Gate-bias stress-dependent photoconductive characteristics of multi-layer MoS2 field-effect transistors
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2013 ◽
2019 ◽
Vol 481
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pp. 642-648
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2018 ◽
Vol 2
(9)
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pp. 1631-1641
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2018 ◽
Vol 84
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pp. 62-65
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