scholarly journals Surface Topography of Nitrided Steel Surfaces

2019 ◽  
Vol 1183 ◽  
pp. 012005
Author(s):  
Johan Berglund ◽  
Eva Troell
Keyword(s):  
Surface Topography ◽  
Nitrided Steel ◽  
Steel Surfaces

3D Topography Analysis of Ball-End Milled H-13 Die Steel Surfaces Using Wavelet Decomposition Method

2016 ◽  
Vol 693 ◽  
pp. 689-696
Author(s):  
Shuai Liu ◽  
Jun Zhao ◽  
Xian Hua Tian ◽  
Wen Zhen Qin
Keyword(s):  
Surface Topography ◽  
Frequency Band ◽  
High Frequency ◽  
Decomposition Method ◽  
Wavelet Decomposition ◽  
Great Influence ◽  
Median Frequency ◽  
Die Steel ◽  
Changing Trend ◽  
Steel Surfaces

Optical profiler is employed to measure the surface topography of H-13 die steel machined by ball end cutter. By using 2D discret wavelet decomposition, the topographies of different frequency bands are obtained and the influence of cutter posture on varying frequncy bands topography is studied. The results show that cutter posture has a great influence on the whole frequency band roughness. The changing trend of roughness is roughly the same under different cutter postures which increase firstly then decrease with the decrease in frequency. A surface with a small high frequency roughness may have a large median frequency roughness.

scholarly journals Surface topography analysis of ball end milled tool steel surfaces

Procedia CIRP ◽  
2020 ◽  
Vol 87 ◽  
pp. 153-158
Author(s):  
Francesco Biondani ◽  
Giuliano Bissacco ◽  
Hans Nørgaard Hansen
Keyword(s):  
Surface Topography ◽  
Tool Steel ◽  
Steel Surfaces ◽  
Topography Analysis

Conversion electron mössbauer spectra of heated ion nitrided steel surfaces

1981 ◽  
Vol 16 (6) ◽  
pp. 1712-1713
Author(s):  
Michihiko Inaba ◽  
Hidemoto Nakagawa ◽  
Yusuke Ujihira
Keyword(s):  
Conversion Electron ◽  
Mössbauer Spectra ◽  
Mossbauer Spectra ◽  
Nitrided Steel ◽  
Steel Surfaces

Conversion electron mössbauer spectra of heated ion nitrided steel surfaces

1981 ◽  
Vol 16 (6) ◽  
pp. 1712-1713 ◽  
Author(s):  
Michihiko Inaba ◽  
Hidemoto Nakagawa ◽  
Yusuke Ujihira
Keyword(s):  
Conversion Electron ◽  
Mössbauer Spectra ◽  
Mossbauer Spectra ◽  
Nitrided Steel ◽  
Steel Surfaces

Measurement of surface topography and area-specific nanohardness in the scanning force microscope

1995 ◽  
Vol 10 (10) ◽  
pp. 2503-2506 ◽  
Author(s):  
D. Scholl ◽  
M.P. Everson ◽  
R.C. Jaklevic
Keyword(s):  
Surface Roughness ◽  
Surface Topography ◽  
Lower Limit ◽  
Cross Section ◽  
Steel Surface ◽  
Scanning Force Microscope ◽  
Surface Features ◽  
Nitrided Steel ◽  
Scanning Force

A Scanning Force Microscope (SFM) is employed to indent and image surfaces with sub-micron resolution. The SFM image shows the area and depth of each indentation as well as its location with respect to nearby topographic surface features. The image also reveals the surface roughness, which can set a lower limit on useful nanoindentation size. A cross section of a nitrided steel surface is measured to illustrate the method. The use of the SFM with separate tip-cantilever structures for indenting and imaging has significant advantages over other nanohardness methods for the study of samples with lateral inhomogeneities.

On the surface topography of ultrashort laser pulse treated steel surfaces

2011 ◽  
Vol 258 (4) ◽  
pp. 1555-1560 ◽  
Author(s):  
J. Vincenc Obona ◽  
V. Ocelík ◽  
J.Z.P. Skolski ◽  
V.S. Mitko ◽  
G.R.B.E. Römer ◽  
...  
Keyword(s):  
Laser Pulse ◽  
Surface Topography ◽  
Ultrashort Laser Pulse ◽  
Treated Steel ◽  
Steel Surfaces ◽  
Ultrashort Laser

The Broad Applications of the Scanning Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 20-21
Author(s):  
C. T. Nightingale ◽  
S. E. Summers ◽  
T. P. Turnbull
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Microscopy ◽  
Surface Topography ◽  
Great Depth ◽  
Resolving Power ◽  
Depth Of Field ◽  
Pictorial Representations ◽  
Scanning Electron

The ease of operation of the scanning electron microscope has insured its wide application in medicine and industry. The micrographs are pictorial representations of surface topography obtained directly from the specimen. The need to replicate is eliminated. The great depth of field and the high resolving power provide far more information than light microscopy.

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