Comments on "Determination of Si-SiO/sub 2/ interface trap density by 1/f noise measurements" [with reply]
1990 ◽
Vol 37
(3)
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pp. 824-826
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1988 ◽
Vol 35
(10)
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pp. 1651-1655
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1993 ◽
Vol 36
(6)
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pp. 827-832
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