The geometric phase analysis method based on the local high resolution discrete Fourier transform for deformation measurement

2014 ◽  
Vol 25 (2) ◽  
pp. 025402 ◽  
Author(s):  
Xianglu Dai ◽  
Huimin Xie ◽  
Huaixi Wang ◽  
Chuanwei Li ◽  
Zhanwei Liu ◽  
...  
Keyword(s):  
Fourier Transform ◽  
High Resolution ◽  
Discrete Fourier Transform ◽  
Phase Analysis ◽  
Geometric Phase ◽  
Deformation Measurement ◽  
Analysis Method ◽  
Geometric Phase Analysis

Geometric phase analysis method using a subpixel displacement match algorithm

2020 ◽  
Vol 59 (8) ◽  
pp. 2393
Author(s):  
Hongye Zhang ◽  
Xianglu Dai ◽  
Huihui Wen ◽  
Jinhao Liu ◽  
Zhanwei Liu ◽  
...  
Keyword(s):  
Phase Analysis ◽  
Geometric Phase ◽  
Analysis Method ◽  
Match Algorithm ◽  
Geometric Phase Analysis

Subset geometric phase analysis method for deformation evaluation of HRTEM images

2016 ◽  
Vol 171 ◽  
pp. 34-42 ◽  
Author(s):  
Hongye Zhang ◽  
Zhanwei Liu ◽  
Huihui Wen ◽  
Huimin Xie ◽  
Chao Liu
Keyword(s):  
Phase Analysis ◽  
Geometric Phase ◽  
Analysis Method ◽  
Geometric Phase Analysis

Local Lattice Strain Measurement Using Geometric Phase Analysis of Dark Field Images from Scanning Transmission Electron Microscopy

2011 ◽  
Author(s):  
Jayhoon Chung ◽  
Guoda Lian ◽  
Lew Rabenberg
Keyword(s):  
Phase Analysis ◽  
Geometric Phase ◽  
Process Development ◽  
Local Strain ◽  
Strain Engineering ◽  
Dark Field ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Geometric Phase Analysis ◽  
Scanning Transmission

Abstract Since strain engineering plays a key role in semiconductor technology development, a reliable and reproducible technique to measure local strain in devices is necessary for process development and failure analysis. In this paper, geometric phase analysis of high angle annular dark field - scanning transmission electron microscope images is presented as an effective technique to measure local strains in the current node of Si based transistors.

Dislocation core investigation by geometric phase analysis and the dislocation density tensor

2008 ◽  
Vol 41 (3) ◽  
pp. 035408 ◽  
Author(s):  
J Kioseoglou ◽  
G P Dimitrakopulos ◽  
Ph Komninou ◽  
Th Karakostas ◽  
E C Aifantis
Keyword(s):  
Dislocation Density ◽  
Phase Analysis ◽  
Geometric Phase ◽  
Dislocation Core ◽  
Density Tensor ◽  
Geometric Phase Analysis ◽  
Dislocation Density Tensor

scholarly journals Effect of lattice mismatch and shell thickness on strain in core@shell nanocrystals

2020 ◽  
Vol 2 (3) ◽  
pp. 1105-1114 ◽  
Author(s):  
Jocelyn T. L. Gamler ◽  
Alberto Leonardi ◽  
Xiahan Sang ◽  
Kallum M. Koczkur ◽  
Raymond R. Unocic ◽  
...  
Keyword(s):  
Phase Analysis ◽  
Geometric Phase ◽  
Shell Thickness ◽  
Lattice Mismatch ◽  
Lattice Relaxation ◽  
Atomistic Simulations ◽  
Core Shell ◽  
Geometric Phase Analysis ◽  
Bimetallic Nanocrystals

Bimetallic nanocrystals with core@shell architectures are versatile particles. Geometric phase analysis of TEM images and atomistic simulations are coupled to reveal the lattice relaxation as a function of lattice mismatch and shell thickness.

scholarly journals Geometric Phase Analysis of Strain in Naturally Deformed Olivine

2003 ◽  
Vol 9 (S02) ◽  
pp. 952-953
Author(s):  
C.L. Johnson ◽  
M.J. Hÿtch ◽  
P.R. Buseck
Keyword(s):  
Phase Analysis ◽  
Geometric Phase ◽  
Geometric Phase Analysis
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