Methodological analysis for the electrooptic coefficient and birefringence of BaTiO3 crystal films with complementary polarization modulations

In the previous paper, the author reported on a technique for preparing vapor-deposited single crystal films as high resolution standards for electron microscopy. The present paper is intended to describe the preparation of several high resolution standards for dark field microscopy and also to mention some results obtained from these studies. Three preparations were used initially: 1.) Graphitized carbon black, 2.) Epitaxially grown particles of different metals prepared by vapor deposition, and 3.) Particles grown epitaxially on the edge of micro-holes formed in a gold single crystal film.The authors successfully obtained dark field micrographs demonstrating the 3.4Å lattice spacing of graphitized carbon black and the Au single crystal (111) lattice of 2.35Å. The latter spacing is especially suitable for dark field imaging because of its preparation, as in 3.), above. After the deposited film of Au (001) orientation is prepared at 400°C the substrate temperature is raised, resulting in the formation of many square micro-holes caused by partial evaporation of the Au film.

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Structure of Palladium Single-Crystal Films Prepared by Flash Evaporation onto (001) NaCl Substrates

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100069272 ◽

1970 ◽

Vol 28 ◽

pp. 456-457

Author(s):

L. E. Murr ◽

G. Wong

Keyword(s):

Single Crystal ◽

High Vacuum ◽

Ultra High Vacuum ◽

High Rate ◽

Flash Evaporation ◽

Optimum Load ◽

Single Crystal Films ◽

Crystal Films ◽

A Current

Palladium single-crystal films have been prepared by Matthews in ultra-high vacuum by evaporation onto (001) NaCl substrates cleaved in-situ, and maintained at ∼ 350° C. Murr has also produced large-grained and single-crystal Pd films by high-rate evaporation onto (001) NaCl air-cleaved substrates at 350°C. In the present work, very large (∼ 3cm2), continuous single-crystal films of Pd have been prepared by flash evaporation onto air-cleaved (001) NaCl substrates at temperatures at or below 250°C. Evaporation rates estimated to be ≧ 2000 Å/sec, were obtained by effectively short-circuiting 1 mil tungsten evaporation boats in a self-regulating system which maintained an optimum load current of approximately 90 amperes; corresponding to a current density through the boat of ∼ 4 × 104 amperes/cm2.

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Studies of Oxide Formation on Copper Thin Films by Electron Microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100079103 ◽

1977 ◽

Vol 35 ◽

pp. 316-317

Author(s):

G. G. Hembree ◽

M. A. Otooni ◽

J. M. Cowley

Keyword(s):

Electron Microscopy ◽

Electron Diffraction ◽

Single Crystal ◽

Crystal Surface ◽

Crystal Defects ◽

Diffraction Reflection ◽

Reaction Products ◽

Intermediate Energies ◽

Crystal Films ◽

Reflection Electron Microscopy

The formation of oxide structures on single crystal films of metals has been investigated using the REMEDIE system (for Reflection Electron Microscopy and Electron Diffraction at Intermediate Energies) (1). Using this instrument scanning images can be obtained with a 5 to 15keV incident electron beam by collecting either secondary or diffracted electrons from the crystal surface (2). It is particularly suited to studies of the present sort where the surface reactions are strongly related to surface morphology and crystal defects and the growth of reaction products is inhomogeneous and not adequately described in terms of a single parameter. Observation of the samples has also been made by reflection electron diffraction, reflection electron microscopy and replication techniques in a JEM-100B electron microscope.A thin single crystal film of copper, epitaxially grown on NaCl of (100) orientation, was repositioned on a large copper single crystal of (111) orientation.

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Temperature Dependence of Magnetic Domains and Wall Structures

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010009573x ◽

1972 ◽

Vol 30 ◽

pp. 496-497

Author(s):

Sonoko Tsukahara ◽

Tadami Taoka ◽

Hisao Nishizawa

Keyword(s):

Temperature Dependence ◽

Domain Walls ◽

Magnetic Domain ◽

Iron Film ◽

Objective Lens ◽

Lorentz Microscopy ◽

Domain Structures ◽

Wall Structures ◽

Crystal Films ◽

Metallurgical Structure

The high voltage Lorentz microscopy was successfully used to observe changes with temperature; of domain structures and metallurgical structures in an iron film set on the hot stage combined with a goniometer. The microscope used was the JEM-1000 EM which was operated with the objective lens current cut off to eliminate the magnetic field in the specimen position. Single crystal films with an (001) plane were prepared by the epitaxial growth of evaporated iron on a cleaved (001) plane of a rocksalt substrate. They had a uniform thickness from 1000 to 7000 Å.The figure shows the temperature dependence of magnetic domain structure with its corresponding deflection pattern and metallurgical structure observed in a 4500 Å iron film. In general, with increase of temperature, the straight domain walls decrease in their width (at 400°C), curve in an iregular shape (600°C) and then vanish (790°C). The ripple structures with cross-tie walls are observed below the Curie temperature.

