Device characterization of correlated electron random access memories

2011 ◽  
Vol 109 (9) ◽  
pp. 091608 ◽  
Author(s):  
Christopher R. McWilliams ◽  
Jolanta Celinska ◽  
Carlos A. Paz de Araujo ◽  
Kan-Hao Xue
Keyword(s):  
Random Access ◽  
Device Characterization ◽  
Correlated Electron

scholarly journals Characterization of coded random access with compressive sensing based multi-user detection

2014 ◽  
Author(s):  
Yalei Ji ◽  
Cedomir Stefanovic ◽  
Carsten Bockelmann ◽  
Armin Dekorsy ◽  
Petar Popovski
Keyword(s):  
Compressive Sensing ◽  
Random Access

Characterization of Oxygen Accumulation in Indium-Tin-Oxide for Resistance Random Access Memory

2014 ◽  
Vol 35 (6) ◽  
pp. 630-632 ◽  
Author(s):  
Rui Zhang ◽  
Tai-Fa Young ◽  
Min-Chen Chen ◽  
Hsin-Lu Chen ◽  
Shu-Ping Liang ◽  
...  
Keyword(s):  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Random Access ◽  
Random Access Memory ◽  
Access Memory ◽  
Resistance Random Access Memory

Device Characterization of Thin-Film Phototransistors for Photosensor Applications

2008 ◽  
Vol E91-C (10) ◽  
pp. 1557-1563 ◽  
Author(s):  
M. KIMURA ◽  
Y. NISHIZAKI ◽  
T. YAMASHITA ◽  
T. SHIMA ◽  
T. HACHIDA
Keyword(s):  
Thin Film ◽  
Device Characterization

Transistor-level characterization of static random access memory bit failures induced by random telegraph noise

2016 ◽  
Vol 55 (4S) ◽  
pp. 04ED05 ◽  
Author(s):  
Tomoko Mizutani ◽  
Takuya Saraya ◽  
Kiyoshi Takeuchi ◽  
Masaharu Kobayashi ◽  
Toshiro Hiramoto
Keyword(s):  
Random Access ◽  
Random Access Memory ◽  
Static Random Access Memory ◽  
Access Memory ◽  
Random Telegraph Noise ◽  
Telegraph Noise

scholarly journals Characterization of Ferroelectric Random Access Memory (FRAM) Storage Capacitors

2020 ◽  
Vol 26 (S2) ◽  
pp. 1404-1405
Author(s):  
Sahar Hihath ◽  
Hannah Harter ◽  
Jerry Fortier ◽  
David Flowers
Keyword(s):  
Random Access ◽  
Random Access Memory ◽  
Access Memory ◽  
Ferroelectric Random Access Memory

Fabrication and Device Characterization of Omega-Shaped-Gate ZnO Nanowire Field-Effect Transistors

Nano Letters ◽  
2006 ◽  
Vol 6 (7) ◽  
pp. 1454-1458 ◽  
Author(s):  
Kihyun Keem ◽  
Dong-Young Jeong ◽  
Sangsig Kim ◽  
Moon-Sook Lee ◽  
In-Seok Yeo ◽  
...  
Keyword(s):  
Field Effect ◽  
Field Effect Transistors ◽  
Zno Nanowire ◽  
Device Characterization

Reliability and Characterization of Composite Oxide/Nitride Dielectrics for Multi‐Megabit Dynamic Random Access Memory Stacked Capacitors

1991 ◽  
Vol 138 (7) ◽  
pp. 2052-2057 ◽  
Author(s):  
P. C. Fazan ◽  
A. Ditali ◽  
C. H. Dennison ◽  
H. E. Rhodes ◽  
H. C. Chan ◽  
...  
Keyword(s):  
Random Access ◽  
Random Access Memory ◽  
Dynamic Random Access Memory ◽  
Access Memory ◽  
Composite Oxide

Fabrication and Device Characterization of Buried Ridge II-VI Blue-Green Laser Diodes

1997 ◽  
Author(s):  
P. F. Baude ◽  
F. R. Chien ◽  
G. M. Haugen ◽  
D. C. Grillo ◽  
T. J. Miller ◽  
...  
Keyword(s):  
Laser Diodes ◽  
Green Laser ◽  
Device Characterization
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