Conduction-band offset in a pseudomorphic GaAs/In0.2Ga0.8As quantum well determined by capacitance–voltage profiling and deep-level transient spectroscopy techniques
1995 ◽
Vol 24
(10)
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pp. 1381-1386
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Keyword(s):
1999 ◽
Vol 28
(8)
◽
pp. 975-979
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Keyword(s):
Keyword(s):