Deep‐level transient spectroscopy studies of near‐surface hole and electron traps in Zn‐doped InP using high barrier Yb/p‐InP Schottky diodes
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2000 ◽
Vol 5
(S1)
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pp. 922-928
1988 ◽
Vol 27
(Part 1, No. 2)
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pp. 192-195
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1989 ◽
Vol 4
(2)
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pp. 241-243
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2008 ◽
Vol 600-603
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pp. 1297-1300
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