scholarly journals Influence of ions on two-dimensional and three-dimensional atomic force microscopy at fluorite–water interfaces

2017 ◽  
Vol 28 (24) ◽  
pp. 245701 ◽  
Author(s):  
K Miyazawa ◽  
M Watkins ◽  
A L Shluger ◽  
T Fukuma
2006 ◽  
Vol 39 (1) ◽  
pp. 53-56 ◽  
Author(s):  
Y. L. Geng ◽  
D. Xu ◽  
X. Q. Wang ◽  
X. Q. Hou ◽  
W. F. Guo ◽  
...  

The growth mechanism and defect formation of the {110} faces of manganese mercury thiocyanate crystals were investigated by atomic force microscopy. A dislocation-controlled mechanism and a two-dimensional nucleation mechanism operate simultaneously during growth. Previous observations showed that two-dimensional nuclei appeared at interstep terraces of spiral hillocks. In this work, it is found for the first time that layers of two-dimensional islands cover up the outcrops of screw dislocations. The spiral hillocks grow fast along the 〈114〉 directions, which is probably due to the small interplanar distances of the {114} faces. Two-dimensional islands often appear as pairs of islands of nearly the same size, at the larger step terraces. Crystallization of the liquid inclusions occurs during the separation of the sample from the mother solution. Small three-dimensional islands, in high density, induce extra stress, which subsequently generates after-growth dislocations.


1995 ◽  
Vol 391 ◽  
Author(s):  
George O. Ramseyer ◽  
Joseph V. Beasock ◽  
Herbert F. Helbig ◽  
Lois H. Walsh

AbstractThe volumes of slit, edge, erosion and erosion/slit voids in stressed and electromigrated aluminum conductor lines were quantitatively determined with low resolution standard and high resolution enhanced tips by atomic force microscopy. These three-dimensional results were compared to semiquantitative determinations of void volumes extrapolated from two-dimensional backscattered scanning electron microscopy area determinations of the passivated aluminum conductor. After the passivation was removed by plasma etching, void volumes were also determined from two-dimensional scanning electron microscopy micrographs. The volumes of the nearest hillocks on the anodic side of the voids were quantitatively determined by atomic force microscopy, and these hillock volumes were determined to be independent of the respective void volumes.


2021 ◽  
Vol 129 (3) ◽  
pp. 030901
Author(s):  
Hossein J. Sharahi ◽  
Mohsen Janmaleki ◽  
Laurene Tetard ◽  
Seonghwan Kim ◽  
Hamed Sadeghian ◽  
...  

Author(s):  
Shunyu Chang ◽  
Yanquan Geng ◽  
Yongda Yan

AbstractAs one of the most widely used nanofabrication methods, the atomic force microscopy (AFM) tip-based nanomachining technique offers important advantages, including nanoscale manipulation accuracy, low maintenance cost, and flexible experimental operation. This technique has been applied to one-, two-, and even three-dimensional nanomachining patterns on thin films made of polymers, metals, and two-dimensional materials. These structures are widely used in the fields of nanooptics, nanoelectronics, data storage, super lubrication, and so forth. Moreover, they are believed to have a wide application in other fields, and their possible industrialization may be realized in the future. In this work, the current state of the research into the use of the AFM tip-based nanomachining method in thin-film machining is presented. First, the state of the structures machined on thin films is reviewed according to the type of thin-film materials (i.e., polymers, metals, and two-dimensional materials). Second, the related applications of tip-based nanomachining to film machining are presented. Finally, the current situation of this area and its potential development direction are discussed. This review is expected to enrich the understanding of the research status of the use of the tip-based nanomachining method in thin-film machining and ultimately broaden its application.


2018 ◽  
Vol 421 ◽  
pp. 134
Author(s):  
Hang Zhang ◽  
Junxiang Huang ◽  
Yongwei Wang ◽  
Rui Liu ◽  
Xiulan Huai ◽  
...  

1996 ◽  
Vol 35 (Part 1, No. 12A) ◽  
pp. 6233-6238 ◽  
Author(s):  
Satomi Ohnishi ◽  
Masahiko Hara ◽  
Taiji Furuno ◽  
Hiroyuki Sasabe

2004 ◽  
Vol 11 (01) ◽  
pp. 71-75
Author(s):  
Y. L. GENG ◽  
D. XU ◽  
D. L. SUN ◽  
X. Q. WANG ◽  
G. H. ZHANG ◽  
...  

Growth hillocks on the {100} faces of L-arginine phosphate monohydrate (LAP) single crystals grown at 25°C and at a supersaturation of 0.32 have been discussed. The typical dislocation growth hillocks are lopsided and elongate along the b direction. The dislocation sources are probably caused by the extra stress field which is introduced by the hollow cavities distributing on the steps and hillocks generated by the two-dimensional nucleus. The elongated shape is due to the characteristic structure of the LAP crystal. Apart from that, the formation of the lopsided growth hillocks is explained by the liquid flow theory.


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