Kikuchi bandlet method for the accurate deconvolution and localization of Kikuchi bands in Kikuchi diffraction patterns

2014 ◽  
Vol 47 (1) ◽  
pp. 264-275 ◽  
Author(s):  
Farangis Ram ◽  
Stefan Zaefferer ◽  
Dierk Raabe
Keyword(s):  
Diffraction Pattern ◽  
Shape Analysis ◽  
Fourier Space ◽  
Localization Accuracy ◽  
Kikuchi Pattern ◽  
Reflection Angle ◽  
Electron Backscatter ◽  
Diffraction Patterns ◽  
Limited Precision ◽  
Better Than

In order to retrieve crystallographic information from an electron backscatter Kikuchi diffraction pattern, its Kikuchi bands have to be localized. One of the main reasons for the limited precision of the present Kikuchi band localization methods is that the diffuse edges of a Kikuchi band are convoluted by many other Kikuchi bands that intersect them. To improve the localization accuracy, Kikuchi bands have to be deconvoluted. In this article, a new method for the deconvolution and localization of Kikuchi bands is presented. The deconvolution is based on the fact that, in a Kikuchi pattern, there are a number of Kikuchi bands that are not parallel to the bands that intersect them. It is performed in Fourier space. After deconvolution, localization is carried out by a quantitative shape analysis of the intensity profiles of the deconvoluted Kikuchi bands. Using the introduced method, for a real electron backscatter Kikuchi diffraction pattern with 45° half capture angle and 0.12° per pixel maximum scale factor, the characteristic hyperbolic features of the Kikuchi bands can be localized with a precision of better than 0.1° in reflection angle.

scholarly journals Automated Reconstruction of Spherical Kikuchi Maps

2019 ◽  
Vol 25 (4) ◽  
pp. 912-923 ◽  
Author(s):  
Chaoyi Zhu ◽  
Kevin Kaufmann ◽  
Kenneth Vecchio
Keyword(s):  
Electron Backscatter Diffraction ◽  
Phase Identification ◽  
Threshold Values ◽  
Kikuchi Pattern ◽  
Electron Backscatter ◽  
Multiple Scan ◽  
Multiple Threshold ◽  
Diffraction Patterns ◽  
Backscatter Diffraction ◽  
Pattern Center

AbstractAn automated approach to fully reconstruct spherical Kikuchi maps from experimentally collected electron backscatter diffraction patterns and overlay each pattern onto its corresponding position on a simulated Kikuchi sphere is presented in this study. This work demonstrates the feasibility of warping any Kikuchi pattern onto its corresponding location of a simulated Kikuchi sphere and reconstructing a spherical Kikuchi map of a known phase based on any set of experimental patterns. This method consists of the following steps after pattern collection: (1) pattern selection based on multiple threshold values; (2) extraction of multiple scan parameters and phase information; (3) generation of a kinematically simulated Kikuchi sphere as the “skeleton” of the spherical Kikuchi map; and (4) overlaying the inverse gnomonic projection of multiple selected patterns after appropriate pattern center calibration and refinement. The proposed method is the first automated approach to reconstructing spherical Kikuchi maps from experimental Kikuchi patterns. It potentially enables more accurate orientation calculation, new pattern center refinement methods, improved dictionary-based pattern matching, and phase identification in the future.

Light Optical Diffraction Studies of Macromolecular Ultrastructure

1970 ◽  
Vol 28 ◽  
pp. 258-259
Author(s):  
Glen B. Haydon
Keyword(s):  
High Resolution ◽  
Diffraction Analysis ◽  
Diffraction Pattern ◽  
Electron Micrographs ◽  
Optical Diffraction ◽  
Electron Micrograph ◽  
Its Analysis ◽  
Resolution Electron ◽  
Diffraction Patterns

Analysis of light optical diffraction patterns produced by electron micrographs can easily lead to much nonsense. Such diffraction patterns are referred to as optical transforms and are compared with transforms produced by a variety of mathematical manipulations. In the use of light optical diffraction patterns to study periodicities in macromolecular ultrastructures, a number of potential pitfalls have been rediscovered. The limitations apply to the formation of the electron micrograph as well as its analysis.(1) The high resolution electron micrograph is itself a complex diffraction pattern resulting from the specimen, its stain, and its supporting substrate. Cowley and Moodie (Proc. Phys. Soc. B, LXX 497, 1957) demonstrated changing image patterns with changes in focus. Similar defocus images have been subjected to further light optical diffraction analysis.

