scholarly journals Transmission spectra of transparent electrodes based on oriented platinum nanowires at various concentrations of the metal used

2021 ◽  
Vol 2086 (1) ◽  
pp. 012029
Author(s):  
G R Nizameeva ◽  
I R Nizameev ◽  
M K Kadirov
Keyword(s):  
Optical Radiation ◽  
Metal Layer ◽  
Chemical Deposition ◽  
Optical Transparency ◽  
Transmission Spectra ◽  
Entire Region ◽  
Platinum Nanowires ◽  
Force Microscopy ◽  
Atomic Force ◽  
Deposited Metal

Abstract The paper investigates the optical transparency dependence of a coating based on an oriented network of platinum nanowires on the amount of metal used. Oriented platinum nanowires on a glass surface are produced by chemical deposition from an aqueous hexachloroplatinic acid solution. The topography of the deposited metal layer on glass is visualized using atomic force microscopy. Optical transparency was investigated with a spectrophotometer. In almost the entire region of optical radiation, the transparency is approximately 98%. The absorption spectrum shows that the absorption coefficient increases sharply in the near UV region.

scholarly journals Subsurface imaging of flexible circuits via contact resonance atomic force microscopy

2019 ◽  
Vol 10 ◽  
pp. 1636-1647 ◽  
Author(s):  
Wenting Wang ◽  
Chengfu Ma ◽  
Yuhang Chen ◽  
Lei Zheng ◽  
Huarong Liu ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Theoretical Calculations ◽  
Contact Stiffness ◽  
Metal Layer ◽  
Experimental Results ◽  
Subsurface Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Cover Thickness ◽  
Contact Resonance

Subsurface imaging of Au circuit structures embedded in poly(methyl methacrylate) (PMMA) thin films with a cover thickness ranging from 52 to 653 nm was carried out by using contact resonance atomic force microscopy (CR-AFM). The mechanical difference of the embedded metal layer leads to an obvious CR-AFM frequency shift and therefore its unambiguous differentiation from the polymer matrix. The contact stiffness contrast, determined from the tracked frequency images, was employed for quantitative evaluation. The influence of various parameter settings and sample properties was systematically investigated by combining experimental results with theoretical analysis from finite element simulations. The results show that imaging with a softer cantilever and a lower eigenmode will improve the subsurface contrast. The experimental results and theoretical calculations provide a guide to optimizing parameter settings for the nondestructive diagnosis of flexible circuits. Defect detection of the embedded circuit pattern was also carried out, which indicates the capability of imaging tiny subsurface structures smaller than 100 nm by using CR-AFM.

scholarly journals Characterization of thin films containing zirconium, oxygen, and sulfur by scanning electron and atomic force microscopy

1999 ◽  
Vol 14 (9) ◽  
pp. 3725-3733 ◽  
Author(s):  
A. Fischer ◽  
F. C. Jentoft ◽  
G. Weinberg ◽  
R. Schlögl ◽  
T. P. Niesen ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Sulfonic Acid ◽  
Homogeneous Nucleation ◽  
Chemical Deposition ◽  
Self Assembled Monolayers ◽  
Force Microscopy ◽  
Atomic Force ◽  
Assembled Monolayers ◽  
Scanning Electron

Oxidic zirconium films prepared by chemical deposition from aqueous medium on sulfonic acid terminated self-assembled monolayers attached to an oxidized silicon surface were investigated with scanning electron microscopy and atomic force microscopy. Bulk precipitate forms in the 4 mM Zr(SO4)2 · 4H2O, 0.4 N HCl deposition medium at 343 K after approximately 30 min. Precipitate particles (200 nm and larger) were found embedded in the oxidic zirconium film and adsorbed on top of the film; they could be washed off, but patches of the film were removed. Working with unstable deposition solutions, in which homogeneous nucleation occurs, leads to preparation-inherent flaws in the film.

scholarly journals Stokes-polarimetry of ultrathin Au and Sn island films

2018 ◽  
pp. 122-129
Author(s):  
A. Yampolskiy ◽  
O. Makarenko ◽  
V. Lendel ◽  
V. Prorok ◽  
A. Sharapa ◽  
...  
Keyword(s):  
Metal Layer ◽  
Resistivity Measurement ◽  
Morphological Structure ◽  
Optical Methods ◽  
Polarization Degree ◽  
Force Microscopy ◽  
Additional Information ◽  
Atomic Force ◽  
Stokes Polarimetry ◽  
Radiation Incidence

