The optical properties of ultrathin Au and Sn islet films, obtained by the methods of magnetron sputtering and thermal evaporation, respectively, are considered in this paper. By measuring the Stokes vector of the beam reflected from the samples, polarized and depolarized radiation components were separated. The conditions of the polarization degree dependence on the surface structure for a series of islet films with different morphologies are analyzed. To determine the morphological structure of the metal layer, methods of atomic force microscopy and resistivity measurement were also employed. The parameters of discontinuous film, obtained by optical and non-optical methods, are compared. It is established that with an increase in the angle of radiation incidence onto the samples, the polarization degree of the reflected beam decreases. Such behavior can be explained by the Mie theory of light scattering by particles. The magnitude of depolarizing action of the samples also depends on the morphology of their surface, correlating with the number of inequalities on it. The applied method of Stokes polarimetry, thus, allows one to obtain additional information on the structure of the surface, which is its advantage.