XRD Investigation of Residual Stresses in Electron Beam Deposited Pt-V Coatings

2010 ◽  
Vol 652 ◽  
pp. 303-308
Author(s):  
T.P. Ntsoane ◽  
M. Topic ◽  
R. Bucher

Platinum and platinum alloys, due to their good electrical and mechanical properties, are commonly used in fields such as jewellery, catalysis and electronics. In this work, a two-layer system of Pt and V, deposited on Si substrates by electron beam deposition technique, were investigated amongst others for residual stress development in the coating. The investigation was carried out using diffraction techniques employing laboratory X-rays on the BRUKER D8 Discover instrument equipped with a High Star detector and analyzed with LEPTOS v6 software. The results showed the stress state to be tensile, relaxing significantly on annealing. In addition, complementary results of phase composition, and coating morphology will also be presented.

1988 ◽  
Vol 27 (Part 2, No. 4) ◽  
pp. L625-L627 ◽  
Author(s):  
Kenichi Kuroda ◽  
Masashi Mukaida ◽  
Masafumi Yamamoto ◽  
Shintaro Miyazawa

2004 ◽  
Vol 03 (04n05) ◽  
pp. 631-638 ◽  
Author(s):  
S. JAIN ◽  
S. Y. CHAN ◽  
A. O. ADEYEYE ◽  
C. B. BOOTHROYD

A new technique for synthesizing Fe nanoparticles based on an electron beam deposition technique from a Fe 2 O 3 source has been developed. We deposited Fe 2 O 3 films directly on Si (001) substrates, Al and Cu buffer layer, and observed the formation of Fe nanoparticles at the Si (001) and Al interfaces respectively. The Al at the interface is oxidized to Al 2 O 3 and Si is oxidized to SiO 2. For films deposited on Cu buffer layer, however, no Fe nanoparticles were formed. We explain our results in terms of the enthalpy of formation of the oxides. The enthalpy of formation of SiO 2 and Al 2 O 3 is much lower than that of Fe 2 O 3, thus promoting the formation of Fe nanoparticles. The enthalpy of formation of CuO is however, greater than that of Fe 2 O 3 thus forbidding the formation of Fe nanoparticles. This is in agreement with both X-ray Photoelectron Spectroscopy (XPS) depth profile analysis and Transmission Electron Microscopy (TEM).


2001 ◽  
Vol 42 (8) ◽  
pp. 1561-1565 ◽  
Author(s):  
Hiroyuki Sasaki ◽  
Kazuhiko Kita ◽  
Junichi Nagahora ◽  
Akihisa Inoue

2003 ◽  
Vol 44 (10) ◽  
pp. 1948-1954 ◽  
Author(s):  
Hiroyuki Sasaki ◽  
Naoko Kobayashi ◽  
Kazuhiko Kita ◽  
Junichi Nagahora ◽  
Akihisa Inoue

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