The optical properties of ultrathin Au and Sn islet films, obtained by the methods of magnetron sputtering and thermal evaporation, respectively, are considered in this paper. By measuring the Stokes vector of the beam reflected from the samples, polarized and depolarized radiation components were separated. The conditions of the polarization degree dependence on the surface structure for a series of islet films with different morphologies are analyzed. To determine the morphological structure of the metal layer, methods of atomic force microscopy and resistivity measurement were also employed. The parameters of discontinuous film, obtained by optical and non-optical methods, are compared. It is established that with an increase in the angle of radiation incidence onto the samples, the polarization degree of the reflected beam decreases. Such behavior can be explained by the Mie theory of light scattering by particles. The magnitude of depolarizing action of the samples also depends on the morphology of their surface, correlating with the number of inequalities on it. The applied method of Stokes polarimetry, thus, allows one to obtain additional information on the structure of the surface, which is its advantage.

Properties of Metal / Polyphenylquinoxaline Interfaces

1994 ◽  
Vol 337 ◽  
Author(s):  
L. Bellard ◽  
J.M. Themlin ◽  
F. Palmino ◽  
A. Cros
Keyword(s):  
Metal Layer ◽  
High Vacuum ◽  
Polymer Surface ◽  
Pure Metal ◽  
Ultra High Vacuum ◽  
Ex Situ ◽  
Layer By Layer ◽  
Force Microscopy ◽  
Atomic Force

ABSTRACTWe have investigated the microscopic properties of copper and chromium layers deposited on polyphenylquinoxaline (PPQ). PPQ is a thermostable polymer used for multichip module applications. The metal is deposited under ultra-high vacuum conditions and analysed in-situ by X-ray photoemission (XPS) and atomic force microscopy (ex situ). Copper does not react significantly with the PPQ and tends to diffuse into the polymer matrix upon annealing. On the contrary, chromium strongly reacts with the polymer surface at room temperature. With increasing metal coverage, chromium grows in a layer-by-layer mode and the reacted interface is progressively burried under the pure metal layer.

Metal – polymer interfaces and their effect on the glass transition of thin polystyrene films

2003 ◽  
Vol 790 ◽  
Author(s):  
J.S. Sharp ◽  
J.A. Forrest
Keyword(s):  
Glass Transition ◽  
Metal Layer ◽  
Interfacial Structure ◽  
Polymer Interfaces ◽  
Force Microscopy ◽  
Atomic Force ◽  
Polymer Metal ◽  
Sample Preparation Procedure ◽  
Metal Interfaces ◽  
Metal Polymer

ABSTRACTWe present a study of polystyrene-metal interfaces and discuss the relationship between the interfacial structure and anomalies in the measured glass transition temperature (Tg) of thin metal capped polystyrene (PS) films. The PS films used in these studies were coated with an evaporated metal layer of either Aluminum (Al) or gold (Au) and the Tg values were measured with ellipsometry. Uncoated PS films were also measured and these samples showed Tg values that were reduced relative to the bulk value for film thicknesses (h) less than 40 nm. Films coated with Au were shown to have measured Tg values that were the same as the bulk value (Tgbulk=370 K) for all the film thicknesses studied (h ≥ 8nm). The Al coated PS films had measured Tg values that were the same as the uncoated PS films. The observed differences are discussed in terms of the differences in the structure of the metal-polymer interfaces produced during thermal evaporation of the metal layers. A novel sample preparation procedure was developed to enable us to use Atomic Force Microscopy (AFM) to directly measure the structure of the buried polymer-metal interfaces. The measurements performed on these systems support the suggestion that the interfacial structure is different for the two metal-polymer interfaces studied and that these differences may be the cause of the anomalies in the measured Tgs of these samples.

scholarly journals Swelling of individual cellulose nanofibrils in water, role of crystallinity: an AFM study

Cellulose ◽  
2020 ◽  
Author(s):  
Vegar Ottesen ◽  
Kristin Syverud
Keyword(s):  
Atomic Force Microscopy ◽  
Cellulose Nanofibrils ◽  
Platinum Nanowires ◽  
Force Microscopy ◽  
Atomic Force ◽  
Water Swelling ◽  
Fibril Diameter

