Characterization of magnetic Czochralski silicon devices with aluminium oxide field insulator: effect of oxygen precursor on electrical properties and radiation hardness
Keyword(s):
1990 ◽
Vol 55
(12)
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pp. 2933-2939
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Keyword(s):
2005 ◽
Vol 20
(5)
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pp. 464-468
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Keyword(s):
2012 ◽
Vol 717-720
◽
pp. 641-644