The Morphology and Crystallography of Diesel Particulate Emissions

1981 ◽  
Vol 39 ◽  
pp. 148-149
Author(s):  
R. Stevenson
Keyword(s):  
Diffraction Pattern ◽  
Carbon Films ◽  
Particulate Emissions ◽  
Diesel Particulate ◽  
Amorphous Carbon Films ◽  
Turbostratic Carbon ◽  
Diesel Particles ◽  
Tem Mode ◽  
Exhaust Stream ◽  
Diffraction Patterns

A study has been made of the morphology and crystallography of particulate emissions from indirect injection diesel engines. This particulate matter consists substantially of carbon (although hydrocarbons can be extracted with solvents). Samples were collected in a diluted exhaust stream on amorphous carbon films and examined in a JEM-200C electron microscope operated in the TEM mode with an accelerating voltage of 200 KV.The morphology of the diesel particles, as shown in Fig. 1, markedly resembles carbon blacks and consists of an agglomeration of quasispherical subunits arranged in chains or clusters. Only limited changes in morphology were observed as the number of subunits in the particle increased (although larger particles tended to be more cluster-like than the extended chain shown in Fig. 1). However, a dramatic effect of the number of subunits was observed on the character of the diffraction pattern. Smaller particles yielded a diffraction pattern consisting of very diffuse rings typical of turbostratic carbon; the diffraction patterns from the larger particles, however, although qualitatively similar, exhibited much sharper and less diffuse ring patterns.

scholarly journals On the Use of EBSD and Microhardness to Study the Microstructure Properties of Tungsten Samples Prepared by Selective Laser Melting

Materials ◽  
2021 ◽  
Vol 14 (5) ◽  
pp. 1215
Author(s):  
Mirza Atif Abbas ◽  
Yan Anru ◽  
Zhi Yong Wang
Keyword(s):  
Selective Laser Melting ◽  
Electron Backscatter Diffraction ◽  
Fusion Reactors ◽  
Laser Melting ◽  
Kikuchi Pattern ◽  
Plasma Facing Components ◽  
Electron Backscatter ◽  
Ebsd Technique ◽  
Temperature Exposure ◽  
Backscatter Diffraction

Additively manufactured tungsten and its alloys have been widely used for plasma facing components (PFCs) in future nuclear fusion reactors. Under the fusion process, PFCs experience a high-temperature exposure, which will ultimately affect the microstructural features, keeping in mind the importance of microstructures. In this study, microhardness and electron backscatter diffraction (EBSD) techniques were used to study the specimens. Vickers hardness method was used to study tungsten under different parameters. EBSD technique was used to study the microstructure and Kikuchi pattern of samples under different orientations. We mainly focused on selective laser melting (SLM) parameters and the effects of these parameters on the results of different techniques used to study the behavior of samples.

Determination of hydrogen ordering within the β-RH2+xphase (R= Ho, Y) using electron diffraction techniques

2000 ◽  
Vol 33 (5) ◽  
pp. 1246-1252 ◽  
Author(s):  
Elizabeth J. Grier ◽  
Amanda K. Petford-Long ◽  
Roger C. C. Ward
Keyword(s):  
Electron Diffraction ◽  
Neutron Scattering ◽  
Diffraction Pattern ◽  
Computer Simulations ◽  
Fluorite Structure ◽  
Long Range Order ◽  
Hydrogen Atoms ◽  
Ordered Structures ◽  
Diffraction Patterns

