Evidence of electron-hole symmetry breaking in poly(p-phenylene vinylene)

2003 ◽  
Vol 68 (19) ◽  
Author(s):  
M. Baïtoul ◽  
J. Wéry ◽  
S. Lefrant ◽  
E. Faulques ◽  
J-P. Buisson ◽  
...  
Keyword(s):  
Symmetry Breaking ◽  
Phenylene Vinylene ◽  
Electron Hole

scholarly journals Instability of the marginal commutative model of tunneling centers interacting with a metallic environment: Role of the electron-hole symmetry breaking

1997 ◽  
Vol 56 (20) ◽  
pp. 12947-12960 ◽  
Author(s):  
A. Zawadowski ◽  
G. Zaránd ◽  
P. Nozières ◽  
K. Vladár ◽  
G. T. Zimányi
Keyword(s):  
Symmetry Breaking ◽  
Electron Hole ◽  
Tunneling Centers

scholarly journals Electron–Hole Symmetry Breaking in Charge Transport in Nitrogen-Doped Graphene

ACS Nano ◽  
2017 ◽  
Vol 11 (5) ◽  
pp. 4641-4650 ◽  
Author(s):  
Jiayu Li ◽  
Li Lin ◽  
Dingran Rui ◽  
Qiucheng Li ◽  
Jincan Zhang ◽  
...  
Keyword(s):  
Symmetry Breaking ◽  
Charge Transport ◽  
Electron Hole ◽  
Nitrogen Doped ◽  
Nitrogen Doped Graphene ◽  
Doped Graphene

Electrochemiluminescence Tuned by Electron–Hole Recombination from Symmetry-Breaking in Wurtzite ZnSe

2016 ◽  
Vol 138 (4) ◽  
pp. 1154-1157 ◽  
Author(s):  
Suli Liu ◽  
Qinghua Zhang ◽  
Long Zhang ◽  
Lin Gu ◽  
Guizheng Zou ◽  
...  
Keyword(s):  
Symmetry Breaking ◽  
Electron Hole ◽  
Hole Recombination

scholarly journals Bilayer graphene under pressure: Electron-hole symmetry breaking, valley Hall effect, and Landau levels

2016 ◽  
Vol 93 (23) ◽  
Author(s):  
F. Munoz ◽  
H. P. Ojeda Collado ◽  
Gonzalo Usaj ◽  
Jorge O. Sofo ◽  
C. A. Balseiro
Keyword(s):  
Symmetry Breaking ◽  
Hall Effect ◽  
Bilayer Graphene ◽  
Landau Levels ◽  
Electron Hole ◽  
Valley Hall Effect

Current Status of Solid-State X-Ray Systems

1985 ◽  
Vol 43 ◽  
pp. 158-161
Author(s):  
Martin Peckerar ◽  
Anastasios Tousimis
Keyword(s):  
Solid State ◽  
Electric Fields ◽  
Spectral Lines ◽  
Current Status ◽  
Mobile Charge ◽  
Electron Hole ◽  
X Ray ◽  
Sensing Systems ◽  
Transmission Electron ◽  
Electron Microscopes

Solid state x-ray sensing systems have been used for many years in conjunction with scanning and transmission electron microscopes. Such systems conveniently provide users with elemental area maps and quantitative chemical analyses of samples. Improvements on these tools are currently sought in the following areas: sensitivity at longer and shorter x-ray wavelengths and minimization of noise-broadening of spectral lines. In this paper, we review basic limitations and recent advances in each of these areas. Throughout the review, we emphasize the systems nature of the problem. That is. limitations exist not only in the sensor elements but also in the preamplifier/amplifier chain and in the interfaces between these components.Solid state x-ray sensors usually function by way of incident photons creating electron-hole pairs in semiconductor material. This radiation-produced mobile charge is swept into external circuitry by electric fields in the semiconductor bulk.

A correlation of CL emissions from Penrith sandstone with elemental distributions obtained by simultaneous SEM-CL and EDS analysis

1995 ◽  
Vol 53 ◽  
pp. 392-393
Author(s):  
Paul J. Wright
Keyword(s):  
Optical Microscope ◽  
Electron Gun ◽  
High Electron ◽  
Collection System ◽  
Electron Hole ◽  
Depositional Processes ◽  
Eds Analysis ◽  
Distribution Mapping ◽  
Backscattered Electron ◽  
Electron Imaging

Most industrial and academic geologists are familiar with the beautiful red and orange cathodoluminescence colours produced by carbonate minerals in an optical microscope with a cold cathode electron gun attached. The cement stratigraphies interpreted from colour photographs have been widely used to determine the post depositional processes which have modified sedimentary rock textures.However to study quartzose materials high electron densities and kV's are necessary to stimulate sufficient emission. A scanning electron microscope with an optical collection system and monochromator provides an adequate tool and gives the advantage of providing secondary and backscattered electron imaging as well as elemental analysis and distribution mapping via standard EDS/WDS facilities.It has been known that the incorporation of many elements modify the characteristics of the CL emissions from geological materials. They do this by taking up positions between the valence and conduction band thus providing sites to assist in the recombination of electron hole pairs.

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