The Einstein galactic plane survey - Statistical analysis of the complete X-ray sample

1984 ◽  
Vol 278 ◽  
pp. 137 ◽  
Author(s):  
P. Hertz ◽  
J. E. Grindlay
Keyword(s):  
Statistical Analysis ◽  
Galactic Plane ◽  
X Ray

scholarly journals Statistical analysis of the reproducibility of residual stress measurements in cold extruded parts

2021 ◽  
Author(s):  
Fabian Jaeger ◽  
Alessandro Franceschi ◽  
Holger Hoche ◽  
Peter Groche ◽  
Matthias Oechsner
Keyword(s):  
Residual Stress ◽  
Statistical Analysis ◽  
Stress Measurement ◽  
Industrial Applications ◽  
Cold Extrusion ◽  
X Ray Diffraction ◽  
Forming Process ◽  
X Ray ◽  
Stress States ◽  
Key Aspects

AbstractCold extruded components are characterized by residual stresses, which originate from the experienced manufacturing process. For industrial applications, reproducibility and homogeneity of the final components are key aspects for an optimized quality control. Although striving to obtain identical deformation and surface conditions, fluctuation in the manufacturing parameters and contact shear conditions during the forming process may lead to variations of the spatial residual stress distribution in the final product. This could lead to a dependency of the residual stress measurement results on the relative axial and circumferential position on the sample. An attempt to examine this problem is made by the employment of design of experiments (DoE) methods. A statistical analysis of the residual stress results generated through X-Ray diffraction is performed. Additionally, the ability of cold extrusion processes to generate uniform stress states is analyzed on specimens of austenitic stainless steel 1.4404 and possible correlations with the pre-deformed condition are statistically examined. Moreover, the influence of the coating, consisting of oxalate and a MoS2 based lubricant, on the X-Ray diffraction measurements of the surface is investigated.

Statistical analysis of soft X-ray solar flares during solar cycles 22, 23, and 24

2021 ◽  
Vol 366 (1) ◽  
Author(s):  
Bo Xiong ◽  
Ting Wang ◽  
Xiaolin Li ◽  
Yunxing Yin
Keyword(s):  
Statistical Analysis ◽  
Solar Flares ◽  
Solar Cycles ◽  
X Ray

scholarly journals Chemical Species, Micromorphology, and XRD Fingerprint Analysis of Tibetan MedicineZuotaiContaining Mercury

2016 ◽  
Vol 2016 ◽  
pp. 1-11 ◽  
Author(s):  
Cen Li ◽  
Hongxia Yang ◽  
Yuzhi Du ◽  
Yuancan Xiao ◽  
Zhandui ◽  
...  
Keyword(s):  
Statistical Analysis ◽  
Multivariate Statistical Analysis ◽  
Chemical Species ◽  
Physicochemical Characteristics ◽  
Chemical Substance ◽  
Tibetan Medicine ◽  
Fingerprint Analysis ◽  
Multivariate Statistical ◽  
Positive Role ◽  
X Ray

Zuotai(gTso thal) is one of the famous drugs containing mercury in Tibetan medicine. However, little is known about the chemical substance basis of its pharmacodynamics and the intrinsic link of different samples sources so far. Given this, energy dispersive spectrometry of X-ray (EDX), scanning electron microscopy (SEM), atomic force microscopy (AFM), and powder X-ray diffraction (XRD) were used to assay the elements, micromorphology, and phase composition of nineZuotaisamples from different regions, respectively; the XRD fingerprint features ofZuotaiwere analyzed by multivariate statistical analysis. EDX result shows thatZuotaicontains Hg, S, O, Fe, Al, Cu, and other elements. SEM and AFM observations suggest thatZuotaiis a kind of ancient nanodrug. Its particles are mainly in the range of 100–800 nm, which commonly further aggregate into 1–30 μm loosely amorphous particles. XRD test shows thatβ-HgS, S8, andα-HgS are its main phase compositions. XRD fingerprint analysis indicates that the similarity degrees of nine samples are very high, and the results of multivariate statistical analysis are broadly consistent with sample sources. The present research has revealed the physicochemical characteristics ofZuotai, and it would play a positive role in interpreting this mysterious Tibetan drug.