Computer simulations of the electron diffraction patterns along the [\bar{1}10] zone axes of four ordered structures within the β-RH2+xphase, withR= Ho or Y, and 0 ≤x≤ 0.25, have been performed to establish whether or not the hydrogen ordering could be detected using electron diffraction techniques. Ordered structures within otherRH2+x(R= Ce, Tb) systems have been characterized with neutron scattering experiments; however, for HoH(D)2+x, neutron scattering failed to characterize the superstructure, possibly because of the lowxconcentration or lack of long-range order within the crystal. This paper aims to show that electron diffraction could overcome both of these problems. The structures considered were the stoichiometric face-centred cubic (f.c.c.) fluorite structure (x= 0), theD1 structure (x= 0.125), theD1astructure (x= 0.2) and theD022structure (x= 0.25). In the stoichiometric structure, with all hydrogen atoms located on the tetrahedral (t) sites, only the diffraction pattern from the f.c.c. metal lattice was seen; however, for the superstoichiometric structures, with the excess hydrogen atoms ordered on the octahedral (o) sites, extra reflections were visible. All the superstoichiometric structures showed extra reflections at the (001)f.c.c.and (110)f.c.c.type positions, with structureD1 also showing extra peaks at (½ ½ ½)f.c.c.. These reflections are not seen in the simulations at similar hydrogen concentrations with the hydrogen atoms randomly occupying theovacancies.

scholarly journals The extraction of single-particle diffraction patterns from a multiple-particle diffraction pattern

2013 ◽  
Vol 21 (13) ◽  
pp. 15102 ◽  
Author(s):  
A.V. Martin ◽  
A.J. Morgan ◽  
T. Ekeberg ◽  
N.D. Loh ◽  
F.R.N.C. Maia ◽  
...  
Keyword(s):  
Diffraction Pattern ◽  
Single Particle ◽  
Diffraction Patterns ◽  
Multiple Particle

scholarly journals Crystal orientation and detector distance effects on resolving pseudosymmetry by electron backscatter diffraction

2021 ◽  
Vol 54 (2) ◽  
pp. 513-522
Author(s):  
Edward L. Pang ◽  
Christopher A. Schuh
Keyword(s):  
Crystal Orientation ◽  
Electron Backscatter Diffraction ◽  
Detector Distance ◽  
Recent Emergence ◽  
Distance Effects ◽  
Electron Backscatter ◽  
Sample Position ◽  
Position And Orientation ◽  
Diffraction Patterns ◽  
Backscatter Diffraction

Accurately indexing pseudosymmetric materials has long proven challenging for electron backscatter diffraction. The recent emergence of intensity-based indexing approaches promises an enhanced ability to resolve pseudosymmetry compared with traditional Hough-based indexing approaches. However, little work has been done to understand the effects of sample position and orientation on the ability to resolve pseudosymmetry, especially for intensity-based indexing approaches. Thus, in this work the effects of crystal orientation and detector distance in a model tetragonal ZrO2 (c/a = 1.0185) material are quantitatively investigated. The orientations that are easiest and most difficult to correctly index are identified, the effect of detector distance on indexing confidence is characterized, and these trends are analyzed on the basis of the appearance of specific zone axes in the diffraction patterns. The findings also point to the clear benefit of shorter detector distances for resolving pseudosymmetry using intensity-based indexing approaches.

scholarly journals The 3D structure of fibrous material is fully restorable from its X-ray diffraction pattern

IUCrJ ◽  
2021 ◽  
Vol 8 (4) ◽  
Author(s):  
Hiroyuki Iwamoto
Keyword(s):  
Diffraction Pattern ◽  
Fibrous Material ◽  
3D Structure ◽  
Wide Field ◽  
Fibrous Materials ◽  
X Ray Diffraction ◽  
X Ray ◽  
Fiber Diffraction ◽  
Puzzle Solving ◽  
Diffraction Patterns

X-ray fiber diffraction is potentially a powerful technique to study the structure of fibrous materials, such as DNA and synthetic polymers. However, only rotationally averaged diffraction patterns can be recorded and it is difficult to correctly interpret them without the knowledge of esoteric diffraction theories. Here we demonstrate that, in principle, the non-rotationally averaged 3D structure of a fibrous material can be restored from its fiber diffraction pattern. The method is a simple puzzle-solving process and in ideal cases it does not require any prior knowledge about the structure, such as helical symmetry. We believe that the proposed method has a potential to transform the fiber diffraction to a 3D imaging technique, and will be useful for a wide field of life and materials sciences.

Sign in / Sign up

Export Citation Format

Share Document