Low-frequency noise sources in polysilicon emitter BJT's: influence of hot-electron-induced degradation and post-stress recovery
1995 ◽
Vol 42
(9)
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pp. 1647-1652
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2000 ◽
Vol 40
(11)
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pp. 1855-1861
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1999 ◽
2013 ◽
Vol 854
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pp. 21-27
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1999 ◽
Vol 43
(5)
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pp. 931-936
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2011 ◽
Vol 324
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pp. 441-444
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Keyword(s):