PM-10Evaluation of Atomic Position Precision in Electrical Biasing In-situ Scanning Transmission Electron Microscopy Observation

Microscopy ◽  
2017 ◽  
Vol 66 (suppl_1) ◽  
pp. i22-i22
Author(s):  
Yukio Sato ◽  
Takashi Gondo ◽  
Hiroya Miyazaki ◽  
Ryo Teranishi ◽  
Kenji Kaneko
1995 ◽  
Vol 34 (Part 2, No. 10A) ◽  
pp. L1260-L1262 ◽  
Author(s):  
Jun-ichi Wada ◽  
Hiroshi Toyoda ◽  
Hisashi Kaneko ◽  
Nobuo Hayasaka ◽  
Hidehiro Yasuda ◽  
...  

2008 ◽  
Vol 14 (S2) ◽  
pp. 436-437 ◽  
Author(s):  
G Yang ◽  
Y Zhao ◽  
K Sader ◽  
A Bleloch ◽  
RF Klie

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008


Small ◽  
2019 ◽  
Vol 16 (3) ◽  
pp. 1905516 ◽  
Author(s):  
Kuo‐Lun Tai ◽  
Chun‐Wei Huang ◽  
Ren‐Fong Cai ◽  
Guan‐Min Huang ◽  
Yi‐Tang Tseng ◽  
...  

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