Evaluation of mirror full adder circuit reliability performance due to negative bias temperature instability (NBTI) effects based on different defect mechanisms
2005 ◽
Vol 45
(1)
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pp. 31-38
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2019 ◽
Vol 11
(4)
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pp. 04018-1-04018-6
2008 ◽
Vol 55
(7)
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pp. 1630-1638
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