scholarly journals A method for accurate texture determination of thin oxide films by glancing-angle laboratory X-ray diffraction

2014 ◽  
Vol 47 (2) ◽  
pp. 575-583 ◽  
Author(s):  
Alistair Garner ◽  
Michael Preuss ◽  
Philipp Frankel
Keyword(s):  
Oxide Films ◽  
X Ray Diffraction ◽  
Aqueous Corrosion ◽  
Texture Measurement ◽  
X Ray ◽  
Peak Broadening ◽  
Glancing Angle ◽  
Thin Oxide Films ◽  
Diffraction Peaks ◽  
Thin Oxide

The present article describes a modification to the standard method of glancing-angle X-ray diffraction for accurate measurement of the texture of thin oxide films. The technique resolves the problems caused by overlapping diffraction peaks originating from multiphase materials with asymmetric unit cells and the peak broadening associated with sample tilt during glancing-angle texture measurement. The entire 2θ range of interest is recorded as a function of sample orientation, and the integrated intensities from different crystallographic planes are extracted from fitted diffraction profiles. The technique allows for pole figures to be plotted from diffraction peaks that could otherwise not be resolved and separates contributions from neighbouring peaks, leading to a more accurate representation of the existing oxide texture. The proposed method has been used for determining texture in a 3 µm layer of monoclinic/tetragonal zirconium oxide grown during aqueous corrosion testing and has been verified by additional synchrotron X-ray diffraction measurements.

X-ray Diffraction of Thin Oxide Films on Soldered Module Pins

1988 ◽  
Vol 32 ◽  
pp. 303-310
Author(s):  
T. Paul Adi ◽  
H. F. Stehmeyer
Keyword(s):  
Oxide Films ◽  
Interplanar Distance ◽  
X Ray Diffraction ◽  
Metal Oxide Films ◽  
X Ray ◽  
Highly Sensitive ◽  
Thin Oxide Films ◽  
Thin Oxide ◽  
Diffraction Patterns

AbstractThe presence of metal oxide films from wave solder baths on timed module pins are partly responsible for non-wet problems in subsequent soldering steps. The cylindrical geometry of the pins lends itself to the characterization of thin oxide films by using the highly sensitive Debye-Scherrer camera method. As confirmed by Electron Hicroprobe Analysis (EMA), pins containing thin oxide films were used to obtain the diffraction patterns. A software program was developed that subtracts the diffraction angles of an oxids-free control pin from the pattern of the contaminated pin, and tabulates the residual d-spacing (interplanar distance) of the contaminant film.

Microbeam X-ray diffraction from twisted lamellar crystals: theory and computer simulation

2009 ◽  
Vol 42 (4) ◽  
pp. 673-680 ◽  
Author(s):  
Valeriy A. Luchnikov ◽  
Dimitri A. Ivanov
Keyword(s):  
Basal Plane ◽  
Peak Position ◽  
Diffraction Peak ◽  
Reciprocal Space ◽  
X Ray Diffraction ◽  
X Ray ◽  
Peak Broadening ◽  
Asymmetric Shape ◽  
Diffraction Peaks ◽  
Lamellar Crystals

The diffraction peak position, width and intensity distribution are calculated for the case of a helicoidally twisted crystalline lamella, both analytically and numerically. It is shown that the diffraction peak broadening depends on the orientation of the corresponding reciprocal-space vector with respect to the helicoid axis and the normal to the lamellar basal plane. The equatorial peaks, which are close to the normal direction to the lamellar basal plane, are characterized by the highest azimuthal width. By contrast, the reflections positioned close to the lamellar surface have the smallest azimuthal width. For non-equatorial peaks in the proximity of the twisting axis the intensity has an unusual asymmetric shape. The shape of the microbeam, as well as its position and direction with respect to the lamella, influences the shape of the diffraction peaks in reciprocal space and their appearance in two-dimensional diffractograms. The proposed approach can be useful, for example, for the interpretation of microbeam diffractograms of banded polymer spherulites.

scholarly journals PHASE COMPOSITION OF OXIDE FILMS FORMED ON THE SURFACE OF THE FE-CR-AL SYSTEM COATINGS

2020 ◽  
pp. 14-18
Author(s):  
V. G. Shmorgun ◽  
A. I. Bogdanov ◽  
O. V. Slautin ◽  
V. P. Kulevich
Keyword(s):  
Phase Composition ◽  
Aluminum Content ◽  
Oxide Films ◽  
X Ray Diffraction ◽  
Surface Layers ◽  
X Ray ◽  
Glancing Angle ◽  
Stable Growth ◽  
Metastable Alumina

The phase composition of the oxide films on the surface of the Fe-Cr-Al system coatings is studied using glancing angle X-ray diffraction. It is shown that at 900 °С the formed oxide films consist of αAlO and (FeCr)O, to which FeAlO oxide is added during long-term exposure. An increase in temperature to 1100 °C intensifies the growth of oxide films, and an increase in the aluminum content ensures a stable growth of αAlO and FeAlO oxides. When the aluminum content in the coating is more than 10 at. % at large exposure times, metastable alumina δAlO is formed, the formation of which is associated with a decrease in the concentration of chromium in thin surface layers.

