scholarly journals Synthesis And Studied Structural and Morphological Properties of 1-Dimensional Zno-Ag2O-Ag Nanowire

2022 ◽  
Vol 961 (1) ◽  
pp. 012016
Author(s):  
Lujain Nazeeh Yousif ◽  
Noor M. Ibrahim ◽  
Reham Ihssan Kamel ◽  
Muntadher I. Rahmah
Keyword(s):  
Chemical Method ◽  
Silver Oxide ◽  
Morphological Properties ◽  
Dimensional Structure ◽  
X Ray Diffraction ◽  
Wurtzite Phase ◽  
X Ray ◽  
Diffraction Peaks ◽  
Hexagonal Wurtzite Phase ◽  
Ag Nanowire

Abstract 1-dimensional zinc oxide (ZnO) - silver oxide (Ag2O) – silver (Ag) nanowire was prepared using a simple and inexpensive bottom-up chemical method. X-ray diffraction (XRD) results showed the presence of diffraction peaks of ZnO and Ag2O with hexagonal wurtzite phase of ZnO. Energy Dispersive X-ray (EDX) results showed the presence of energy peaks of Zinc (Zn), Silver (Ag), and Oxygen (O) elements. Filed Emission Scanning Electron Microscopy (FE-SEM) results showed that the surface morphology is nanowire (1-dimensional structure) with shapes similar to hedgehog spines and have small nanoscale diameters. The present work represents a promising step in the preparation of a 1-dimensional nanowire.

scholarly journals Studies on the Growth Control of ZnO Nanostructures synthesized by the Chemical Method

2018 ◽  
Vol 23 (2) ◽  
Author(s):  
Patricia María Perillo ◽  
Mariel Nahir Atia ◽  
Daniel Fabián Rodríguez
Keyword(s):  
Chemical Method ◽  
Morphological Evolution ◽  
Zno Nanorods ◽  
Growth Control ◽  
Zno Nanostructures ◽  
X Ray Diffraction ◽  
Wurtzite Phase ◽  
X Ray ◽  
Hexagonal Wurtzite Phase

ABSTRACT ZnO nanostructures were synthesized through a chemical method using different Zn precursors and hexamethylenetetramine (HMTA) at 90 °C. The effects of the reactants on the morphological evolution of ZnO nanorods were investigated. The samples were characterized by using XRD, SEM, EDX and BET. The hexagonal wurtzite phase of ZnO was confirmed by X-ray diffraction (XRD). The performed analysis indicated that different morphologies were obtained by changing the reactants.

Effect of Sputtering Pressure on the Formation of Semiconducting Mg2Si Films

2010 ◽  
Vol 663-665 ◽  
pp. 166-169
Author(s):  
Qing Quan Xiao ◽  
Quan Xie ◽  
Ke Jie Zhao ◽  
Zhi Qiang Yu
Keyword(s):  
Film Growth ◽  
Diffraction Peak ◽  
Morphological Properties ◽  
X Ray Diffraction ◽  
X Ray ◽  
Peak Intensity ◽  
Main Diffraction Peak ◽  
Diffraction Peaks ◽  
Si Films ◽  
Sputtering Pressure

Semiconducting Mg2Si films were fabricated on Si (111) substrates by magnetron sputtering and subsequent annealing, and the effects of sputtering pressure on the Mg2Si film growth were studied. The structural and morphological properties of Mg2Si films were investigated by the means of X-ray diffraction (XRD) and scanning electron microscopy (SEM). The results showed that the Mg2Si (220) main diffraction peak intensity increased and then decreased with the increasing of sputtering pressure. The (220) diffraction peak got its maximum at 3.0 Pa sputtering pressure. The intensity of Mg2Si (200) and (400) diffraction peaks increased rapidly as the sputtering pressure decreased when the pressure was lower than 1.5 Pa. The films prepared at higher sputtering pressure had very irregular microstructures, and the surface of semiconducting Mg2Si films became smoother with the decreasing of the sputtering pressure.

LOW TEMPERATURE SYNTHESIS OF Fe-DOPED ZnO NANOROD BUNDLES IN AQUEOUS SOLUTION

NANO ◽  
2006 ◽  
Vol 01 (02) ◽  
pp. 153-157 ◽  
Author(s):  
ZHIGANG ZHAO ◽  
FENGXIA GENG ◽  
HONGTAO CONG ◽  
JINBO BAI ◽  
HUI-MING CHENG
Keyword(s):  
Aqueous Solution ◽  
Low Temperature ◽  
Zno Nanorods ◽  
Zno Nanorod ◽  
X Ray Diffraction ◽  
Wurtzite Phase ◽  
X Ray ◽  
Vis Spectroscopy ◽  
Doped Zno ◽  
Hexagonal Wurtzite Phase

Pure and Fe -doped ZnO nanorod bundles were synthesized in aqueous solution at low temperature, in which inexpensive reagents such as Zn ( NO 3)2, NaOH and Fe ( NO 3)3 were used as precursors. The composition of the final product can be roughly tuned by the precursor ratio used. Energy dispersive X-ray spectroscopy confirms the successful incorporation of Fe element into ZnO nanorods, and X-ray diffraction reveals that ZnO nanorod bundles have a pure hexagonal wurtzite-phase structure. UV–vis spectroscopy show that the spectrum shifts to longer wavelength with increasing iron doping.