Abstract Atomic force microscopy (AFM) can be used to quantitatively study nanomaterials in different media, e.g. vacuum, air, or submerged in a liquid. A technique was developed to study swelling of individual cellulose nanofibrils (CNFs) using AFM. As a case study, CNFs with different degrees of crystallinity (DoC) were examined for swellability going from dry to wet (submerged in de-ionized water). Swelling was found to depend on DoC, but no significant correlation between fibril diameter and swellability was seen. Upon introduction of de-ionized water high DoC samples ($$65\pm 2\%$$ 65 ± 2 % ) were found to have a diameter increase of 34% on average, whereas low DoC ($$44\pm 2\%$$ 44 ± 2 % ) were found to have a diameter increase of 44% on average. A tested control, consisting of platinum nanowires on silisium, did not swell. Graphic abstract

Morphology and Magnetic Properties of Amorphous Со-P and Co-Ni-P Films

2015 ◽  
Vol 233-234 ◽  
pp. 686-689 ◽  
Author(s):  
Anatoly V. Chzhan ◽  
V.A. Seredkin ◽  
Gennady S. Patrin ◽  
Vladimir N. Zabluda ◽  
Yan V. Zubavichus ◽  
...  
Keyword(s):  
Magnetic Properties ◽  
Kerr Effect ◽  
Chemical Deposition ◽  
Atomic Force Microscopy Analysis ◽  
Saturation Field ◽  
Force Microscopy ◽  
Atomic Force ◽  
Phosphorous Content ◽  
Microscopy Analysis ◽  
Polar Kerr Effect

Amorphous Со-Р and Co-Ni-P films fabricated by chemical deposition under the same conditions are investigated. It is demonstrated that the phosphorous content in the Co-Ni-P exceeds that in the Со-Р films by 1.5−2%. The atomic force microscopy analysis of the surface morphology shows that incorporation of Ni atoms in the Со−Р alloy leads to coarsening of grains due to the higher rate of deposition of Ni atoms as compared with the rate of deposition of Со atoms. The reduction of the dispersion of the polar Kerr effect saturation field in the Со-Ni-P films is attributed to ordering of Сo-Ni atomic pairs.

scholarly journals Preparation of Thin Metal Layers on Polymers

10.14311/904 ◽  
2007 ◽  
Vol 47 (1) ◽  
Author(s):  
J. Siegel ◽  
V. Kotál
Keyword(s):  
Electrical Resistance ◽  
Ageing Time ◽  
Metal Layer ◽  
Polymer Surface ◽  
Vacuum Deposition ◽  
Force Microscopy ◽  
Atomic Force ◽  
Surface Profiles ◽  
Metal Layers ◽  
Vacuum Deposition Method

Continuous gold layers of increasing thickness were prepared by the vacuum deposition method on pristine and plasma modified sheets of  PE, PET and PTFE. Various surface profiles were obtained. The surface morphology was studied using atomic force microscopy (AFM). The continuity of the metal layer on the polymer surface was validated by measuring its electrical resistance. Changes in the wettability of the plasma treated polymers were evaluated by measuring the aging curves. These were obtained as the dependence of contact angle on ageing time. 

Surface Deformation of Metal Films Under Controlled Pressure for Generating Ultra-flat Metal Surfaces

2007 ◽  
Vol 990 ◽  
Author(s):  
Logeeswaran Vj ◽  
Mei-Lin Chan ◽  
M.Saif Islam ◽  
David A. Horsley ◽  
Wei Wu ◽  
...  
Keyword(s):  
Thin Film ◽  
Metal Film ◽  
Surface Deformation ◽  
Applied Pressure ◽  
Force Sensor ◽  
Metal Films ◽  
Optical Metamaterials ◽  
Force Microscopy ◽  
Atomic Force ◽  
Deposited Metal

ABSTRACTWe present a technique to generate ultra-smooth surfaces and direct pattern imprinting on thin metal films by flattening the bumps and spikes of a freshly vacuum deposited metal film. The technique was implemented by using a small footprint mechanical imprint press that has the capability to vary the applied pressure from 100MPa to 600MPa. The mechanical press was incorporated with a tactile force sensor that enabled direct monitoring of the applied pressure. We demonstrated the feasibility of the technique on an e-beam evaporated silver (Ag) metal film with thickness ranging from 150Å (optically thin) to 1000Å (optically thick). The film was deposited on double-polished (100)-oriented silicon surface and double-polished borosilicate glass, resulting in a varying degree of film smoothness. The surface morphology of the pressed thin film was then studied using atomic force microscopy and SEM. Our demonstration with the e-beam evaporated silver thin film exhibits the potential for applications in decreasing the scattering-induced losses in optical metamaterials, plasmonic nanodevices and electrical shorts in molecular-scale electronic devices.

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