Three-dimensional energy profile measurement of a molecular ion beam by coincidence momentum imaging compared to a retarding field analyzer

2010 ◽  
Vol 5 (10) ◽  
pp. P10006-P10006
Author(s):  
W Wolff ◽  
J McKenna ◽  
R Vácha ◽  
M Zohrabi ◽  
B Gaire ◽  
...  
Keyword(s):  
Ion Beam ◽  
Three Dimensional ◽  
Profile Measurement ◽  
Energy Profile ◽  
Molecular Ion ◽  
Momentum Imaging

Nanoscale Self-Assembly Using Ion and Electron Beam Techniques: A Rapid Review

MRS Advances ◽  
2020 ◽  
Vol 5 (64) ◽  
pp. 3507-3520
Author(s):  
Chunhui Dai ◽  
Kriti Agarwal ◽  
Jeong-Hyun Cho
Keyword(s):  
Electron Beam ◽  
Self Assembly ◽  
Ion Beam ◽  
Three Dimensional ◽  
The Self ◽  
Stress Generation ◽  
Rapid Review ◽  
High Yield ◽  
3D Nanostructures ◽  
Self Assembled

AbstractNanoscale self-assembly, as a technique to transform two-dimensional (2D) planar patterns into three-dimensional (3D) nanoscale architectures, has achieved tremendous success in the past decade. However, an assembly process at nanoscale is easily affected by small unavoidable variations in sample conditions and reaction environment, resulting in a low yield. Recently, in-situ monitored self-assembly based on ion and electron irradiation has stood out as a promising candidate to overcome this limitation. The usage of ion and electron beam allows stress generation and real-time observation simultaneously, which significantly enhances the controllability of self-assembly. This enables the realization of various complex 3D nanostructures with a high yield. The additional dimension of the self-assembled 3D nanostructures opens the possibility to explore novel properties that cannot be demonstrated in 2D planar patterns. Here, we present a rapid review on the recent achievements and challenges in nanoscale self-assembly using electron and ion beam techniques, followed by a discussion of the novel optical properties achieved in the self-assembled 3D nanostructures.

3D Observation of Elemental Distribution of Si-Device using a Dedicated FIB/STEM System

2005 ◽  
Author(s):  
T. Yaguchi ◽  
M. Konno ◽  
T. Kamino ◽  
M. Ogasawara ◽  
K. Kaji ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Three Dimensional ◽  
Elemental Distribution ◽  
Multivariate Statistical ◽  
X Ray ◽  
Sample Rotation ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Elemental Maps

Abstract A technique for preparation of a pillar shaped sample and its multi-directional observation of the sample using a focused ion beam (FIB) / scanning transmission electron microscopy (STEM) system has been developed. The system employs an FIB/STEM compatible sample rotation holder with a specially designed rotation mechanism, which allows the sample to be rotated 360 degrees [1-3]. This technique was used for the three dimensional (3D) elemental mapping of a contact plug of a Si device in 90 nm technology. A specimen containing a contact plug was shaped to a pillar sample with a cross section of 200 nm x 200 nm and a 5 um length. Elemental analysis was performed with a 200 kV HD-2300 STEM equipped with the EDAX genesis Energy dispersive X-ray spectroscopy (EDX) system. Spectrum imaging combined with multivariate statistical analysis (MSA) [4, 5] was used to enhance the weak X-ray signals of the doped area, which contain a low concentration of As-K. The distributions of elements, especially the dopant As, were successfully enhanced by MSA. The elemental maps were .. reconstructed from the maps.

scholarly journals Investigation of the selective color-changing mechanism of Dynastes tityus beetle (Coleoptera: Scarabaeidae)

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Jiyu Sun ◽  
Wei Wu ◽  
Limei Tian ◽  
Wei Li ◽  
Fang Zhang ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Color Change ◽  
Incidence Angle ◽  
Ion Beam ◽  
Three Dimensional ◽  
Water Infiltration ◽  
Photonic Materials ◽  
Local Color ◽  
Water Contact ◽  
Color Changes

AbstractNot only does the Dynastes tityus beetle display a reversible color change controlled by differences in humidity, but also, the elytron scale can change color from yellow-green to deep-brown in specified shapes. The results obtained by focused ion beam-scanning electron microscopy (FIB-SEM), show that the epicuticle (EPI) is a permeable layer, and the exocuticle (EXO) is a three-dimensional photonic crystal. To investigate the mechanism of the reversible color change, experiments were conducted to determine the water contact angle, surface chemical composition, and optical reflectance, and the reflective spectrum was simulated. The water on the surface began to permeate into the elytron via the surface elemental composition and channels in the EPI. A structural unit (SU) in the EXO allows local color changes in varied shapes. The reflectance of both yellow-green and deep-brown elytra increases as the incidence angle increases from 0° to 60°. The microstructure and changes in the refractive index are the main factors that influence the process of reversible color change. According to the simulation, the lower reflectance causing the color change to deep-brown results from water infiltration, which increases light absorption. Meanwhile, the waxy layer has no effect on the reflection of light. This study lays the foundation to manufacture engineered photonic materials that undergo controllable changes in iridescent color.

scholarly journals Protocol for preparation of heterogeneous biological samples for 3D electron microscopy: a case study for insects