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Precipitation in Al + 4% Cu Epitaxial Films

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100101670 ◽

1968 ◽

Vol 26 ◽

pp. 384-385

Author(s):

S. Herd ◽

S. M. Mader

Keyword(s):

Solid Solution ◽

Bulk Material ◽

Epitaxial Films ◽

Detectable Change ◽

Cu Films ◽

Solution Treated ◽

Single Crystal Films ◽

Crystal Films ◽

Diffraction Patterns ◽

Deposited Films

Single crystal films in (001) orientation, about 1500 Å thick, were produced by R-F sputtering of Al + 4 wt % Cu onto cleaved KCl at 150°C substrate temperature. The as-deposited films contained numerous θ-CuAl2 particles (C16 structure) about 0.1μ in size. They were transferred onto Mo screens, solution treated and rapidly cooled (within about ½ min) so as to retain a homogeneous solid solution. Subsequently, the films were aged in vacuum at various temperatures in order to induce precipitation and to compare structures and morphologies of precipitate particles in Al-Cu films with those found in age hardened bulk material.Aging for 3 weeks at 60°C or 48 hrs at 100°C did not produce any detectable change in high resolution micrographs or diffraction patterns. In this range Guinier-Preston zones (GP) form in quenched bulk material. The absence of GP in the present experiments in this aging range is perhaps due to the cooling rate employed, which might be more equivalent to an aged and reverted bulk material than to a quenched one.

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Bright-Field Images (Ctem) of Phase Objects at High Resolution

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100092414 ◽

1976 ◽

Vol 34 ◽

pp. 490-491 ◽

Cited By ~ 1

Author(s):

Sumio Iijima

Keyword(s):

High Resolution ◽

Electron Beam Irradiation ◽

Fine Particles ◽

High Resolution Electron Microscopy ◽

Good Test ◽

Resolution Electron ◽

Single Crystal Films ◽

Crystal Films ◽

By Products ◽

Test Objects

We have developed a technique to prepare thin single crystal films of graphite for use as supporting films for high resolution electron microscopy. As we showed elsewhere (1), these films are completely noiseless and therefore can be used in the observation of phase objects by CTEM, such as single atoms or molecules as a means for overcoming the difficulties because of the background noise which appears with amorphous carbon supporting films, even though they are prepared so as to be less than 20Å thick. Since the graphite films are thinned by reaction with WO3 crystals under electron beam irradiation in the microscope, some small crystallites of WC or WC2 are inevitably left on the films as by-products. These particles are usually found to be over 10-20Å diameter but very fine particles are also formed on the film and these can serve as good test objects for studying the image formation of phase objects.

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Attractive mode force microscopy of chiral liquid crystal surfaces

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100121740 ◽

1992 ◽

Vol 50 (1) ◽

pp. 268-269

Author(s):

B.D. Terris ◽

R. J. Twieg ◽

C. Nguyen ◽

G. Sigaud ◽

H. T. Nguyen

Keyword(s):

Liquid Crystal ◽

Crystal Surfaces ◽

Free Surfaces ◽

Control Range ◽

Force Microscopy ◽

Liquid Crystal Films ◽

Chiral Liquid Crystal ◽

Crystal Films ◽

Electrostatic Charging ◽

And Shifts

We have used a force microscope in the attractive, or noncontact, mode to image a variety of surfaces. In this mode, the microscope tip is oscillated near its resonant frequency and shifts in this frequency due to changes in the surface-tip force gradient are detected. We have used this technique in a variety of applications to polymers, including electrostatic charging, phase separation of ionomer surfaces, and crazing of glassy films.Most recently, we have applied the force microscope to imaging the free surfaces of chiral liquid crystal films. The compounds used (Table 1) have been chosen for their polymorphic variety of fluid mesophases, all of which exist within the temperature control range of our force microscope.

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