scholarly journals The X-ray source content of the XMM-Newton Galactic plane survey

2010 ◽  
Vol 523 ◽  
pp. A92 ◽  
Author(s):  
C. Motch ◽  
R. Warwick ◽  
M. S. Cropper ◽  
F. Carrera ◽  
P. Guillout ◽  
...  
Keyword(s):  
Galactic Plane ◽  
X Ray

scholarly journals A Multi-Wavelength View of the XMM-Newton Galactic Plane

2014 ◽  
Vol 1 (1) ◽  
pp. 123-126
Author(s):  
Ada Nebot Gómez-Morán ◽  
Christian Motch
Keyword(s):  
Surface Density ◽  
Binary Systems ◽  
Galactic Plane ◽  
Galactic Centre ◽  
Galactic Latitude ◽  
X Ray ◽  
Model Predictions ◽  
Science Centre ◽  
Multi Wavelength ◽  
Galactic Longitude

We present an X-ray survey of the Galactic Plane conducted by the Survey Science Centre of the XMM-Newton satellite. The survey contains more than 1300 X-ray detections at low and intermediate Galactic latitudes and covering 4 deg<sup>2</sup> well spread in Galactic longitude. From a multi-wavelength analysis, using optical spectra and helped by optical and infrared photometry we identify and classify about a fourth of the sources. The observed surface density of soft X-ray (&lt;2 keV) sources decreases with Galactic latitude and although compatible with model predictions at first glance, presents an excess of stars, likely due to giants in binary systems. In the hard band (&gt;2 keV) the surface density of sources presents an excess with respect to the expected extragalactic contribution. This excess highly concentrates towards the direction of the Galactic Centre and is compatible with previous results from Chandra observations around the Galactic Centre. The nature of these sources is still unknown.

scholarly journals Optical identifications of five INTEGRAL hard X-ray sources in the Galactic plane

2008 ◽  
Vol 34 (10) ◽  
pp. 653-663 ◽  
Author(s):  
I. F. Bikmaev ◽  
R. A. Burenin ◽  
M. G. Revnivtsev ◽  
S. Yu. Sazonov ◽  
R. A. Sunyaev ◽  
...  
Keyword(s):  
Galactic Plane ◽  
X Ray ◽  
Optical Identifications

scholarly journals Evolution of MAXI J1631–479 during the January 2019 outburst observed by INTEGRAL/IBIS

2020 ◽  
Vol 492 (3) ◽  
pp. 3657-3661 ◽  
Author(s):  
M Fiocchi ◽  
F Onori ◽  
A Bazzano ◽  
A J Bird ◽  
A Bodaghee ◽  
...  
Keyword(s):  
Galactic Plane ◽  
Thermal Emission ◽  
Spectral Characteristics ◽  
Monitoring Program ◽  
High Energy ◽  
Thermal Electron ◽  
X Ray ◽  
Inverse Compton Scattering ◽  
Black Hole Candidate ◽  
Decay Times

ABSTRACT We report on a recent bright outburst from the new X-ray binary transient MAXI J1631–479, observed in January 2019. In particular, we present the 30–200 keV analysis of spectral transitions observed with INTEGRAL/IBIS during its Galactic plane monitoring program. In the MAXI and BAT monitoring period, we observed two different spectral transitions between the high/soft and low/hard states. The INTEGRAL spectrum from data taken soon before the second transition is best described by a Comptonized thermal component with a temperature of kTe ∼ 30 keV and a high-luminosity value of $L_{2-200\, \mathrm{keV}}\sim 3\times 10^{38}$ erg−1 (assuming a distance of 8 kpc). During the second transition, the source shows a hard, power-law spectrum. The lack of high energy cut-off indicates that the hard X-ray spectrum from MAXI J1631–479 is due to a non-thermal emission. Inverse Compton scattering of soft X-ray photons from a non-thermal or hybrid thermal/non-thermal electron distribution can explain the observed X-ray spectrum although a contribution to the hard X-ray emission from a jet cannot be determined at this stage. The outburst evolution in the hardness-intensity diagram, the spectral characteristics, and the rise and decay times of the outburst are suggesting that this system is a black hole candidate.

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