Magnetic‐field‐modulated written bits in TbFeCo thin films: Transmission electron microscopy Lorentz and scanning electron microscopy with polarization analysis studies

In this work a novel process allowing for the production of nanoporous Ge thin films is presented. This process uses the combination of two techniques: Ge sputtering on SiO2 and dopant ion implantation. The process entails four successive steps: (i) Ge sputtering on SiO2, (ii) implantation preannealing, (iii) high-dose dopant implantation, and (iv) implantation postannealing. Scanning electron microscopy and transmission electron microscopy were used to characterize the morphology of the Ge film at different process steps under different postannealing conditions. For the same postannealing conditions, the Ge film topology was shown to be similar for different implantation doses and different dopants. However, the film topology can be controlled by adjusting the postannealing conditions.

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Effects of Plate Magnetic Field on Iron-Rich Phase of Al-20Si-10Fe Alloy during Solidification

Applied Mechanics and Materials ◽

10.4028/www.scientific.net/amm.182-183.167 ◽

2012 ◽

Vol 182-183 ◽

pp. 167-173

Author(s):

Ming Li ◽

Zhi Ming Shi ◽

Dong Fang

Keyword(s):

Magnetic Field ◽

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Transmission Electron Microscopy ◽

Phase Transformation ◽

Optical Microscopy ◽

Energy Dispersive Spectrum ◽

Rich Phase ◽

Transmission Electron ◽

Scanning Electron

This paper studies iron-rich phase transformation law and mechanism of Al-20Si-10Fe alloy under the effect of plate magnetic field. with optical microscopy(OM)，scanning electron microscopy(SEM),energy dispersive spectrum(EDS)and transmission electron microscopy(TEM). The results show that plate magnetic field is directly involved in the phase transformation of iron-rich phase, making iron-rich phase change from lath-shaped β-Al5FeSi to herringbone-shapedα-Al8SiFe2. The enforcement of plate magnetic field during the phase-transforming process of β-Al5FeSi→α-Al8Si Fe2makes block α-Al1.3Si7.8Fe2.1phase yield out. And precipitation of α-Al1.3Si7.8Fe2.1phase is affected by the transforming process ofβ-Al5SiFe phase→α-Al8Si Fe2phase.

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Two- or three-way observations of the identical cell elements within the same sections by LM, TEM and/or SEM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100081279 ◽

1978 ◽

Vol 36 (2) ◽

pp. 82-83 ◽

Cited By ~ 1

Author(s):

Nakazo Watari ◽

Yasuaki Hotta ◽

Yoshio Mabuchi

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Transmission Electron Microscopy ◽

Fine Structure ◽

Light Microscopy ◽

Thin Sections ◽

Transmission Electron ◽

Identical Cell ◽

Electron Microscopes ◽

Scanning Electron

It is very useful if we can observe the identical cell elements within the same sections by light microscopy (LM), transmission electron microscopy (TEM) and/or scanning electron microscopy (SEM) sequentially, because, the cell fine structure can not be indicated by LM, while the color is; on the other hand, the cell fine structure can be very easily observed by EM, although its color properties may not. However, there is one problem in that LM requires thick sections of over 1 μm, while EM needs very thin sections of under 100 nm. Recently, we have developed a new method to observe the same cell elements within the same plastic sections using both light and transmission (conventional or high-voltage) electron microscopes.In this paper, we have developed two new observation methods for the identical cell elements within the same sections, both plastic-embedded and paraffin-embedded, using light microscopy, transmission electron microscopy and/or scanning electron microscopy (Fig. 1).

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Comparative Study of the Fine Morphology of Sensory Receptors in Aspidogaster conchicola and Cotylaspis insignis

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100094000 ◽

1972 ◽

Vol 30 ◽

pp. 150-151

Author(s):

Venita F. Allison ◽

J. E. Ubelaker ◽

J. H. Martin

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Transmission Electron Microscopy ◽

Nervous System ◽

Osmic Acid ◽

Sensory Receptors ◽

Transmission Electron ◽

Sensory Structures ◽

Fine Morphology ◽

Scanning Electron

It has been suggested that parasitism results in a reduction of sensory structures which concomitantly reflects a reduction in the complexity of the nervous system. The present study tests this hypothesis by examining the fine morphology and the distribution of sensory receptors for two species of aspidogastrid trematodes by transmission and scanning electron microscopy. The species chosen are an ectoparasite, Cotylaspis insignis and an endoparasite, Aspidogaster conchicola.Aspidogaster conchicola and Cotylaspis insignis were obtained from natural infections of clams, Anodonta corpulenta and Proptera purpurata. The specimens were fixed for transmission electron microscopy in phosphate buffered paraformaldehyde followed by osmic acid in the same buffer, dehydrated in an ascending series of ethanol solutions and embedded in Epon 812.

