Examination of electrical and optical properties of vanadium in bulkn‐type silicon carbide

1994 ◽  
Vol 76 (10) ◽  
pp. 5769-5772 ◽  
Author(s):  
A. O. Evwaraye ◽  
S. R. Smith ◽  
W. C. Mitchel
1989 ◽  
Vol 65 (1) ◽  
pp. 137-145 ◽  
Author(s):  
H. Weman ◽  
A. Henry ◽  
T. Begum ◽  
B. Monemar ◽  
O. O. Awadelkarim ◽  
...  

1996 ◽  
Vol 423 ◽  
Author(s):  
R. Eckstein ◽  
D. Hofmann ◽  
Y. Makarov ◽  
St. G. Müller ◽  
G. Pensl ◽  
...  

AbstractExperimental and numerical analysis have been performed on the sublimation growth process of SiC bulk crystals. Crystallographic, electrical and optical properties of the grown silicon carbide (SIC) crystals have been evaluated by various characterization techniques. Numerical models for the global simulation of SiC bulk growth including heat and mass transfer and chemical processes are applied and experimentally verified.


2019 ◽  
Vol 34 (1) ◽  
pp. 557-561
Author(s):  
Rui Luo ◽  
Huidong Yang ◽  
Bo Huang ◽  
B. Y. Xu

1994 ◽  
Vol 339 ◽  
Author(s):  
Christer Fröjdh ◽  
Göran Thungström ◽  
Hans-Erik Nilsson ◽  
C. Sture Petersson

ABSTRACTSchottky diodes on Silicon Carbide (SiC) are of interest for many applications because of the relatively simple fabrication process. In this work we have fabricated Schottky diodes by evaporation of Ti on 6H-SiC and measured their electrical and optical properties. Most of the diodes show good rectifying behaviour with low reverse current and an ideality factor below 1.20. The photoresponse of the diodes has been measured in the range 200 – 400 nm. The peak sensitivity was found to be at 270 nm.


2001 ◽  
Vol 308-310 ◽  
pp. 687-690 ◽  
Author(s):  
O Klettke ◽  
S.A Reshanov ◽  
G Pensl ◽  
Y Shishkin ◽  
R.P Devaty ◽  
...  

2011 ◽  
Vol 161 (9-10) ◽  
pp. 692-697 ◽  
Author(s):  
Ahmet Faruk Özdemir ◽  
Sinem Gürkan Aydin ◽  
Durmuş Ali Aldemir ◽  
Songül Şen Gürsoy

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