Application of atomic force microscopy to the study of low-temperature strain of elastomeric materials

2021 ◽  
pp. 1-8
Author(s):  
Nikolay Victorovich Shadrinov ◽  
Andrey Leonidovich Fedorov
Keyword(s):  
Atomic Force Microscopy ◽  
Low Temperature ◽  
Force Microscopy ◽  
Atomic Force ◽  
Elastomeric Materials ◽  
Temperature Strain

Low temperature corneal laser welding investigated by atomic force microscopy

2009 ◽  
Author(s):  
Paolo Matteini ◽  
Francesca Sbrana ◽  
Bruno Tiribilli ◽  
Roberto Pini
Keyword(s):  
Atomic Force Microscopy ◽  
Low Temperature ◽  
Laser Welding ◽  
Force Microscopy ◽  
Atomic Force

Morphology of Low Temperature Carbon Films Prepared by VHF CVD: Correlation with Field Emission

1998 ◽  
Vol 509 ◽  
Author(s):  
A.N. Titkov ◽  
A.I. Kosarev ◽  
A.J. Vinogradov ◽  
Z. Waqar ◽  
I.V. Makarenko ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Low Temperature ◽  
Field Emission ◽  
Significant Influence ◽  
Substrate Surface ◽  
Carbon Films ◽  
Emission Characteristics ◽  
Force Microscopy ◽  
Atomic Force ◽  
Deposition Parameters

AbstractThe effect of deposition parameters and substrate on the morphology of carbon films prepared in VHF plasma at low temperature has been studied by Atomic Force Microscopy. Carbon films demonstrating superior emission characteristics were the smoothest, but not all of the smoothest films demonstrated good emission. Significant influence of pre-growth treatment of the substrate surface on the emission characteristics of the films was found.

scholarly journals Growth and Characterizations of Mg-doped GaAs Films

2020 ◽  
Author(s):  
Dong Fong
Keyword(s):  
Atomic Force Microscopy ◽  
Low Temperature ◽  
Surface Morphology ◽  
Force Microscopy ◽  
Atomic Force ◽  
Gaas Films ◽  
Growth Method ◽  
P Type ◽  
Low Temperature Photoluminescence ◽  
Mg Doped

The short research of optimization of the growth method to obtain p-type GaAs (001) layers using Si as the dopant was reported in this work. Atomic force microscopy was used to analyze the surface morphology and low-temperature photoluminescence also used to confirm the p-type of the layers.

scholarly journals Characterizations of p-type GaAs Films

2020 ◽  
Author(s):  
Sang Zhen
Keyword(s):  
Atomic Force Microscopy ◽  
Low Temperature ◽  
Surface Morphology ◽  
Force Microscopy ◽  
Atomic Force ◽  
Gaas Films ◽  
Growth Method ◽  
P Type ◽  
Low Temperature Photoluminescence

The short research of optimization of the growth method to obtain p-type GaAs (001) layers using Si as the dopant was reported in this work. Atomic force microscopy was used to analyze the surface morphology and low-temperature photoluminescence also used to confirm the p-type of the layers.

Benchmarking atomically defined AFM tips for chemical-selective imaging

Nanoscale ◽  
2021 ◽  
Author(s):  
Bertram Schulze Lammers ◽  
Damla Yesilpinar ◽  
Alexander Timmer ◽  
Zhixin Hu ◽  
Wei Ji ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Low Temperature ◽  
Surface Chemistry ◽  
Performance Assessment ◽  
Force Microscopy ◽  
Atomic Force ◽  
Afm Tips

Controlling the identity of the tip-terminating atom or molecule in low-temperature atomic force microscopy has led to ground breaking progress in surface chemistry and nanotechnology. Lacking a comparative tip-performance assessment,...

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