Quantitative characterization of ion-induced SiO2/Si interface traps by means of MeV He single-ion irradiation

Journal of Applied Physics ◽

10.1063/1.370590 ◽

1999 ◽

Vol 85 (11) ◽

pp. 7814-7818 ◽

Author(s):

M. Koh ◽

I. Ohdomari ◽

K. Igarashi ◽

T. Matsukawa ◽

S. Sawara

Keyword(s):

Ion Irradiation ◽

Interface Traps ◽

Quantitative Characterization

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Quantitative characterization of Si/SiO2 interface traps induced by energetic ions by means of single ion microprobe and single ion beam induced charge imaging

Applied Surface Science ◽

10.1016/s0169-4332(97)80073-6 ◽

1997 ◽

Vol 117-118 ◽

pp. 171-175 ◽

Author(s):

M. Koh ◽

K. Igarashi ◽

T. Sugimoto ◽

T. Matsukawa ◽

S. Mori ◽

...

Keyword(s):

Ion Beam ◽

Interface Traps ◽

Ion Microprobe ◽

Quantitative Characterization ◽

Energetic Ions ◽

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Quantitative Characterization of Interface Traps in Ferroelectric/Dielectric Stack Using Conductance Method

IEEE Transactions on Electron Devices ◽

10.1109/ted.2020.3034564 ◽

2020 ◽

Vol 67 (12) ◽

pp. 5315-5321

Author(s):

Yiming Qu ◽

Junkang Li ◽

Mengwei Si ◽

Xiao Lyu ◽

Peide D. Ye

Keyword(s):

Interface Traps ◽

Quantitative Characterization ◽

Conductance Method

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Quantitative Characterization of Ferroelectric/Dielectric Interface Traps by Pulse Measurements

IEEE Transactions on Electron Devices ◽

10.1109/ted.2021.3053497 ◽

2021 ◽

Vol 68 (3) ◽

pp. 1214-1220

Author(s):

Junkang Li ◽

Mengwei Si ◽

Yiming Qu ◽

Xiao Lyu ◽

Peide D. Ye

Keyword(s):

Interface Traps ◽

Quantitative Characterization ◽

Dielectric Interface ◽

Pulse Measurements

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Quantitative characterization of interface traps in Al2O3/AlGaN/GaN metal-oxide-semiconductor high-electron-mobility transistors by dynamic capacitance dispersion technique

Applied Physics Letters ◽

10.1063/1.4813912 ◽

2013 ◽

Vol 103 (3) ◽

pp. 033510 ◽

Author(s):

Xiao-Hua Ma ◽

Jie-Jie Zhu ◽

Xue-Yang Liao ◽

Tong Yue ◽

Wei-Wei Chen ◽

...

Keyword(s):

High Electron Mobility Transistors ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

High Electron ◽

Interface Traps ◽

Quantitative Characterization ◽

Electron Mobility Transistors ◽

Dispersion Technique ◽

Dynamic Capacitance

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MATERIAL PROPERTIES ANALYSIS OF CIRCUIT SUBASSEMBLIES: QUANTITATIVE CHARACTERIZATION OF SAPPHIRE (alpha-Al203) AND SILICON NITRIDE (Si3N4) USING CRYOGENIC CYCLING

10.1615/tfec2019.ref.027456 ◽

2019 ◽

Author(s):

Kirsten A. Lovelace ◽

Sonya T. Smith

Keyword(s):

Silicon Nitride ◽

Material Properties ◽

Quantitative Characterization

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Quantitative characterization of keyhole absorption mechanisms in 20 kW-class CO2 laser welding processes

International Congress on Applications of Lasers & Electro-Optics ◽

10.2351/1.5066122 ◽

2002 ◽

Author(s):

Jay F. Tu ◽

Takashi Inoue ◽

Isamu Miyamoto

Keyword(s):

Laser Welding ◽

Co2 Laser ◽

Quantitative Characterization ◽

Welding Processes

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Synthesis and Quantitative Characterization of Novel Copper-Graphite Composite Materials for Use as Electrical Sliding Contacts

Practical Metallography ◽

10.3139/147.110327 ◽

2015 ◽

Vol 52 (1) ◽

pp. 21-37 ◽

Author(s):

M. Klement ◽

G. Guth ◽

O. Lott ◽

A. Nagel ◽

G. Schneider

Keyword(s):

Composite Materials ◽

Quantitative Characterization ◽

Sliding Contacts ◽

Graphite Composite

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Faculty Opinions recommendation of Rapid quantitative characterization of protein interactions by composition gradient static light scattering.

Faculty Opinions – Post-Publication Peer Review of the Biomedical Literature ◽

10.3410/f.1013878.361501 ◽

2006 ◽

Author(s):

Victor Norris

Keyword(s):

Light Scattering ◽

Protein Interactions ◽

Static Light Scattering ◽

Composition Gradient ◽

Quantitative Characterization

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Faculty Opinions recommendation of Quantitative characterization of low-threshold mechanoreceptor inputs to lamina I spinoparabrachial neurons in the rat.

Faculty Opinions – Post-Publication Peer Review of the Biomedical Literature ◽

10.3410/f.1764958.1288056 ◽

2010 ◽

Author(s):

Arthur Craig

Keyword(s):

Quantitative Characterization ◽

Lamina I ◽

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Quantitative characterization of historical drought events in Korea -focusing on outlier analysis of precipitation-

Journal of Korea Water Resources Association ◽

10.3741/jkwra.2016.49.2.145 ◽

2016 ◽

Vol 49 (2) ◽

pp. 145-153 ◽

Author(s):

Ho-Won Jang ◽

Hyeong-Won Cho ◽

Tae-Woong Kim ◽

Joo-Heon Lee

Keyword(s):

Outlier Analysis ◽

Quantitative Characterization

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