Transient nucleation following pulsed-laser melting of thin silicon films

1991 ◽  
Vol 43 (12) ◽  
pp. 9851-9855 ◽  
Author(s):  
S. R. Stiffler ◽  
Michael O. Thompson ◽  
P. S. Peercy
2006 ◽  
Vol 45 (4A) ◽  
pp. 2437-2440 ◽  
Author(s):  
Toshiyuki Sameshima ◽  
Hajime Watakabe ◽  
Nobuyuki Andoh ◽  
Seiichiro Higashi

1991 ◽  
Vol 114 (3) ◽  
pp. 446-466 ◽  
Author(s):  
L.N. Brush ◽  
G.B. McFadden ◽  
S.R. Coriell

2005 ◽  
Vol 487 (1-2) ◽  
pp. 63-66 ◽  
Author(s):  
T. Sameshima ◽  
H. Watakabe ◽  
N. Andoh ◽  
S. Higashi

1982 ◽  
Vol 63 (1-4) ◽  
pp. 169-173
Author(s):  
M. O. Lampert ◽  
J. P. Ponpon ◽  
R. Stuck ◽  
P. Siffert

2002 ◽  
Vol 715 ◽  
Author(s):  
P. Sanguino ◽  
M. Niehus ◽  
S. Koynov ◽  
P. Brogueira ◽  
R. Schwarz ◽  
...  

AbstractThe minority-carrier diffusion length in thin silicon films can be extracted from the electrically-detected transient grating method, EDTG, by a simple ambipolar analysis only in the case of lifetime dominated carrier transport. If the dielectric relaxation time, τdiel, is larger than the photocarrier response time, τR, then unexpected negative transient signals can appear in the EDTG result. Thin silicon films deposited by hot-wire chemical vapor deposition (HWCVD) near the amorphous-to-microcrystalline transition, where τR varies over a large range, appeared to be ideal candidates to study the interplay between carrier recombination and dielectric response. By modifying the ambipolar description to allow for a time-dependent carrier grating build-up and decay we can obtain a good agreement between analytical calculation and experimental results.


Materials ◽  
2021 ◽  
Vol 14 (15) ◽  
pp. 4138
Author(s):  
Ye Yuan ◽  
Yufang Xie ◽  
Ning Yuan ◽  
Mao Wang ◽  
René Heller ◽  
...  

One of the most attractive characteristics of diluted ferromagnetic semiconductors is the possibility to modulate their electronic and ferromagnetic properties, coupled by itinerant holes through various means. A prominent example is the modification of Curie temperature and magnetic anisotropy by ion implantation and pulsed laser melting in III–V diluted magnetic semiconductors. In this study, to the best of our knowledge, we performed, for the first time, the co-doping of (In,Mn)As diluted magnetic semiconductors by Al by co-implantation subsequently combined with a pulsed laser annealing technique. Additionally, the structural and magnetic properties were systematically investigated by gradually raising the Al implantation fluence. Unexpectedly, under a well-preserved epitaxial structure, all samples presented weaken Curie temperature, magnetization, as well as uniaxial magnetic anisotropies when more aluminum was involved. Such a phenomenon is probably due to enhanced carrier localization introduced by Al or the suppression of substitutional Mn atoms.


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