Intensity Modulation of Glancing Angle X-Ray Diffraction Spectra of GexSi1−x/Si Superlattices

1991 ◽  
Vol 220 ◽  
Author(s):  
Xun Wang ◽  
G. L. Zhou ◽  
C. Sheng ◽  
M. R. Yu
Keyword(s):  
Structural Parameters ◽  
X Ray Diffraction ◽  
X Ray ◽  
Superlattice Structure ◽  
Glancing Angle ◽  
Simulation Based ◽  
Different Types ◽  
Different Temperatures ◽  
Diffraction Peaks ◽  
Superlattice Period

ABSTRACTThe glancing angle x-ray diffraction spectra of GexSi1−x/Si superlattices grown by MBE under different temperatures are investigated. Three different types of the intensity distributions of diffraction peaks are observed, which are believed to be corresponded with different situations of interfaces. If all the interfaces in superlattice structure are highly flat, up to 17 orders diffraction peaks are identified with their intensities modulated by a periodical envelope function, otherwise the distribution of diffraction intensities follows simply a decaying function. A quantitative analysis using computer simulation based on the modified Bragg's law and the optical multilayer theory is used to derive the structural parameters including the thicknesses of Si and GexSi1−x layers, superlattice period, Ge content x and the degree of interfacial roughness.

Lineshape Analysis of X-ray Diffraction Profiles: Polyethylene and Model Copolymers

1990 ◽  
Vol 34 ◽  
pp. 519-529
Author(s):  
Buckley Crist ◽  
Paul R. Howard
Keyword(s):  
Crystal Size ◽  
Lattice Parameter ◽  
Parameter Fluctuation ◽  
Line Profiles ◽  
X Ray Diffraction ◽  
X Ray ◽  
Lineshape Analysis ◽  
Small Peak ◽  
Peak Broadening ◽  
Diffraction Peaks

Studies of the shapes of X-ray diffraction peaks from synthetic polymers are still rather uncommon. One probable cause of this situation is the small peak-to-background ratio in most polymer diffraction experiments; it is difficult to achieve precise line profiles for quantitative analysis. Increased utilization of automated data collection/analysis systems and more intense X-ray sources should alleviate this restriction. We suspect, furthermore, that confusion about nomenclature has impeded the acceptance of lineshape analysis for polymers. The peak broadening mechanisms which are generally considered are finite coherence length or crystal size, lattice parameter fluctuation, and displacement disorder of the second kind. Both latter mechanisms have, unfortunately, been referred to as “strains” or “microstrains”. Metallurgists have traditionally expressed displacement disorder as a (length dependent) “microstrain”, and this convention has been adopted in some studies of polymer diffraction. Other work on polymers, however, has termed lattice parameter fluctuation as “microstrain“. The inconsistent use of this term can imply a nonexistent relation between two distinct phenomena.

scholarly journals Application of X-rays Diffraction for Identifying Thin Oxide Surface Layers on Zinc Coatings

Coatings ◽  
2020 ◽  
Vol 10 (10) ◽  
pp. 1005
Author(s):  
George Vourlias
Keyword(s):  
Grazing Incidence ◽  
Oxide Surface ◽  
Zinc Oxide Film ◽  
X Rays ◽  
X Ray Diffraction ◽  
X Ray ◽  
Thin Oxide Films ◽  
Thin Oxide ◽  
Predicted Values ◽  
Zinc Coatings

Structural characterization of compound material coatings is usually achieved using time-consuming and destructive techniques such as optical and electrical microscopy, which require the use of grinding processes not always compatible with the material. This paper reports on the effective use of a theoretical model based on X-ray diffraction to calculate the thickness and composition of thin oxide films formed on the surface of zinc coatings. Zinc coatings are widely used in industrial application as protective layers against the atmospheric corrosion of steel substrates. The thickness of single- and multi-layer coatings is estimated using grazing incidence X-ray diffraction and various incidence angles. The coatings were grown using hot-dip, pack cementation and thermal spray techniques, and their experimental characteristics were compared to the theoretically predicted values of thickness and composition. The results indicate the formation of a thin zinc oxide film on top of each coating, which acts as an isolation layer and protects the surface of the sample against the environmental corrosion. Finally, the penetration depth of the X-rays into the zinc-based coatings for grazing incidence and Bragg–Brentano X-ray diffraction geometries were calculated using theoretical equations and experimentally confirmed.

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