Atomic force microscopy (AFM) analysis of lipid peroxidation following hyperoxia and hydrogen peroxide treatment in human U87 glioblastoma cells

The present work introduces a new procedure to obtain gold nanoparticles (AuNPs). AuNPs (77–213 nm) were obtained in the absence of any classical reducing agents in a medium containing Mg2+/Al3+layered double hydroxide (LDH) andN,N-dimethylformamide. XRD analysis showed the presence of crystalline phases of gold in the Au/LDH composite. The 2θvalues of peaks corresponding to the LDH interlayer distance indicated that metallic NPs were deposited on the surface of the material. Furthermore, atomic force microscopy (AFM) analysis showed that AuNPs tend to agglomerate in a nonclassical halter-like shape.

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AFM ANALYSIS OF ENAMEL DAMAGE DUE TO ETCHING WITH ORTHOPHOSPHORIC ACID

Contemporary Materials ◽

10.7251/comen1601060m ◽

2016 ◽

Vol 7 (1) ◽

Author(s):

Vladan Mirjanić ◽

Đorđe Mirjanić

Keyword(s):

Atomic Force Microscopy ◽

Orthophosphoric Acid ◽

Tooth Enamel ◽

Modern Technology ◽

Single Plane ◽

Force Microscopy ◽

Atomic Force ◽

Precise Analysis ◽

Afm Analysis ◽

Scientific Fields

Bearing in mind that in the field of jaw orthopedics and related scientific fields, there are no scientific studies that use the most modern technology based on the Atomic Force Microscopy (AFM) to investigate the nanostructure of tooth enamel after etching with 37% orthophosphoric acid, in this paper we will use this method, which is currently the most reliable, to determine the degree of tooth damage after its etching in the process of fixing orthodontic brackets. Considering the fact that the degree of enamel damage after etching cannot be realistically comprehended by the method called ’network’, because in this way the damage cannot be seen three dimensionally (the depth of the damage), but only the damage in a single plane, a more precise analysis can be obtained with the application of the most contemporary method that we can apply in this case, and that is the application of AFM technology.

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CVD Growth and Excimer Laser Processing of SiGe Alloys Monitored by Single Wavelength Ellipsometry and Atomic Force Microscopy

MRS Proceedings ◽

10.1557/proc-502-65 ◽

1997 ◽

Vol 502 ◽

Author(s):

R. Larciprete ◽

G. Padeletti ◽

S. Cozzi ◽

S. Pieretti

Keyword(s):

Atomic Force Microscopy ◽

Laser Processing ◽

Growth Parameters ◽

Laser Pulses ◽

Force Microscopy ◽

Atomic Force ◽

Afm Analysis ◽

Cvd Growth ◽

Sample Irradiation

ABSTRACTSingle wavelength ellipsometry was used to monitor the CVD growth of Si(1-x)Gex alloys onSi and to evaluate the effect of sample irradiation by KrF laser pulses, performed during or afterthe CVD growth. The information obtained was correlated with AFM analysis results in order tooptimize the growth parameters for an improved morphological quality of the alloy layers.

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Atomic force microscopy (AFM) analysis of nanocarrier–cell interaction

Toxicology Letters ◽

10.1016/j.toxlet.2014.06.266 ◽

2014 ◽

Vol 229 ◽

pp. S67

Author(s):

Olivia Kemp ◽

Helen Grant ◽

Dimitrios Lamprou

Keyword(s):

Atomic Force Microscopy ◽

Cell Interaction ◽

Force Microscopy ◽

Atomic Force ◽

Afm Analysis

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A Non-Destructive, Tuneable Method to Isolate Live Cells for High-Speed AFM Analysis

Microorganisms ◽

10.3390/microorganisms9040680 ◽

2021 ◽

Vol 9 (4) ◽

pp. 680

Author(s):

Christopher T. Evans ◽

Sara J. Baldock ◽

John G. Hardy ◽

Oliver Payton ◽

Loren Picco ◽

...

