Nonassociative electric fields in chiral gauge theory: An explicit construction

1988 ◽  
Vol 60 (8) ◽  
pp. 680-683 ◽  
Author(s):  
Gordon W. Semenoff
Keyword(s):  
Gauge Theory ◽  
Electric Fields ◽  
Explicit Construction

scholarly journals Celestial diamonds: conformal multiplets in celestial CFT

2021 ◽  
Vol 2021 (11) ◽  
Author(s):  
Sabrina Pasterski ◽  
Andrea Puhm ◽  
Emilio Trevisani
Keyword(s):  
Gauge Theory ◽  
Scattering Amplitudes ◽  
Explicit Construction ◽  
Conformal Dimension ◽  
Massless Particles ◽  
Special Values ◽  
Left And Right ◽  
Opposite Helicity ◽  
Asymptotic Symmetries

Abstract We examine the structure of global conformal multiplets in 2D celestial CFT. For a 4D bulk theory containing massless particles of spin s = $$ \left\{0,\frac{1}{2},1,\frac{3}{2},2\right\} $$ 0 1 2 1 3 2 2 we classify and construct all SL(2,ℂ) primary descendants which are organized into ‘celestial diamonds’. This explicit construction is achieved using a wavefunction-based approach that allows us to map 4D scattering amplitudes to celestial CFT correlators of operators with SL(2,ℂ) conformal dimension ∆ and spin J. Radiative conformal primary wavefunctions have J = ±s and give rise to conformally soft theorems for special values of ∆ ∈ $$ \frac{1}{2}\mathbb{Z} $$ 1 2 ℤ . They are located either at the top of celestial diamonds, where they descend to trivial null primaries, or at the left and right corners, where they descend both to and from generalized conformal primary wavefunctions which have |J| ≤ s. Celestial diamonds naturally incorporate degeneracies of opposite helicity particles via the 2D shadow transform relating radiative primaries and account for the global and asymptotic symmetries in gauge theory and gravity.

scholarly journals 1+1 DIMENSIONAL NCOS AND ITS U(N) GAUGE THEORY DUAL

2001 ◽  
Vol 16 (05) ◽  
pp. 922-935 ◽  
Author(s):  
IGOR R. KLEBANOV ◽  
JUAN MALDACENA
Keyword(s):  
Gauge Theory ◽  
Electric Field ◽  
Electric Fields ◽  
Degrees Of Freedom ◽  
Finite Energy ◽  
Open String ◽  
Closed String ◽  
Dual Theory ◽  
Open Strings ◽  
Electric Flux

We study some aspects of open string theories on D-branes with critical electric fields. We show that the massless open string modes that move in the direction of the electric field decouple. In the 1+1 dimensional case the dual theory is U(N) SYM with electric flux, and the decoupling of massless open strings is dual to the decoupling of the U(1) degrees of freedom. We also show that, if the direction along the electric field is compact, then there are finite energy winding closed string modes. They are dual to Higgs branch excitations of the SYM theory, and their energetics works accordingly. These properties provide new non-trivial evidence for the duality.

scholarly journals MONOPOLE-CHARGE INSTABILITY

1988 ◽  
Vol 03 (03) ◽  
pp. 665-702 ◽  
Author(s):  
P.A. HORVÁTHY ◽  
L. O’RAIFEARTAIGH ◽  
J.H. RAWNSLEY
Keyword(s):  
Gauge Theory ◽  
General Theory ◽  
Stability Problem ◽  
Explicit Construction ◽  
Higgs Potential ◽  
Topological Sector ◽  
Negative Eigenvalues ◽  
Pure Gauge Theory ◽  
The Stability ◽  
Charge Instability

For monopoles with nonvanishing Higgs potential it is shown that with respect to “Brandt-Neri-Coleman type” variations (a) the stability problem reduces to that of a pure gauge theory on the 2-sphere (b) each topological sector admits one, and only one, stable monopole charge, and (c) each nonstable monopole admits 2∑2|q|−1 negative modes where the sum goes over all negative eigenvalues q of the non-Abelian charge Q. An explicit construction for (i) the unique stable charge (ii) the negative modes and (iii) the spectrum of the Hessian, on the 2-sphere, is then given. The relation to loops in the residual group is explained. The negative modes are tangent to suitable energy-reducing two-spheres. The general theory is illustrated for the little groups U (2), U (3), SU (3)/ℤ3 and O (5).

Control of Metal Alloy Oxidation with Electric Fields

1973 ◽  
Vol 31 ◽  
pp. 164-165
Author(s):  
R. R. Dils ◽  
P. S. Follansbee
Keyword(s):  
Electric Fields ◽  
Oxidation Process ◽  
Base Alloy ◽  
Oxide Surface ◽  
Platinum Electrodes ◽  
Insulating Layer ◽  
Iron Base Alloy ◽  
Alloy Oxidation ◽  
Aluminum Oxide Layer ◽  
And Control

Electric fields have been applied across oxides growing on a high temperature alloy and control of the oxidation of the material has been demonstrated. At present, three-fold increases in the oxidation rate have been measured in accelerating fields and the oxidation process has been completely stopped in a retarding field.The experiments have been conducted with an iron-base alloy, Pe 25Cr 5A1 0.1Y, although, in principle, any alloy capable of forming an adherent aluminum oxide layer during oxidation can be used. A specimen is polished and oxidized to produce a thin, uniform insulating layer on one surface. Three platinum electrodes are sputtered on the oxide surface and the specimen is reoxidized.

