Surface state density distribution at an Al2O3‐InP metal‐insulator‐semiconductor field‐effect transistor measured by the charge pumping technique
2000 ◽
Vol 360
(1-2)
◽
pp. 256-260
◽
A novel Pd/oxide/GaAs metal-insulator-semiconductor field-effect transistor (MISFET) hydrogen sensor
2001 ◽
Vol 16
(12)
◽
pp. 997-1001
◽
Keyword(s):
1998 ◽
Vol 37
(Part 2, No. 11A)
◽
pp. L1293-L1296
◽