High-throughput transmission electron microscopy with automated serial sectioning

2019 ◽  
Author(s):  
Brett J. Graham ◽  
David Grant Colburn Hildebrand ◽  
Aaron T. Kuan ◽  
Jasper T. Maniates-Selvin ◽  
Logan A. Thomas ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Throughput ◽  
Biological Tissues ◽  
Serial Sectioning ◽  
Brain Circuits ◽  
Transmission Electron ◽  
Resolution Imaging ◽  
Alternative Approaches ◽  
The Cost

AbstractTransmission electron microscopy (TEM) is an essential tool for studying cells and molecules. We present a tape-based, reel-to-reel pipeline that combines automated serial sectioning with automated high-throughput TEM imaging. This acquisition platform provides nanometer-resolution imaging at fast rates for a fraction of the cost of alternative approaches. We demonstrate the utility of this imaging platform for generating datasets of biological tissues with a focus on examining brain circuits.

Transmission Electron Microscopy Imaging of Structural Transformation Dynamics in a Single Nanocrystal

2012 ◽  
Vol 20 (1) ◽  
pp. 18-22
Author(s):  
Haimei Zheng
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Collection Efficiency ◽  
Single Atom ◽  
Microscopy Imaging ◽  
High Brightness ◽  
Rapid Acquisition ◽  
Signal Collection ◽  
Transmission Electron ◽  
Resolution Imaging

Over the last decade, transmission electron microscopy (TEM) has advanced remarkably. With the development of aberration-corrected optics, improved recording systems, high brightness guns, and so on, imaging with single-atom sensitivity across the periodic table has become a reality. Atomic resolution imaging with rapid acquisition and with greater signal collection efficiency opens many opportunities in the study of dynamic processes of materials.

High Resolution Imaging of As-Grown Sapphire Surfaces

1985 ◽  
Vol 62 ◽  
Author(s):  
Tung Hsu ◽  
S. R. Nutt
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Structural Features ◽  
High Resolution Imaging ◽  
Sapphire Surface ◽  
Surface Steps ◽  
Transmission Electron ◽  
Reflection Electron Microscopy ◽  
Resolution Imaging ◽  
Surface Facets

ABSTRACTSurfaces of commercially grown edge-defined film-fed growth sapphire (EFG α-Al2O3) were studied in the electron microscope using both reflection electron microscopy (REM) and conventional transmission electron microscopy (TEM). The as-grown sapphire surface, ostensibly {1120}, was characterized by “rooftop” structures which were often locally periodic. These rooftop structures consisted of alternating {1120} facets and additional facets inclined a few degrees. The crystallography of the surface facets was analyzed using REM imaging of bulk specimens, and trace analysis of back-thinned plan section TEM specimens. Surface roughness was measured by stylus profilometry. and these measurements were compared to the electron microscopy observations. Fine structural features parallel to <0110> directions were also observed in both REM and TEM experiments, and these were attributed to surface steps of atomic scales.

scholarly journals Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp

Materials ◽  
2018 ◽  
Vol 11 (8) ◽  
pp. 1304 ◽  
Author(s):  
Giulio Guzzinati ◽  
Thomas Altantzis ◽  
Maria Batuk ◽  
Annick De Backer ◽  
Gunnar Lumbeeck ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Materials Science ◽  
Electron Tomography ◽  
High Resolution Imaging ◽  
Rapid Progress ◽  
Transmission Electron ◽  
The World ◽  
Resolution Imaging ◽  
The University

The rapid progress in materials science that enables the design of materials down to the nanoscale also demands characterization techniques able to analyze the materials down to the same scale, such as transmission electron microscopy. As Belgium’s foremost electron microscopy group, among the largest in the world, EMAT is continuously contributing to the development of TEM techniques, such as high-resolution imaging, diffraction, electron tomography, and spectroscopies, with an emphasis on quantification and reproducibility, as well as employing TEM methodology at the highest level to solve real-world materials science problems. The lab’s recent contributions are presented here together with specific case studies in order to highlight the usefulness of TEM to the advancement of materials science.

Single-atom electron microscopy for energy-related nanomaterials

2020 ◽  
Vol 8 (32) ◽  
pp. 16142-16165 ◽  
Author(s):  
Mingquan Xu ◽  
Aowen Li ◽  
Meng Gao ◽  
Wu Zhou
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Atomic Resolution ◽  
Single Atom ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Resolution Imaging ◽  
Imaging And Spectroscopy ◽  
Atom Level

The advances in aberration correction have enabled atomic-resolution imaging and spectroscopy in scanning transmission electron microscopy (STEM) under low primary voltages and pushed their detection limit down to the single-atom level.

FASTDEF: Fast defocus and astigmatism estimation for high-throughput transmission electron microscopy

2013 ◽  
Vol 181 (2) ◽  
pp. 136-148 ◽  
Author(s):  
J. Vargas ◽  
J. Otón ◽  
R. Marabini ◽  
S. Jonic ◽  
J.M. de la Rosa-Trevín ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Throughput ◽  
Transmission Electron

A novel mosaic-like structure in SrTiO3 thin films on a Pt(001) surface revealed by transmission electron microscopy

1996 ◽  
Vol 11 (11) ◽  
pp. 2777-2784 ◽  
Author(s):  
S. Takeno ◽  
S. Nakamura ◽  
K. Abe ◽  
S. Komatsu
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
High Resolution Imaging ◽  
Antiphase Boundaries ◽  
Growth Modes ◽  
Transmission Electron ◽  
Interfacial Structures ◽  
Resolution Imaging ◽  
Means Of Transmission

A novel mosaic-like structure in SrTiO3 thin films was discovered and characterized by means of transmission electron microscopy (TEM). The films were deposited on a (001) oriented Pt surface. The orientation relationship between SrTiO3 film and Pt substrate was determined, and four types of growth modes were revealed. These four growth modes formed four types of domains, respectively, and these domains and Pt formed peculiarly ordered interfacial structures, i.e., near coincidence site lattices. Antiphase boundaries between two adjacent domains were also observed by high-resolution imaging.

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