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Anisotropic Membranes as Substrates for Sem

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100092189 ◽

1976 ◽

Vol 34 ◽

pp. 444-445

Author(s):

Thomas P. Turnbull ◽

W. F. Bowers

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Flow ◽

Polymer Chemistry ◽

Surface Porosity ◽

Transmission Electron ◽

Pore Texture ◽

Spongy Layer ◽

Scanning Electron

Until recently the prime purposes of filters have been to produce clear filtrates or to collect particles from solution and then remove the filter medium and examine the particles by transmission electron microscopy. These filters have not had the best characteristics for scanning electron microscopy due to the size of the pores or the surface topography. Advances in polymer chemistry and membrane technology resulted in membranes whose characteristics make them versatile substrates for many scanning electron microscope applications. These polysulphone type membranes are anisotropic, consisting of a very thin (0.1 to 1.5 μm) dense skin of extremely fine, controlled pore texture upon a much thicker (50 to 250μm), spongy layer of the same polymer. Apparent pore diameters can be controlled in the range of 10 to 40 A. The high flow ultrafilters which we are describing have a surface porosity in the range of 15 to 25 angstrom units (0.0015-0.0025μm).

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Digital imaging: When should one take the plunge?

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100165471 ◽

1996 ◽

Vol 54 ◽

pp. 602-603

Author(s):

John F. Mansfield

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Transmission Electron Microscopy ◽

Optical Microscopy ◽

Digital Imaging ◽

Storage Devices ◽

Major Benefit ◽

Transmission Electron ◽

New Instrument ◽

Scanning Electron

The current imaging trend in optical microscopy, scanning electron microscopy (SEM) or transmission electron microscopy (TEM) is to record all data digitally. Most manufacturers currently market digital acquisition systems with their microscope packages. The advantages of digital acquisition include: almost instant viewing of the data as a high-quaity positive image (a major benefit when compared to TEM images recorded onto film, where one must wait until after the microscope session to develop the images); the ability to readily quantify features in the images and measure intensities; and extremely compact storage (removable 5.25” storage devices which now can hold up to several gigabytes of data).The problem for many researchers, however, is that they have perfectly serviceable microscopes that they routinely use that have no digital imaging capabilities with little hope of purchasing a new instrument.

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Imaging magnetic microstructure with SEMPA

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010015099x ◽

1993 ◽

Vol 51 ◽

pp. 1032-1033

Author(s):

M. H. Kelley ◽

J. Unguris ◽

R. J. Celotta ◽

D. T. Pierce

Keyword(s):

Electron Microscopy ◽

Thin Films ◽

Scanning Electron Microscopy ◽

Sandwich Structure ◽

Magnetic Coupling ◽

Polarization Analysis ◽

Secondary Electrons ◽

Magnetic Microstructure ◽

Escape Depth ◽

Scanning Electron

By measuring the spin polarization of secondary electrons generated in a scanning electron microscope, scanning electron microscopy with polarization analysis (SEMPA) can directly image the magnitude and direction of a material’s magnetization. Because the escape depth of the secondaries is only on the order of 1 nm, SEMPA is especially well-suited for investigating the magnetization of ultra-thin films and surfaces. We have exploited this feature of SEMPA to study the magnetic microstrcture and magnetic coupling in ferromagnetic multilayers where the layers may only be a few atomic layers thick. For example, we have measured the magnetic coupling in Fe/Cr/Fe(100) and Fe/Ag/Fe(100) trilayers and have found that the coupling oscillates between ferromagnetic and antiferromagnetic as a function of the Cr or Ag spacer thickness.The SEMPA apparatus has been described in detail elsewhere. The sample consisted of a magnetic sandwich structure with a wedge-shaped interlayer as shown in Fig. 1.

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