In situ work function study of oxidation and thin film growth on clean surfaces

Surface Science ◽

10.1016/s0039-6028(99)00140-5 ◽

1999 ◽

Vol 433-435 ◽

pp. 770-774 ◽

Author(s):

I.D Baikie ◽

U Petermann ◽

B Lägel

Keyword(s):

Thin Film ◽

Work Function ◽

Film Growth ◽

Thin Film Growth ◽

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Resolving the Evolution of Atomic Layer-Deposited Thin-Film Growth by Continuous In Situ X-Ray Absorption Spectroscopy

Chemistry of Materials ◽

10.1021/acs.chemmater.0c04547 ◽

2021 ◽

Author(s):

Xiaohui Qu ◽

Danhua Yan ◽

Ruoshui Li ◽

Jiajie Cen ◽

Chenyu Zhou ◽

...

Keyword(s):

Thin Film ◽

Absorption Spectroscopy ◽

Film Growth ◽

Atomic Layer ◽

Thin Film Growth ◽

X Ray ◽

X Ray Absorption

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Low work function thin film growth for high efficiency thermionic energy converter: Coupled Kelvin probe and photoemission study of potassium oxide

physica status solidi (a) ◽

10.1002/pssa.201300136 ◽

2014 ◽

Vol 211 (6) ◽

pp. 1334-1337 ◽

Author(s):

F. Morini ◽

E. Dubois ◽

J. F. Robillard ◽

S. Monfray ◽

T. Skotnicki

Keyword(s):

Thin Film ◽

Work Function ◽

High Efficiency ◽

Film Growth ◽

Thin Film Growth ◽

Potassium Oxide ◽

Kelvin Probe ◽

Energy Converter ◽

Photoemission Study ◽

Thermionic Energy

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Development of a scanning probe microscopy integrated atomic layer deposition system for in situ successive monitoring of thin film growth

Review of Scientific Instruments ◽

10.1063/1.5042463 ◽

2018 ◽

Vol 89 (12) ◽

pp. 123702 ◽

Author(s):

Kun Cao ◽

Quan Hu ◽

Jiaming Cai ◽

Miao Gong ◽

Jianfeng Yang ◽

...

Keyword(s):

Thin Film ◽

Atomic Layer Deposition ◽

Scanning Probe Microscopy ◽

Film Growth ◽

Atomic Layer ◽

Thin Film Growth ◽

Scanning Probe ◽

Probe Microscopy ◽

Layer Deposition

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Work function modulation inMgO/Nb:SrTiO3by utilizing highly nonequilibrium thin-film growth

Physical Review B ◽

10.1103/physrevb.90.035453 ◽

2014 ◽

Vol 90 (3) ◽

Author(s):

Tomofumi Susaki ◽

Nobuhiro Shigaki ◽

Kosuke Matsuzaki ◽

Hideo Hosono

Keyword(s):

Thin Film ◽

Work Function ◽

Film Growth ◽

Thin Film Growth

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In situ X-ray reflectivity measurement of thin film growth during vacuum deposition

Applied Surface Science ◽

10.1016/0169-4332(95)00242-1 ◽

1996 ◽

Vol 92 ◽

pp. 282-286 ◽

Author(s):

Chih-Hao Lee ◽

Sung-Yuh Tseng

Keyword(s):

Thin Film ◽

Film Growth ◽

Thin Film Growth ◽

Vacuum Deposition ◽

Reflectivity Measurement ◽

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Inelastic scattering techniques for in situ characterization of thin film growth: backscatter Kikuchi diffraction

In Situ Characterization of Thin Film Growth ◽

10.1533/9780857094957.1.29 ◽

2011 ◽

pp. 29-51

Author(s):

N.J.C. Ingle

Keyword(s):

Thin Film ◽

Inelastic Scattering ◽

Film Growth ◽

Thin Film Growth ◽

In Situ Characterization

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Spectroscopies combined with reflection high-energy electron diffraction (RHEED) for real-time in situ surface monitoring of thin film growth

In Situ Characterization of Thin Film Growth ◽

10.1533/9780857094957.3.180 ◽

2011 ◽

pp. 180-211 ◽

Author(s):

P.G. Staib

Keyword(s):

Thin Film ◽

Electron Diffraction ◽

Real Time ◽

Film Growth ◽

High Energy ◽

Thin Film Growth ◽

Energy Electron ◽

High Energy Electron ◽

Surface Monitoring

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Soft x-ray spectrometer for in situ monitoring of thin-film growth

10.1117/12.193191 ◽

1994 ◽

Author(s):

Per Skytt ◽

Carl J. Englund ◽

Nial Wassdahl ◽

Derrick C. Mancini ◽

Joseph Nordgren

Keyword(s):

Thin Film ◽

Film Growth ◽

Thin Film Growth ◽

In Situ Monitoring ◽

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Reflection high-energy electron diffraction (RHEED) for in situ characterization of thin film growth

In Situ Characterization of Thin Film Growth ◽

10.1533/9780857094957.1.3 ◽

2011 ◽

pp. 3-28 ◽

Author(s):

G. Koster

Keyword(s):

Thin Film ◽

Electron Diffraction ◽

Film Growth ◽

High Energy ◽

Thin Film Growth ◽

Energy Electron ◽

High Energy Electron ◽

In Situ Characterization

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A two magnetron sputter deposition chamber for in situ observation of thin film growth by synchrotron radiation scattering

Review of Scientific Instruments ◽

10.1063/1.1384432 ◽

2001 ◽

Vol 72 (8) ◽

pp. 3344-3348 ◽

Author(s):

W. Matz ◽

N. Schell ◽

W. Neumann ◽

J. Bøttiger ◽

J. Chevallier

Keyword(s):

Thin Film ◽

Film Growth ◽

Sputter Deposition ◽

Thin Film Growth ◽

In Situ Observation ◽

Radiation Scattering ◽

Deposition Chamber ◽

Magnetron Sputter Deposition ◽

Magnetron Sputter

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