Photoluminescence of ZnO Whiskers with Various Excitation Intensity at Room Temperature

2011 ◽  
Vol 279 ◽  
pp. 161-165
Author(s):  
Xing Yuan Guo ◽  
Jing Zhou ◽  
Zhan Hui Ding ◽  
Yan Feng Xue ◽  
Bin Yao
Keyword(s):  
Emission Band ◽  
Room Temperature ◽  
Light Emission ◽  
Green Light ◽  
X Ray Diffraction ◽  
Wurtzite Phase ◽  
X Ray ◽  
Uv Emission ◽  
Green Light Emission ◽  
Hexagonal Wurtzite Phase

Hexagonal ZnO whiskers were prepared by using an optical floating zone furnace. Most of the as-grown whiskers have diameters of about 20-30 µm and lengths of about 2~3 mm. The characteristic peaks of X-ray diffraction (XRD) verify that the as-grown ZnO whiskers have excellent hexagonal wurtzite phase and (001) orientation. The room-temperature photoluminescence spectra show a near-UV emission band located at 380 nm and a green light emission band centered at 515 nm. The threshold of near-UV emission and lasing were observed.

Control of the phase composition of advanced calcium phosphates using an x-ray diffractometer with a curved position-sensitive detector

2020 ◽  
Vol 86 (6) ◽  
pp. 29-35
Author(s):  
V. P. Sirotinkin ◽  
O. V. Baranov ◽  
A. Yu. Fedotov ◽  
S. M. Barinov
Keyword(s):  
Phase Composition ◽  
Calcium Phosphates ◽  
Position Sensitive Detector ◽  
Sensitive Detector ◽  
X Ray Diffraction ◽  
X Ray ◽  
Impurity Phases ◽  
Position Sensitive ◽  
Diffraction Peaks ◽  
Diffraction Patterns

The results of studying the phase composition of advanced calcium phosphates Ca10(PO4)6(OH)2, β-Ca3(PO4)2, α-Ca3(PO4)2, CaHPO4 · 2H2O, Ca8(HPO4)2(PO4)4 · 5H2O using an x-ray diffractometer with a curved position-sensitive detector are presented. Optimal experimental conditions (angular positions of the x-ray tube and detector, size of the slits, exposure time) were determined with allowance for possible formation of the impurity phases during synthesis. The construction features of diffractometers with a position-sensitive detector affecting the profile characteristics of x-ray diffraction peaks are considered. The composition for calibration of the diffractometer (a mixture of sodium acetate and yttrium oxide) was determined. Theoretical x-ray diffraction patterns for corresponding calcium phosphates are constructed on the basis of the literature data. These x-ray diffraction patterns were used to determine the phase composition of the advanced calcium phosphates. The features of advanced calcium phosphates, which should be taken into account during the phase analysis, are indicated. The powder of high-temperature form of tricalcium phosphate strongly adsorbs water from the environment. A strong texture is observed on the x-ray diffraction spectra of dicalcium phosphate dihydrate. A rather specific x-ray diffraction pattern of octacalcium phosphate pentahydrate revealed the only one strong peak at small angles. In all cases, significant deviations are observed for the recorded angular positions and relative intensity of the diffraction peaks. The results of the study of experimentally obtained mixtures of calcium phosphate are presented. It is shown that the graphic comparison of experimental x-ray diffraction spectra and pre-recorded spectra of the reference calcium phosphates and possible impurity phases is the most effective method. In this case, there is no need for calibration. When using this method, the total time for analysis of one sample is no more than 10 min.

Comparative Studies of Ultra Low-κ Porous Silica Films with 2-D Hexagonal and Disordered Pore Structures

2004 ◽  
Vol 812 ◽  
Author(s):  
Nobutoshi Fujii ◽  
Kazuhiro Yamada ◽  
Yoshiaki Oku ◽  
Nobuhiro Hata ◽  
Yutaka Seino ◽  
...  
Keyword(s):  
Pore Structure ◽  
Nonionic Surfactants ◽  
Porous Silica ◽  
Silica Film ◽  
X Ray Diffraction ◽  
Silica Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Porous Silica Film ◽  
Diffraction Peaks

AbstractPeriodic 2-dimensional (2-D) hexagonal and the disordered pore structure silica films have been developed using nonionic surfactants as the templates. The pore structure was controlled by the static electrical interaction between the micelle of the surfactant and the silica oligomer. No X-ray diffraction peaks were observed for the disordered mesoporous silica films, while the pore diameters of 2.0-4.0 nm could be measured by small angle X-ray scattering spectroscopy. By comparing the properties of the 2-D hexagonal and the disordered porous silica films which have the same porosity, it is found that the disordered porous silica film has advantages in terms of the dielectric constant and Young's modulus as well as the hardness. The disordered porous silica film is more suitable for the interlayer dielectrics for ULSI.

