Impact of N5+ion implantation on optical and electrical properties of polycrystalline ZnO film

2014 ◽  
Vol 169 (11) ◽  
pp. 965-979
Author(s):  
Ashutosh Kumar ◽  
Sunita Keshri ◽  
Beauty Pandey ◽  
J. B. M. Krishna ◽  
Dipankar Das
2011 ◽  
Author(s):  
Saurabh Nagar ◽  
Bhavesh Sinha ◽  
Arjun Mandal ◽  
S. K. Gupta ◽  
Subhananda Chakrabarti

2007 ◽  
Vol 253 (11) ◽  
pp. 5161-5165 ◽  
Author(s):  
Jingchang Sun ◽  
Jiming Bian ◽  
Hongwei Liang ◽  
Jianze Zhao ◽  
Lizhong Hu ◽  
...  

2007 ◽  
Vol 390 (1-2) ◽  
pp. 71-78 ◽  
Author(s):  
S. Venkatachalam ◽  
Yoshinori Kanno ◽  
D. Mangalaraj ◽  
Sa.K. Narayandass

1985 ◽  
Vol 45 ◽  
Author(s):  
K. C. Cadien ◽  
B. B. Harbison

ABSTRACTRecoil ion implantation of In2O3 into soda glass substrates has been investigated. Increased adhesion results, while the optical and electrical properties are altered. Large energy deposition rates can lead to the reduction of the oxide, thus decreasing visible transmission. Thermal annealing in air results in the recovery of optical and electrical properties. The influence of ion energy and dose on the modification of the glass has been examined.


2019 ◽  
Vol 64 (5) ◽  
pp. 434 ◽  
Author(s):  
O. V. Melnichuk ◽  
L. Yu. Melnichuk ◽  
N. O. Korsunska ◽  
L. Yu. Khomenkova ◽  
Ye. F. Venger

Optical and electrophysical properties of terbium-doped zinc oxide films have been studied, by using the external reflection IR spectroscopy. The films were deposited onto silicon oxide substrates with the help of the magnetron sputtering method. A theoretical analysis of the reflection spectra of the ZnO/SiO2 structure is carried out in the framework of a multioscillatory model in the spectral interval 50–1500 cm−1 and for the electrical field orientation perpendicular to the c-axis (E⊥C). The method of dispersion analysis is applied to determine the optical and electrical properties of ZnO films, as well as the oscillator strengths and damping coefficients in the ZnO film and the SiO2 substrate. The influences of the phonon and plasmon-phonon subsystems in the ZnO film on the shape of IR reflection spectra registered from the Tb–ZnO/SiO2 structure are elucidated.


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