PM-10Evaluation of Atomic Position Precision in Electrical Biasing In-situ Scanning Transmission Electron Microscopy Observation

Atomic Position ◽

Microscopy Observation ◽

Transmission Electron ◽

Scanning Transmission ◽

Position Precision

CO Oxidation Properties and Scanning Transmission Electron Microscopy Observation of Au/SrTiO3 Catalysts

Catalysis Letters ◽

10.1007/s10562-018-2505-2 ◽

2018 ◽

Vol 148 (10) ◽

pp. 3035-3041 ◽

Cited By ~ 2

Author(s):

Tomoki Akita ◽

Yasushi Maeda

Keyword(s):

Electron Microscopy ◽

Co Oxidation ◽

Microscopy Observation ◽

Transmission Electron ◽

Scanning Transmission ◽

Oxidation Properties

In Situ Scanning Transmission Electron Microscopy Study of MoS2 Formation on Graphene with a Deep-Learning Framework

ACS Omega ◽

10.1021/acsomega.1c03002 ◽

2021 ◽

Author(s):

Yeongdong Lee ◽

Jongyeong Lee ◽

Handolsam Chung ◽

Jaemin Kim ◽

Zonghoon Lee

Keyword(s):

Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Learning Framework ◽

Transmission Electron ◽

In Situ Transmission Electron Microscopy Observation of Single Crystallization of Filled Aluminum Interconnection

Japanese Journal of Applied Physics ◽

10.1143/jjap.34.l1260 ◽

1995 ◽

Vol 34 (Part 2, No. 10A) ◽

pp. L1260-L1262 ◽

Cited By ~ 3

Author(s):

Jun-ichi Wada ◽

Hiroshi Toyoda ◽

Hisashi Kaneko ◽

Nobuo Hayasaka ◽

Hidehiro Yasuda ◽

...

Keyword(s):

Electron Microscopy ◽

Microscopy Observation ◽

Electron Microscopy Observation ◽

Transmission Electron

Atomic-resolution Studies of Ca3Co4O9 using in-situ Scanning Transmission Electron Microscopy

Microscopy and Microanalysis ◽

10.1017/s1431927608083499 ◽

2008 ◽

Vol 14 (S2) ◽

pp. 436-437 ◽

Cited By ~ 1

Author(s):

G Yang ◽

Y Zhao ◽

K Sader ◽

A Bleloch ◽

RF Klie

Keyword(s):

Electron Microscopy ◽

New Mexico ◽

Atomic Resolution ◽

Transmission Electron ◽

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Temperature-Dependent Ultrastructure Transformation of Au–Fe Nanoparticles Investigated by in Situ Scanning Transmission Electron Microscopy

Crystal Growth & Design ◽

10.1021/acs.cgd.8b00809 ◽

2018 ◽

Vol 18 (9) ◽

pp. 5434-5440 ◽

Cited By ~ 11

Author(s):

Marius Kamp ◽

Anna Tymoczko ◽

Ulrich Schürmann ◽

Jurij Jakobi ◽

Christoph Rehbock ◽

...

Keyword(s):

Electron Microscopy ◽

Temperature Dependent ◽

Transmission Electron ◽

Fe Nanoparticles ◽

Tracking oxidation of individual iron nanoparticles with atomic resolution using aberration-corrected environmental in situ scanning transmission electron microscopy

10.22443/rms.emc2020.1388 ◽

2021 ◽

Author(s):

Roland Kröger ◽

Keyword(s):

Electron Microscopy ◽

Iron Nanoparticles ◽

Atomic Resolution ◽

Transmission Electron ◽

Scanning Transmission ◽

Aberration Corrected

In-Situ Transmission Electron Microscopy Observation of Solid Electrolyte Interface Formation On Si Nanowire Electrode in the Li-Ion Battery Using Liquid Confining Cell

ECS Meeting Abstracts ◽

10.1149/ma2013-02/13/903 ◽

2013 ◽

Keyword(s):

Electron Microscopy ◽

Li Ion Battery ◽

Microscopy Observation ◽

Interface Formation ◽

Si Nanowire ◽

Transmission Electron ◽

Li Ion

Atomic-Scale Localized Thinning and Reconstruction of Two-Dimensional WS2 Layers through In Situ Transmission Electron Microscopy/Scanning Transmission Electron Microscopy

The Journal of Physical Chemistry C ◽

10.1021/acs.jpcc.0c04765 ◽

2020 ◽

Vol 124 (27) ◽

pp. 14935-14940

Author(s):

Yi-Tang Tseng ◽

Kuo-Lun Tai ◽

Chun-Wei Huang ◽

Chih-Yang Huang ◽

Wen-Wei Wu

Keyword(s):

Electron Microscopy ◽

Atomic Scale ◽

Two Dimensional ◽

Transmission Electron ◽

In-Situ Transmission Electron Microscopy Observation of Electromigration in Au Thin Wires

Journal of Nanoscience and Nanotechnology ◽

10.1166/jnn.2012.6813 ◽

2012 ◽

Vol 12 (11) ◽

pp. 8741-8745

Author(s):

Yosuke Murakami ◽

Masashi Arita ◽

Kouichi Hamada ◽

Yasuo Takahashi

Keyword(s):

Electron Microscopy ◽

Microscopy Observation ◽

Electron Microscopy Observation ◽

Thin Wires ◽

Transmission Electron

Atomic‐Scale Fabrication of In‐Plane Heterojunctions of Few‐Layer MoS 2 via In Situ Scanning Transmission Electron Microscopy

Small ◽

10.1002/smll.201905516 ◽

2019 ◽

Vol 16 (3) ◽

pp. 1905516 ◽

Cited By ~ 4

Author(s):

Kuo‐Lun Tai ◽

Chun‐Wei Huang ◽

Ren‐Fong Cai ◽

Guan‐Min Huang ◽

Yi‐Tang Tseng ◽

...

Keyword(s):

Electron Microscopy ◽

Atomic Scale ◽

Transmission Electron ◽