Dynamic in situ spectroscopic ellipsometric study in inhomogeneous TiO2 thin-film growth

2010 ◽  
Vol 108 (1) ◽  
pp. 013522 ◽  
Author(s):  
M. Horprathum ◽  
P. Chindaudom ◽  
P. Limnonthakul ◽  
P. Eiamchai ◽  
N. Nuntawong ◽  
...  
Keyword(s):  
Thin Film ◽  
Tio2 Thin Film ◽  
Film Growth ◽  
Thin Film Growth ◽  
Ellipsometric Study

Comparison of heteroepitaxial YBa2Cu3O7−δ and TiO2 thin film growth

1997 ◽  
Vol 174 (1-4) ◽  
pp. 398-408 ◽  
Author(s):  
A. Roshko ◽  
F.J.B. Stork ◽  
D.A. Rudman ◽  
D.J. Aldrich ◽  
P.A.Morris Hotsenpiller
Keyword(s):  
Thin Film ◽  
Tio2 Thin Film ◽  
Film Growth ◽  
Thin Film Growth

In situ work function study of oxidation and thin film growth on clean surfaces

1999 ◽  
Vol 433-435 ◽  
pp. 770-774 ◽  
Author(s):  
I.D Baikie ◽  
U Petermann ◽  
B Lägel
Keyword(s):  
Thin Film ◽  
Work Function ◽  
Film Growth ◽  
Thin Film Growth ◽  
Function Study

Soft x-ray spectrometer for in situ monitoring of thin-film growth

1994 ◽  
Author(s):  
Per Skytt ◽  
Carl J. Englund ◽  
Nial Wassdahl ◽  
Derrick C. Mancini ◽  
Joseph Nordgren
Keyword(s):  
Thin Film ◽  
Film Growth ◽  
Thin Film Growth ◽  
In Situ Monitoring ◽  
X Ray

Ellipsometric study of boron nitride thin‐film growth on Si(100)

1993 ◽  
Vol 62 (15) ◽  
pp. 1760-1762 ◽  
Author(s):  
S. L. Ren ◽  
A. M. Rao ◽  
P. C. Eklund ◽  
G. L. Doll
Keyword(s):  
Thin Film ◽  
Boron Nitride ◽  
Film Growth ◽  
Thin Film Growth ◽  
Ellipsometric Study
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