopy. The dependence of the dielectric properties on concentration, y, of Y and Ta are discussed along with implications for improved performance in device applications.

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