Keyword(s):

Atomic Force Microscopy ◽

High Resolution ◽

High Speed ◽

Single Cells ◽

Sample Surface ◽

Live Cells ◽

Contact Mode ◽

Force Microscopy ◽

Atomic Force ◽

Afm Analysis

Suitable immobilisation of microorganisms and single cells is key for high-resolution topographical imaging and study of mechanical properties with atomic force microscopy (AFM) under physiologically relevant conditions. Sample preparation techniques must be able to withstand the forces exerted by the Z range-limited cantilever tip, and not negatively affect the sample surface for data acquisition. Here, we describe an inherently flexible methodology, utilising the high-resolution three-dimensional based printing technique of multiphoton polymerisation to rapidly generate bespoke arrays for cellular AFM analysis. As an example, we present data collected from live Emiliania huxleyi cells, unicellular microalgae, imaged by contact mode High-Speed Atomic Force Microscopy (HS-AFM), including one cell that was imaged continuously for over 90 min.

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Atomic force microscopy analysis of alkali textured silicon substrates for solar cell applications

International Journal of Physical Research ◽

10.14419/ijpr.v6i1.8795 ◽

2018 ◽

Vol 6 (1) ◽

pp. 13

Author(s):

Adebayo Fashina ◽

Kenneth Adama ◽

Lookman Abdullah ◽

Chukwuemeka Ani ◽

Oluwaseun Oyewole ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Surface Morphology ◽

Light Trapping ◽

Surface Texturing ◽

Etching Time ◽

Silicon Substrates ◽

Average Roughness ◽

Force Microscopy ◽

Atomic Force ◽

Afm Analysis

In this paper, the surface morphology of textured silicon substrates is explored. Prior to the surface morphology analysis, textured silicon substrates were obtained by KOH anisotropic texturing of polished silicon wafers. This was achieved by investigating of the dependence surface texturing on the process parameters; etchant concentration, etching time and temperature. The surface morphology of the textured silicon samples was obtained using atomic force microscopy that was operated in the tapping mode. The resulting atomic force microscopy (AFM) images were analyzed using the Nanoscope and Gwyddion software packages. The AFM analysis revealed more surface details such as the depth, roughness, section, and step height analysis. The analysis was limited to a length scale of a few micrometers, which carefully reveals the number of individualities of the initial stages of pyramid growth. The average roughness was found to be 593nm for an optimally textured silicon wafer. The implications of the study are then discussed for potential light trapping application in silicon solar cells.

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Lipid Peroxidation and the Antioxidant Effects of 3,5,7,4'-Tetrahydroxy-2'-Methoxyflavone; Direct Observation by Atomic Force Microscopy.

Journal of Oleo Science ◽

10.5650/jos.51.63 ◽

2002 ◽

Vol 51 (1) ◽

pp. 63-67 ◽

Cited By ~ 2

Author(s):

Shoko YOKOYAMA ◽

Tadahiro TAKEDA ◽

Hiromi TAKAHASHI ◽

Yumiko OHTA ◽

Sung Hee PARK ◽

...

Keyword(s):

Lipid Peroxidation ◽

Atomic Force Microscopy ◽

Direct Observation ◽

Force Microscopy ◽

Atomic Force ◽

Antioxidant Effects

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Atomic Force Microscopy (AFM) Analysis of the Bacterial Polar Protein Popz

Biophysical Journal ◽

10.1016/j.bpj.2014.11.924 ◽

2015 ◽

Vol 108 (2) ◽

pp. 167a-168a

Author(s):

Carolina E. Caffaro ◽

Grant R. Bowman

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Afm Analysis

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Effect of Rapid Solidification Processing on Hydrogen Behaviour in Aluminium

Materials Science Forum ◽

10.4028/www.scientific.net/msf.654-656.998 ◽

2010 ◽

Vol 654-656 ◽

pp. 998-1001 ◽

Cited By ~ 7

Author(s):

Iya I. Tashlykova-Bushkevich ◽

Takahiro Shikagawa ◽

Vasiliy G. Shepelevich ◽

Goroh Itoh

Keyword(s):

Atomic Force Microscopy ◽

Rapid Solidification ◽

Thermal Desorption Spectroscopy ◽

Rapid Solidification Processing ◽

Alloying Element ◽

Solidification Processing ◽

Force Microscopy ◽

Atomic Force ◽

Afm Analysis ◽

Rapidly Solidified

Thermal desorption spectroscopy (TDS) technique has been used to study hydrogen behaviour in rapidly solidified (RS) aluminium (Al) both as-cast and exposed to humid air (HA). The surface morphology of the foils was studied through atomic force microscopy (AFM). Analysis was made of the effect of rapid solidification processing (RSP) on H/microstructure interactions, including investigation of alloying element (0.05 at % Ti) influence on H trapping in Al.

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