Characterization of the reliability and uniformity of an anodization-free fabrication process for high-quality Nb/Al–AlOx/Nb Josephson junctions
2013 ◽
Vol 26
(6)
◽
pp. 065012
◽
2016 ◽
Vol 2016
(1)
◽
pp. 000288-000292
2000 ◽
Growth and Characterization of High Quality Epitaxial GaN on ZnO(0001) by Reactive Molecular Epitaxy
1998 ◽
Vol 264-268
◽
pp. 1201-1204
Keyword(s):
2010 ◽
Vol 470
(20)
◽
pp. 1515-1519
◽
2000 ◽
Vol 209
(1)
◽
pp. 8-14
◽
Keyword(s):
1984 ◽
Vol 68
(1)
◽
pp. 398-405
◽
2011 ◽
Vol 21
(3)
◽
pp. 306-310
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