Energy Band Gap Studies of CdS Nanomaterials

2008 ◽  
Vol 3 ◽  
pp. 97-102 ◽  
Author(s):  
Dinu Patidar ◽  
K.S. Rathore ◽  
N.S. Saxena ◽  
Kananbala Sharma ◽  
T.P. Sharma
Keyword(s):  
Optical Absorption ◽  
Band Gap ◽  
Energy Band ◽  
Chemical Method ◽  
Optical Absorption Spectroscopy ◽  
Cds Nanoparticles ◽  
X Ray Diffraction ◽  
Energy Band Gap ◽  
X Ray ◽  
Simple Chemical

The CdS nanoparticles of different sizes are synthesized by a simple chemical method. Here, CdS nanoparticles are grown through the reaction of solution of different concentration of CdCl2 with H2S. X-ray diffraction pattern confirms nano nature of CdS and has been used to determine the size of particle. Optical absorption spectroscopy is used to measure the energy band gap of these nanomaterials by using Tauc relation. Energy band gap ranging between 3.12 eV to 2.47 eV have been obtained for the samples containing the nanoparticles in the range of 2.3 to 6.0 nm size. A correlation between the band gap and size of the nanoparticles is also established.

scholarly journals Characterization of ferrite nanoparticles for preparation of biocomposites

2017 ◽  
Vol 8 ◽  
pp. 1257-1265 ◽  
Author(s):  
Urszula Klekotka ◽  
Magdalena Rogowska ◽  
Dariusz Satuła ◽  
Beata Kalska-Szostko
Keyword(s):  
Chemical Method ◽  
Ferrite Nanoparticles ◽  
Chemical Activity ◽  
Nominal Composition ◽  
X Ray Diffraction ◽  
Wet Chemical Method ◽  
X Ray ◽  
Transmission Electron ◽  
Wet Chemical

Ferrite nanoparticles with nominal composition Me0.5Fe2.5O4 (Me = Co, Fe, Ni or Mn) have been successfully prepared by the wet chemical method. The obtained particles have a mean diameter of 11–16 ± 2 nm and were modified to improve their magnetic properties and chemical activity. The surface of the pristine nanoparticles was functionalized afterwards with –COOH and –NH2 groups to obtain a bioactive layer. To achieve our goal, two different modification approaches were realized. In the first one, glutaraldehyde was attached to the nanoparticles as a linker. In the second one, direct bonding of such nanoparticles with a bioparticle was studied. In subsequent steps, the nanoparticles were immobilized with enzymes such as albumin, glucose oxidase, lipase and trypsin as a test bioparticles. The characterization of the nanoparticles was acheived by transmission electron microscopy, X-ray diffraction, energy dispersive X-ray and Mössbauer spectroscopy. The effect of the obtained biocomposites was monitored by Fourier transform infrared spectroscopy. The obtained results show that in some cases the use of glutaraldehyde was crucial (albumin).

The Microstructure and Electrical Property of Porous Cu Film on Soft PVDF Substrate

2012 ◽  
Vol 472-475 ◽  
pp. 1451-1454
Author(s):  
Xue Hui Wang ◽  
Wu Tang ◽  
Ji Jun Yang
Keyword(s):  
Electrical Properties ◽  
Film Surface ◽  
X Ray Diffraction ◽  
Si Substrate ◽  
X Ray ◽  
Cu Films ◽  
Cu Film ◽  
Diffraction Peaks ◽  
Sputtering Pressure ◽  
Effect Method

The porous Cu film was deposited on soft PVDF substrate by magnetron sputtering at different sputtering pressure. The microstructure and electrical properties of Cu films were investigated as a function of sputtering pressure by X-ray diffraction XRD and Hall effect method. The results show that the surface morphology of Cu film is porous, and the XRD revealed that there are Cu diffraction peaks with highly textured having a Cu-(220) or a mixture of Cu-(111) and Cu-(220) at sputtering pressure 0.5 Pa. The electrical properties are also severely influenced by sputtering pressure, the resistivity of the porous Cu film is much larger than that fabricated on Si substrate. Furthermore, the resistivity increases simultaneously with the increasing of Cu film surface aperture, but the resistivity of Cu film still decreases with the increasing grain size. It can be concluded that the crystal structure is still the most important factor for the porous Cu film resistivity.

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