Uncertainty evaluation in Atomic Force Microscopy measurement of nanoparticles based on statistical mixed model in a Bayesian framework

Author(s):  
J Petry ◽  
Bert De Boeck ◽  
Noham Sebaihi ◽  
Mieke Coenegrachts ◽  
Thierry Caebergs ◽  
...  
Langmuir ◽  
2008 ◽  
Vol 24 (9) ◽  
pp. 4944-4951 ◽  
Author(s):  
Loredana S. Dorobantu ◽  
Subir Bhattacharjee ◽  
Julia M. Foght ◽  
Murray R. Gray

2010 ◽  
Vol 35 (24) ◽  
pp. 4193 ◽  
Author(s):  
Banyat Lekprasert ◽  
Victoria Sedman ◽  
Clive J. Roberts ◽  
Saul J. B. Tedler ◽  
Ioan Notingher

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