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Alexey A. Polilov ◽  
Anastasia A. Makarova ◽  
Song Pang ◽  
C. Shan Xu ◽  
Harald Hess
Keyword(s):  
Electron Microscopy ◽  
Biological Samples ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Three Dimensional ◽  
Entire Volume ◽  
Simple Protocol ◽  
3D Electron Microscopy ◽  
3D Em

AbstractModern morphological and structural studies are coming to a new level by incorporating the latest methods of three-dimensional electron microscopy (3D-EM). One of the key problems for the wide usage of these methods is posed by difficulties with sample preparation, since the methods work poorly with heterogeneous (consisting of tissues different in structure and in chemical composition) samples and require expensive equipment and usually much time. We have developed a simple protocol allows preparing heterogeneous biological samples suitable for 3D-EM in a laboratory that has a standard supply of equipment and reagents for electron microscopy. This protocol, combined with focused ion-beam scanning electron microscopy, makes it possible to study 3D ultrastructure of complex biological samples, e.g., whole insect heads, over their entire volume at the cellular and subcellular levels. The protocol provides new opportunities for many areas of study, including connectomics.

Harmonic Analysis on Low Quality Tidal Data

2014 ◽  
Author(s):  
Joost den Haan
Keyword(s):  
Harmonic Analysis ◽  
Three Dimensional ◽  
Measurement Data ◽  
Tidal Energy ◽  
Energy Yield ◽  
Profile Measurement ◽  
Current Profile ◽  
Tidal Power ◽  
Data Set ◽  
Tidal Forcing

The aim of the study is to devise a method to conservatively predict a tidal power generation based on relatively short current profile measurement data sets. Harmonic analysis on a low quality tidal current profile measurement data set only allowed for the reliable estimation of a limited number of constituents leading to a poor prediction of tidal energy yield. Two novel, but very different approaches were taken: firstly a quasi response function is formulated which combines the currents profiles into a single current. Secondly, a three dimensional vectorial tidal forcing model was developed aiming to support the harmonic analysis with upfront knowledge of the actual constituents. The response based approach allowed for a reasonable prediction. The vectorial tidal forcing model proved to be a viable start for a full featuring numerical model; even in its initial simplified form it could provide more insight than the conventional tidal potential models.

Solid and Hollow Micro and Nano Spherical Structures: in Polysilicon and Phosphosilicate Glass

1994 ◽  
Vol 372 ◽  
Author(s):  
M. M. Farooqui ◽  
A. G. R. Evans
Keyword(s):  
Ion Beam ◽  
Three Dimensional ◽  
Optical Components ◽  
Circular Symmetry ◽  
Spherical Structures ◽  
Phosphosilicate Glass ◽  
Micro Systems ◽  
Micro Structures ◽  
Microfabrication Techniques

Fabrication of three dimensional micro structures in silicon and silicon related materials is becoming increasingly important for the realisation of micro systems comprising of sensors, actuators, transducers and analytical assemblies. Fabrication of such devices so far has been mostly in form of structures defined by the crystal planes of silicon, or has involved sophisticated technologies such as ion beam machining, replication using LIGA, or micromachining techniques involving a sequence of alignment and etch stages using binary masks. Structures with circular symmetry are of great interest as micro optical components amongst others, and these are not easily amenable to microfabrication techniques commonly employed.

Study on the Surface Quality of Al2O3 Nano-Films by Ion Beam Sputtering Deposition

2011 ◽  
Vol 148-149 ◽  
pp. 54-57
Author(s):  
Xiao Ping Lin ◽  
Yun Dong ◽  
Lian Wei Yang
Keyword(s):  
Surface Quality ◽  
Ion Beam ◽  
Three Dimensional ◽  
Ion Beam Sputtering ◽  
Sputtering Deposition ◽  
Atomic Force ◽  
Beam Sputtering ◽  
Dimensional Growth ◽  
Different Thickness

The Al2O3 nano-films of different thicknesses (1~100nm) were successfully deposited on the monocrystalline Si surface by using ion beam sputtering deposition. The surface topography and the component of nano-films with different thickness were analyzed. The quality of the surface of nano-films was systematically studied. When the films’ thickness increase, the studies by atomic force microscope (AFM), X-ray photoelectron spectrum（XPS） show that the gathering grain continually grows up and transits from acerose cellula by two-dimensional growth to globularity by three-dimensional growth. The elements O, Al and Si were found on the surface of Al2O3 nano-films. With the thickness of the films increasing, the content of Al gradually increases and the intensity peak of Si wears off, the surface quality of the deposited films is ceaselessly improved

An Acoustic System for Pipeline Profile Measurement

1983 ◽  
Vol 105 (4) ◽  
pp. 475-479
Author(s):  
H. Van Calcar
Keyword(s):  
Measurement Technique ◽  
Measurement System ◽  
Performance Enhancement ◽  
Three Dimensional ◽  
Profile Measurement ◽  
Baseline Measurement ◽  
Acoustic System ◽  
Position Measurement ◽  
Long Baseline ◽  
Hardware Configuration

This paper presents an acoustic position measurement system used for precise three-dimensional flowline profile measurement. The system measures several points along the flowline using the long-baseline measurement technique and augments this measurement with depth telemetry repeaters to maintain elevation accuracy throughout the changing installation geometry. The paper discusses both the measurement system and the performance enhancement features. The paper concludes with a discussion of the hardware configuration and the accuracy that can be expected when the technique is extended into deeper operating areas.

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