Electron-Mirror Microscopic Aspects of Ferroelectric Domains of BaTiO3 And Ca2Sr (C2H5CO2)6

1970 ◽  
Vol 28 ◽  
pp. 478-479
Author(s):  
Teruo Someya ◽  
Jinzo Kobayashi
Keyword(s):  
Surface Layer ◽  
Electric Fields ◽  
Quantitative Study ◽  
Recent Progress ◽  
Ferroelectric Domain ◽  
Resolving Power ◽  
Surface Pattern ◽  
Crystal Surfaces ◽  
One Dimensional ◽  
Ferroelectric Domains

Recent progress in the electron-mirror microscopy (EMM), e.g., an improvement of its resolving power together with an increase of the magnification makes it useful for investigating the ferroelectric domain physics. English has recently observed the domain texture in the surface layer of BaTiO3. The present authors ) have developed a theory by which one can evaluate small one-dimensional electric fields and/or topographic step heights in the crystal surfaces from their EMM pictures. This theory was applied to a quantitative study of the surface pattern of BaTiO3).

Electron Microscope Observations of Magnetic and Electric Effects

1970 ◽  
Vol 28 ◽  
pp. 430-431
Author(s):  
John Silcox
Keyword(s):  
Electron Microscope ◽  
Electric Fields ◽  
Magnetic Image ◽  
Magnetic Effects ◽  
Ferromagnetic Films ◽  
Diffraction Contrast ◽  
Microscope Images ◽  
Electric Effects ◽  
Image Detail

Several aspects of magnetic and electric effects in electron microscope images are of interest and will be discussed here. Clearly electrons are deflected by magnetic and electric fields and can give rise to image detail. We will review situations in ferromagnetic films in which magnetic image effects are the predominant ones, others in which the magnetic effects give rise to rather subtle changes in diffraction contrast, cases of contrast at specimen edges due to leakage fields in both ferromagnets and superconductors and some effects due to electric fields in insulators.

Electron microscopy studies of PZT ferroelectric film capacitor structures

1992 ◽  
Vol 50 (2) ◽  
pp. 1364-1365
Author(s):  
V. Kaushik ◽  
P. Maniar ◽  
J. Olowolafe ◽  
R. Jones ◽  
A. Campbell ◽  
...  
Keyword(s):  
Electric Fields ◽  
Sol Gel ◽  
Ferroelectric Material ◽  
Dielectric Constants ◽  
Dielectric Films ◽  
Lead Zirconium Titanate ◽  
Si Substrate ◽  
Film Capacitor ◽  
Pzt Films ◽  
High Dielectric

Lead zirconium titanate films (Pb (Zr,Ti) O3 or PZT) are being considered for potential application as dielectric films in memory technology due to their high dielectric constants. PZT is a ferroelectric material which shows spontaneous polarizability, reversible under applied electric fields. We report herein some results of TEM studies on thin film capacitor structures containing PZT films with platinum-titanium electrodes.The wafers had a stacked structure consisting of PZT/Pt/Ti/SiO2/Si substrate as shown in Figure 1. Platinum acts as electrode material and titanium is used to overcome the problem of platinum adhesion to the oxide layer. The PZT (0/20/80) films were deposited using a sol-gel method and the structure was annealed at 650°C and 800°C for 30 min in an oxygen ambient. XTEM imaging was done at 200KV with the electron beam parallel to <110> zone axis of silicon.Figure 2 shows the PZT and Pt layers only, since the structure had a tendency to peel off at the Ti-Pt interface during TEM sample preparation.

Current Status of Solid-State X-Ray Systems

1985 ◽  
Vol 43 ◽  
pp. 158-161
Author(s):  
Martin Peckerar ◽  
Anastasios Tousimis
Keyword(s):  
Solid State ◽  
Electric Fields ◽  
Spectral Lines ◽  
Current Status ◽  
Mobile Charge ◽  
Electron Hole ◽  
X Ray ◽  
Sensing Systems ◽  
Transmission Electron ◽  
Electron Microscopes

Solid state x-ray sensing systems have been used for many years in conjunction with scanning and transmission electron microscopes. Such systems conveniently provide users with elemental area maps and quantitative chemical analyses of samples. Improvements on these tools are currently sought in the following areas: sensitivity at longer and shorter x-ray wavelengths and minimization of noise-broadening of spectral lines. In this paper, we review basic limitations and recent advances in each of these areas. Throughout the review, we emphasize the systems nature of the problem. That is. limitations exist not only in the sensor elements but also in the preamplifier/amplifier chain and in the interfaces between these components.Solid state x-ray sensors usually function by way of incident photons creating electron-hole pairs in semiconductor material. This radiation-produced mobile charge is swept into external circuitry by electric fields in the semiconductor bulk.

Atomic Spectroscopy in the FIM

1986 ◽  
Vol 44 ◽  
pp. 758-761
Author(s):  
J. J. Hren ◽  
S. D. Walck
Keyword(s):  
Electron Microscope ◽  
Electric Fields ◽  
Atom Probe ◽  
Atomic Spectroscopy ◽  
Single Atom ◽  
Statistical Sampling ◽  
Commercial Instrument ◽  
Available Technology ◽  
High Electric Fields ◽  
Field Ion Microscope

The field ion microscope (FIM) has had the ability to routinely image the surface atoms of metals since Mueller perfected it in 1956. Since 1967, the TOF Atom Probe has had single atom sensitivity in conjunction with the FIM. “Why then hasn't the FIM enjoyed the success of the electron microscope?” The answer is closely related to the evolution of FIM/Atom Probe techniques and the available technology. This paper will review this evolution from Mueller's early discoveries, to the development of a viable commercial instrument. It will touch upon some important contributions of individuals and groups, but will not attempt to be all inclusive. Variations in instrumentation that define the class of problems for which the FIM/AP is uniquely suited and those for which it is not will be described. The influence of high electric fields inherent to the technique on the specimens studied will also be discussed. The specimen geometry as it relates to preparation, statistical sampling and compatibility with the TEM will be examined.

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