Platinum and platinum alloys, due to their good electrical and mechanical properties, are commonly used in fields such as jewellery, catalysis and electronics. In this work, a two-layer system of Pt and V, deposited on Si substrates by electron beam deposition technique, were investigated amongst others for residual stress development in the coating. The investigation was carried out using diffraction techniques employing laboratory X-rays on the BRUKER D8 Discover instrument equipped with a High Star detector and analyzed with LEPTOS v6 software. The results showed the stress state to be tensile, relaxing significantly on annealing. In addition, complementary results of phase composition, and coating morphology will also be presented.