Uncertainty in the mutual calibration method for the traceable thickness measurement of ultra-thin oxide films

10.1088/1681-7575/abe8c2 ◽

2021 ◽

Vol 58 (3) ◽

pp. 034002

Author(s):

Seung Mi Lee ◽

Jin Chun Woo ◽

Tae Gun Kim ◽

Kyung Joong Kim

Keyword(s):

Oxide Films ◽

Calibration Method ◽

Thickness Measurement ◽

Thin Oxide Films ◽

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Surface Potential Control on Thin Oxide Films with Respect to Electron Stimulated Desorption Studies

Journal de Physique III ◽

10.1051/jp3:1995200 ◽

1995 ◽

Vol 5 (9) ◽

pp. 1407-1424 ◽

Author(s):

Marc Bernheim ◽

Gilles Rousse

Keyword(s):

Surface Potential ◽

Oxide Films ◽

Potential Control ◽

Thin Oxide Films ◽

Electron Stimulated Desorption

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Electron currents in thin oxide films on aluminium

Vacuum ◽

10.1016/0042-207x(53)90450-3 ◽

1953 ◽

Vol 3 (4) ◽

pp. 449

Keyword(s):

Oxide Films ◽

Thin Oxide Films ◽

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X-Ray Diffraction of Thin Oxide Films on Soldered Module Pins

Advances in X-Ray Analysis ◽

10.1007/978-1-4757-9110-5_39 ◽

1989 ◽

pp. 303-310

Author(s):

T. Paul Adl ◽

H. F. Stehmeyer

Keyword(s):

Oxide Films ◽

X Ray Diffraction ◽

X Ray ◽

Thin Oxide Films ◽

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Atomic Force Microscopy Study of Grain Evolution during Growth of Thin Oxide Films

Materials Science Forum ◽

10.4028/www.scientific.net/msf.204-206.729 ◽

1996 ◽

Vol 204-206 ◽

pp. 729-734

Author(s):

Frank Czerwinski ◽

Jerzy A. Szpunar

Keyword(s):

Atomic Force Microscopy ◽

Oxide Films ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Thin Oxide Films ◽

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Formation of Very Thin Oxide Films on Metals: Contact Potential Measurements during the Oxidation of (100) Cu

The Journal of Chemical Physics ◽

10.1063/1.1674530 ◽

1970 ◽

Vol 53 (9) ◽

pp. 3544-3548 ◽

Author(s):

Joseph E. Boggio

Keyword(s):

Oxide Films ◽

Contact Potential ◽

Thin Oxide Films ◽

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Conductance measurement of thin oxide films on a platinum anode

Electrochimica Acta ◽

10.1016/0013-4686(77)85032-9 ◽

1977 ◽

Vol 22 (2) ◽

pp. 175-179 ◽

Author(s):

S. Shibata

Keyword(s):

Oxide Films ◽

Conductance Measurement ◽

Platinum Anode ◽

Thin Oxide Films ◽

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Cover Picture: Photoinduced Formation of Wrinkled Microstructures with Long-Range Order in Thin Oxide Films (Adv. Mater. 24/2007)

Advanced Materials ◽

10.1002/adma.200790097 ◽

2007 ◽

Vol 19 (24) ◽

pp. NA-NA

Author(s):

M. Takahashi ◽

T. Maeda ◽

K. Uemura ◽

J. Yao ◽

Y. Tokuda ◽

...

Keyword(s):

Oxide Films ◽

Range Order ◽

Long Range Order ◽

Thin Oxide Films ◽

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Study of Thin Oxide Films with NC-AFM: Atomically Resolved Imaging and Beyond

Noncontact Atomic Force Microscopy - NanoScience and Technology ◽

10.1007/978-3-642-01495-6_7 ◽

2009 ◽

pp. 143-167

Author(s):

M. Heyde ◽

G. H. Simon ◽

T. König

Keyword(s):

Oxide Films ◽

Thin Oxide Films ◽

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ChemInform Abstract: An Investigation of Thin Oxide Films Thermally Grown in situ on Fe-24 Cr and Fe- 24 Cr-ll Mo by Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy.

Chemischer Informationsdienst ◽

10.1002/chin.198642031 ◽

1986 ◽

Vol 17 (42) ◽

Author(s):

H. J. MATHIEU ◽

D. LANDOLT

Keyword(s):

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Oxide Films ◽

X Ray ◽

Thin Oxide Films ◽

Thermally Grown

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MOLECULAR DESIGN OF POLYMERS FOR LASER STRUCTURING AND THIN OXIDE FILMS BY PULSED LASER DEPOSITION AS MODEL SYSTEM FOR ELECTROCHEMICAL APPLICATIONS

NATO Science Series - Photon-based Nanoscience and Nanobiotechnology ◽

10.1007/978-1-4020-5523-2_11 ◽

2007 ◽

pp. 267-306 ◽

Author(s):

THOMAS LIPPERT

Keyword(s):

Pulsed Laser Deposition ◽

Molecular Design ◽

Oxide Films ◽

Pulsed Laser ◽

Model System ◽

Laser Deposition ◽

Electrochemical Applications ◽

Laser Structuring ◽

Thin Oxide Films ◽

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