Influence of source and drain contacts on the properties of the indium-zinc oxide thin-film transistors based on anodic aluminum oxide gate dielectrics
2014 ◽
Vol 61
(7)
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pp. 2448-2453
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2012 ◽
Vol 159
(5)
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pp. H502-H506
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Keyword(s):
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2011 ◽
Vol 58
(5)
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pp. 1452-1455
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2011 ◽
Vol 44
(45)
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pp. 455102
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2016 ◽
Vol 16
(12)
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pp. 12871-12874
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Keyword(s):
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2015 ◽
Vol 32
(8)
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pp. 088506
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