A new method for charge trapping measurement during electron beam irradiation: application to glass containing alkali ions and single-crystalline quartz

2004 ◽  
Vol 37 (15) ◽  
pp. 2181-2190 ◽  
Author(s):  
S Fakhfakh ◽  
N Ghorbel ◽  
O Jbara ◽  
S Rondot ◽  
D Martin ◽  
...  
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Charge Trapping ◽  
New Method ◽  
Beam Irradiation ◽  
Crystalline Quartz ◽  
Single Crystalline ◽  
Alkali Ions

Defect Creation and Electron Trapping in Single Crystal and Sintered Alumina by Electron Beam Irradiation

1992 ◽  
Vol 279 ◽  
Author(s):  
D. L. Carroll ◽  
D. L. Doering ◽  
P. Xiong-Skiba
Keyword(s):  
Electron Beam ◽  
Single Crystal ◽  
Electron Beam Irradiation ◽  
Thermionic Emission ◽  
Charge Trapping ◽  
Binding Energies ◽  
Electron Trapping ◽  
Excess Charge ◽  
Beam Irradiation ◽  
Core Electron

ABSTRACTElectron beam irradiation of oxides produces electron trapping states which store excess charge. Thermionic emission of this charge occurs during heating with emission peak temperatures related to binding mechanisms and energies. We present thermionic emission results which show both intrinsic and beam induced trapping states in OC-Al2O3 (sapphire) and sintered alumina. Five states have been identified with thermionic emission peaks at temperatures between -50°C and 500°C. Two states are electron beam induced and occur only for electron beam energies above fixed thresholds. These thresholds appear to correlate to with the Is core electron binding energies for oxygen and aluminum. The emission peaks from the sintered material are about 10 fold greater in intensity and slightly broadened in comparison to the single crystal. This suggests that structure plays an important role in charge trapping. Emission was also extremely sensitive to sample treatments such as annealing before electron irradiation.

Single crystalline ZnS nanotubes and their structural degradation under electron beam irradiation

2007 ◽  
Vol 90 (21) ◽  
pp. 211910 ◽  
Author(s):  
L. Shi ◽  
Y. M. Xu ◽  
Quan Li ◽  
Z. Y. Wu ◽  
F. R. Chen ◽  
...  
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Structural Degradation ◽  
Single Crystalline

Methods to Monitor and Improve the Performance of Specimen Holders for Transmission Electron Cryomicroscopy

1996 ◽  
Vol 54 ◽  
pp. 454-455
Author(s):  
B. L. Armbruster ◽  
B. Kraus ◽  
M. Pan
Keyword(s):  
Electron Microscopy ◽  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Quality Of Data ◽  
Electron Cryomicroscopy ◽  
Thermal Equilibration ◽  
Transmission Electron ◽  
Electron Microscopes

One goal in electron microscopy of biological specimens is to improve the quality of data to equal the resolution capabilities of modem transmission electron microscopes. Radiation damage and beam- induced movement caused by charging of the sample, low image contrast at high resolution, and sensitivity to external vibration and drift in side entry specimen holders limit the effective resolution one can achieve. Several methods have been developed to address these limitations: cryomethods are widely employed to preserve and stabilize specimens against some of the adverse effects of the vacuum and electron beam irradiation, spot-scan imaging reduces charging and associated beam-induced movement, and energy-filtered imaging removes the “fog” caused by inelastic scattering of electrons which is particularly pronounced in thick specimens.Although most cryoholders can easily achieve a 3.4Å resolution specification, information perpendicular to the goniometer axis may be degraded due to vibration. Absolute drift after mechanical and thermal equilibration as well as drift after movement of a holder may cause loss of resolution in any direction.

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